The invention provides a method for automatically adjusting the crystal orientation through a double-inclination sample stage of a transmission electron microscopy. The method comprises the following steps: calibrating the double-inclination sample stage; recording a single-crystal electronic diffraction pattern of a positive zone axis, and a camera constant, and recording five readings X1, Y1, Z1, A1 and B1 of the double-inclination sample stage; calibrating the diffraction pattern by utilizing the known lattice type and parameters of a to-be-detected sample; determining a reference coordinate system through the projection positions of two rotating shafts of the double-inclination sample stage to obtain double-inclination stage readings X2, Y2, Z2, A2 and B2 needed by assigned orientation; and inputting the calculated X2, Y2, Z2, A2 and B2 values by a user through a control panel of the transmission electron microscopy, thus being capable of realizing the automatic tilting and translation process. The calculation process is easily programmed and realized, the dependence degree of an operator is reduced, the testing efficiency can be greatly improved, and the sample damage caused by long-time high-energy electronic beam radiation can also be avoided.