228 results about "Electronic microscopy" patented technology

A nanoscale membrane exposed on opposite sides thereof and having an average thickness of less than about 100 nm, and a lateral length to thickness aspect ratio that is more than 10,000 to 1 is disclosed. Also disclosed are methods of making such membranes, and use thereof in a number of devices including fuel cells, sensor devices, electrospray devices, and supports for examining a sample under electron microscopy.

The invention aims at disclosing an ultrathin in-situ liquid sample room for a transmission electron microscope and an auxiliary installation device and installation method for the ultrathin in-situ liquid sample room. By design of a single rubber ring-sealed sample room and a synergistic effect of the auxiliary installation device, the thickness and the width of the in-situ liquid sample room are reduced; assembly is relatively safe and reliable; and relatively effective utilization of a small sample space in the transmission electron microscope and achievement of relatively multiple functions carried on the in-situ liquid sample room are facilitated.

Unsupported, electron transparent film useful in supporting a sample for imaging and analysis by transmission electron microscopy; methods for making and using the unsupported, electron transparent film; and an integrally formed combination of an unsupported, electron transparent film and substrate.

A method for projecting an electron beam, used notably in direct or indirect writing lithography and in electronic microscopy. Proximity effects created by the forward and backward scattering of the electrons of the beam in interaction with the target must be corrected. For this, the convolution of a point spread function with the geometry of the target is conventionally used. At least one of the components of the point spread function has its maximum value not located on the center of the beam. Preferably, the maximum value is instead located on the backward scattering peak. Advantageously, the point spread function uses gamma distribution laws.

The invention relates to an in-situ micro-nanometer mechanics testing and scoring machining integrated machine, belonging to a mechanical-electrical integration precision scientific instrument. A left side step motor drives a screw nut through a coupler; relative connecting pieces are driven by the screw nut, so that the rough feeding of a flexible hinge and a diamond pressing head can be realized; and a piezoelectric stack drives the flexible hinge to carry out precise feeding. A right side objective table and a precise force sensor are mounted on the flexible hinge, and is connected with a rotor through a screw; thin-sheet-shaped structures at the both sides of the rotor are in clearance fit with the output ends of the two flexible hinges; the rotor is connected with a guide rail sliding block; the two symmetrical flexible hinges and the guide rail are mounted on a tail base; and the tail base is mounted on the base. The in-situ micro-nanometer mechanics testing and scoring machining integrated machine has the advantages of small size and compact structure; and the in-situ micro-nanometer mechanics testing and scoring machining integrated machine can be mounted in a scanning electronic microscope for a micro-nanoindentation and scoring test. The in-situ micro-nanoindentation test of a material can be carried out at first; the scoring machining technique is optimized according to a test result; the scoring machining is realized according to an optimal technique parameter; and finally, the integrated testing and machining process can be finally realized.

A method and apparatus for in-situ lift-out rapid preparation of TEM samples. The invention uses adhesives and / or spring-loaded locking-clips in order to place multiple TEM-ready sample membranes on a single TEM support grid and eliminates the use of standard FIB-assisted metal deposition as a bonding scheme. Therefore, the invention circumvents the problem of sputtering from metal deposition steps and also increases overall productivity by allowing for multiple samples to be produced without opening the FIB / SEM vacuum chamber.

A toner is provided including a binder resin, a colorant, and a release agent, which has a volume average particle diameter (Dv) of from 3 to 9 μm, and wherein the binder resin and the release agent form a sea-island structure in which the island formed of the release agent is dispersed in the sea formed of the binder resin in a cross-sectional image of the toner obtained by a transmission electron microscope (TEM), and the following relationships are satisfied: IB>IA and IB>IC, wherein each of IA, IB, and IC represents an area ratio (%) of the island in an outermost region (A) of the cross-sectional image of the toner, an intermediate region (B) thereof located under the outermost region (A), and an innermost region (C) thereof located under the intermediate region (B); and a method of preparing the toner.