The invention discloses a new method for realizing adjustable charge-orbital ordering characteristic in a (001) oriented perovskite manganese oxide thin film and use thereof. In the method, (001) oriented lead magnesium niobate-lead titanate (PMN-PT) with high reverse piezoelectric performance is used as a substrate, the lattice mismatch of the substrate and the perovskite manganese oxide is controlled to be 1 to 3 percent to ensure that the thin film has a large in-plane tensile strain during epitaxial growth, and thus, the charge-orbital ordered transformation is induced. The chemical general formula of the thin film is Re1-xAexMnO3, wherein x ranges from 0 to 1; Re is one or more than two of La, Ce, Pr, Eu, Ho, Nd and Sm; and Ae is one or more than two of Ca, Sr, Ba, Ce, Sn, Y and Hf. Furthermore, the state of the charge-orbital ordered phase in the thin film can be adjusted by applying a bias electric field onto the substrate, and thus, the magnetoresistance of the thin film can be controlled.