The invention relates to a preparation method of a thin steel wire longitudinal sectional electronic microscopic sample. The method comprises the following
processing steps: (1)
cutting the sample into an
initial sample with the length of 5-10 mm; (2) injecting curing glue into a mold, laying the
initial sample horizontally at the bottom of the mold, and heating to enable the
initial sample to be cured; (3) separating the cured sample from the mold,
grinding the sample till the sample is 1 / 2 of the
diameter of the steel wire,
grinding the sample when the sample is turned until the thickness is 85-100 microns, using a puncher to punch a disc with the
diameter of 3 mm, and ensuring that only one thin steel wire is positioned in the center of the disc; (4) uniformly
coating the curing glue position of the disc surface with black
grease, and utilizing a twin-jet to thin the disc, so as to obtain the sample suitable for observation under the transmission
electron microscope. The preparation method can be used for the thin steel wire with the
diameter from 0.1 mm to 3 mm, particularly for the thin steel wire with the diameter less than 1 mm, is simple in process, low in cost, high in
operability and high in success rate of
sample preparation, and successfully solves the problem that the thin steel wire longitudinal sectional electronic microscopic sample is difficult to prepare.