The invention belongs to measurement techniques, relates to a thickness measurement
system, and in particular relates to a
system for measuring
longitudinal wave thickness of a pulse
laser, which is applied to thickness measurement of
metal materials or non-
metal materials. According to the
system for measuring the thickness, a
beam splitter mirror and a convex lens are arranged on one same light path in sequence; a
photodiode is arranged on a reflection light path of the light slitter mirror and is used for receiving the reflection light of the
beam splitter mirror; an
electric signal output from the
photodiode is connected with a receiving end of a
signal acquisition card in an
electronic computer; another receiving end of the
signal acquisition card is connected with the output end of a
laser interferometer; the pulse
laser and the laser interferometer are arranged on two sides of a tested sample in a centering manner; and the tested sample is arranged on a two-dimensional translation platform. According to the system, the laser interferometer is adopted to detect an ultrasonic
longitudinal wave, and the system can be used for on-line measurement and used in a high temperature environment; and by adopting the mode that the pulse laser and the laser interferometer are arranged in a centering manner and the tested sample is arranged on the two-dimensional
electric control translation platform, the rapid two-dimensional scanning on the surface of the tested sample through laser is realized.