3848results about "Analysis by thermal excitation" patented technology

An induction plasma torch comprises a tubular torch body, a gas distributor head located at the proximal end of the torch body for supplying at least one gaseous substance into the chamber within the torch body, a higher frequency power supply connected to a first induction coil mounted coaxial to the tubular torch body, a lower frequency solid state power supply connected to a plurality of second induction coils mounted coaxial to the tubular torch body between the first induction coil and the distal end of this torch body. The first induction coil provides the inductive energy necessary to ignite the gaseous substance to form a plasma. The second induction coils provide the working energy necessary to operate the plasma torch. The second induction coils can be connected to the solid state power supply in series and / or in parallel to match the impedance of this solid state power supply.

A device and method for identifying the composition of a target sample. The target sample may be a matrix such as a metal alloy, a soil sample, or a work of art. The device includes an x-ray fluorescence detector that produces an x-ray signal output in response to the target sample. The device also includes an optical spectroscope that produces an optical signal output in response to the target sample. Further, a processor is included that analyzes and combines the x-ray signal output and the optical signal output to determine the composition of the test material. In one embodiment, the optical spectroscope is a laser induced photon fluorescence detector.

A method, suitable for stand off analysis of a sample (2), comprising: (i) using an excitation means (6) to vaporise the sample (2) thereby producing a vapour plume (10) of molecular species; and (ii) using an analytical means (12) to analyse molecular species within the vapour plume (10) wherein the analytical means (12) analyses the molecular emission spectra of the vapour plume (10). The invention also relates to a kit and an apparatus for use with the same.

A method and apparatus for automatic determination of semiconductor plasma chamber matching a source of fault are provided. Correlated plasma attributes are measured for process used for calibration both in a chamber under study and in a reference chamber. Principal component analysis then is performed on the measured correlated attributes so as to generate steady principal components and transitional principal components; and these principal components are compared to reference principal components associated with a reference chamber. The process used for calibration includes a regular plasma process followed by a process perturbation of one process parameter. Similar process perturbation runs are conducted several times to include different perturbation parameters. By performing inner products of the principal components of chamber under study and the reference chamber, matching scores can be reached. Automatic chamber matching can be determined by comparing these scores with preset control limits. The potential source(s) of chamber fault can also be identified by the lowest matching score(s).

Systems and methods for improved thermophotonic imaging are provided in which both amplitude and phase image information is obtained with a high signal to noise ratio and depth-resolved capabilities. Image data obtained from an imaging camera is dynamically averaged and subsequently processed to extract amplitude and / or phase image data. The system may be configured for a wide range of imaging modalities, including single frequency modulation (thermophotonic lock-in imaging), Thermal-Wave Radar imaging or Thermophotonic Radar imaging involving chirp modulation, and Binary Phase Coded Modulation. Such imaging modalities may find application in many diverse areas, including non-destructive testing and biomedical diagnostic imaging including the imaging of teeth and monitoring changes in the tooth over time which are due to pathology such as dental caries or erosion.

A method of determining the analyte concentration of a test sample is described. A temperature gradient is introduced in the test sample and infrared radiation detectors measure radiation at selected analyte absorbance peak and reference wavelengths. Reference and analytical signals are detected. In the presence of the selected analyte, parameter differences between reference and analytical signals are detectable. These parameter differences, having a relationship to analyte concentration, are measured, correlated, and processed to determine analyte concentration in the test sample. Accuracy is enhanced by inducing a periodically modulated temperature gradient in the test sample. The analytical and reference signals may be measured continuously and the parameter difference integrated over the measurement period to determine analyte concentration.