The invention provides a method for determining impurity elements in high-purity aluminum through a microwave digestion-inductively coupled plasma emission spectrometer and belongs to the technical field of analysis and test. The invention provides an analysis method for determining 20 impurity elements including Ag, Ba, Bi, Cd, Co, Cu, Ga, Fe, In, Li, Mg, Mn, Mo, Pb, Sb, Ti, V, Sr, Zn and Zr in the high-purity aluminum through a microwave digester and an inductive coupled plasma optical emission spectrometer (ICP-OES) by adopting a standard curve method. A sample is dissolved into a sealed high-pressure microwave digestion tank by utilizing a proper amount acid, so as to avoid external factor pollution better. Optimal working parameters of an instrument are determined through a single-factor experiment. A standard curve-method test sample is selected so that matrix interference is reduced. The method is a simple, rapid and accurate modern detection technology capable of determining 20elements in one step.