The invention belongs to the technical field of
circuit design, and discloses a low-leakage current gating switch circuit for multi-path resistance high-precision measurement, which comprises diodes D1-D7, a
triode Q3, MOS (
Metal Oxide Semiconductor) transistors Q1, Q4, Q5 and Q6, and operational amplifiers U1 and U2, a standard current input end is grounded after passing through a
diode D1, an MOS tube Q1, a source
electrode of the MOS tube Q1, a
diode D3 and a
resistor R4 to be measured, the
diode D3 is further connected with an ADC sampling end through MOS tubes Q5, Q4 and Q6, a positive end of an
operational amplifier U2 is connected with the standard current input end, a negative end of the
operational amplifier U2 is connected with an output end, and the negative end of the
operational amplifier U2 is further connected with the MOS tube Q1 through a diode D7 and a diode D2. The positive end of the operational
amplifier U1 is connected with the ADC sampling end, the negative end of the operational
amplifier U1 is connected with the output end, the output end of the operational
amplifier U1 is connected with the diode D2 through the diode D6, and the output end of the operational amplifier U1 is further connected with the source
electrode of the MOS tube Q6 through the diode D4. According to the invention, the overall leakage current of the circuit can be reduced to picoampere level, and the
measurement precision is greatly improved.