947results about How to "Does not affect accuracy" patented technology

The present invention provides a pressure measurement structure and touch control device, comprising a substrate and a sensor, the substrate being provided with an area of strain concentration and an area of non-strain concentration, and the sensor being arranged in the vicinity of strain concentration or within the scope of the area of strain concentration. The substrate at the area of strain concentration is thinner than the substrate at the area of non-strain concentration. The area of non-strain concentration is sensitive to stress reaction, and obvious to strain transformation in such a manner to generate detectable electrical signals when applying pressure on the surface of the substrate. The touch control device comprises at least one pressure measurement structure which has the advantages of sensitive operation and easily controllable cost, and is suitable for environments with high requirement, in wide application fields, such as dust-free and security and protection, etc.

The invention discloses a display panel, an electronic device and a test method. The display panel comprises a plurality of data lines that are arranged parallel to each other and a display array, wherein the data lines extend in a first direction, the display array comprises a plurality of pixel units that are arranged in an array manner, the pixel units and the data lines are equal in quantity, and one line of pixel units are electrically connected with a data line correspondingly; in a first direction, a test switch circuit is arranged on one side of the display array, and driving lead pins and test lead pins are arranged on the other side of the display array; the test switch circuit has a control end, an input end and an output end; the driving lead pins are electrically connected with the control end, the driving lead pins are used for inputting switch control signals, the test lead pins are used for inputting test signals, the test lead pins are electrically connected with the input end via part of the data lines, and the rest of the data lines are connected with the output end. According to a technical solution of the display panel, the electronic device and the test method, the data lines are reused as signal lines for the test lead pins, and narrow frame design can be facilitated.

The invention relates to a weighing module, comprising connecting module, upper bearing part, column weighing sensor, lower bearing part and bottom plate. The connecting module comprises top plate, support plate and fixing plate. The upper bearing part and the lower bearing part are installed on the top plate and the bottom plate respectively. The upper neck part of column weighing sensor is clamped on the upper bearing part. Upper and lower end faces of column weighing sensor are contacted with hole bottom spherical faces of upper and lower bearing parts. Screw bars of two anti-overturn bolts with shaft sleeves passes through fixing plate and rotates into two screw holes. Two ends of shaft sleeves are set against shaft shoulders of bottom plate and anti-overturn bolts respectively. The distance b is set between the bottom of fixing plate or support plate and the distance a is set between the shoulder of anti-overturn bolt and the fixing plate. The weighing module integrates weighing, vertical protection limitation and vertical protection together. It is provided with high weighing accuracy, convenient installation and maintenance, stable work and reliability.

A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.