The invention belongs to the technical field of
element analysis and detection and particularly relates to a photogenic X-
ray energy spectrum analyzer for rapidly measuring trace light elements and ananalysis method thereof. The
energy spectrum analyzer comprises a cabinet (101), a computer (102), a
sample chamber (303), an x-
ray light pipe (301), a
detector (302), a sample cup (305), a high-
voltage power supply (306), a lifting platform (201) and a
vacuum pump. The
analysis method comprises the following steps: putting a to-be-detected sample (501) into the sample cup (305), wherein the surface of the to-be-detected sample (501) is bright and clean; lifting the sample cup (305) upwards through controlling the lifting platform (201) by means of the computer (102), placing the to-be-detected sample (501) at a detection position in the
sample chamber (303), and quickly vacuumizing the
sample chamber (303) by means of an oil-free
vacuum pump. In this way, multiple trace amount of light elements can be measured at the same time and the
detection limit of each element can be as low as 1 ppm. According to the invention, the absorption of air to light element characteristic spectrum peaks can be greatly reduced and the
detection limit of light elements is reduced. The whole test is free of consumable materials, and has the characteristics of simple operation, lossless and fast detection, accurate determination, low cost and the like.