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Photogenic X-ray energy spectrum analyzer for rapidly measuring trace light elements and analysis method thereof

A rapid measurement and energy spectrum analysis technology, applied in the direction of material analysis, measurement device, and material analysis using wave/particle radiation, can solve problems such as unusability, and achieve the effect of reducing absorption, shortening detection time, and improving detection ability.

Inactive Publication Date: 2019-03-29
NCS TESTING TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The analyzer and method are only suitable for the detection of heavy metals and cannot be used for light elements such as aluminum, silicon, phosphorus, sulfur, chlorine, etc.

Method used

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  • Photogenic X-ray energy spectrum analyzer for rapidly measuring trace light elements and analysis method thereof
  • Photogenic X-ray energy spectrum analyzer for rapidly measuring trace light elements and analysis method thereof
  • Photogenic X-ray energy spectrum analyzer for rapidly measuring trace light elements and analysis method thereof

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Embodiment Construction

[0071] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0072] Such as figure 1 with figure 2 As shown, a top-illuminated X-ray energy spectrum analyzer for rapid determination of trace light elements includes a rectangular cabinet 101, a computer 102, a sample chamber 303, an X-ray light tube 301, a detector 302, a sample cup 305, a high pressure Power supply 306, lifting platform 201 and vacuum pump (not shown in the accompanying drawings).

[0073] A partition 202 is arranged inside the cabinet 101 to divide the cabinet 101 into upper and lower layers. The sample chamber 303 is fixed in the middle of the upper surface of the partition 202, the top of the sample chamber 303 is provided with an X-ray light tube 301 and a detector 302, the bottom is provided with a sample inlet, and the side wall is provided with a vacuum port 304 ; The X-ray light pipe 301 and the detector 302 have a certain angle, so t...

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Abstract

The invention belongs to the technical field of element analysis and detection and particularly relates to a photogenic X-ray energy spectrum analyzer for rapidly measuring trace light elements and ananalysis method thereof. The energy spectrum analyzer comprises a cabinet (101), a computer (102), a sample chamber (303), an x-ray light pipe (301), a detector (302), a sample cup (305), a high-voltage power supply (306), a lifting platform (201) and a vacuum pump. The analysis method comprises the following steps: putting a to-be-detected sample (501) into the sample cup (305), wherein the surface of the to-be-detected sample (501) is bright and clean; lifting the sample cup (305) upwards through controlling the lifting platform (201) by means of the computer (102), placing the to-be-detected sample (501) at a detection position in the sample chamber (303), and quickly vacuumizing the sample chamber (303) by means of an oil-free vacuum pump. In this way, multiple trace amount of light elements can be measured at the same time and the detection limit of each element can be as low as 1 ppm. According to the invention, the absorption of air to light element characteristic spectrum peaks can be greatly reduced and the detection limit of light elements is reduced. The whole test is free of consumable materials, and has the characteristics of simple operation, lossless and fast detection, accurate determination, low cost and the like.

Description

technical field [0001] The invention belongs to the technical field of elemental analysis and detection, and particularly relates to an upside-illuminated X-ray energy spectrum analyzer and analysis method for rapid determination of trace light elements, which can non-destructively test ultra-low content of light elements such as aluminum, silicon, phosphorus, sulfur, and chlorine The energy dispersion is suitable for the analysis and detection of elements in samples containing trace or trace amounts of aluminum, silicon, phosphorus, sulfur, chlorine, etc. in pharmaceutical preparation, organic light-emitting material synthesis and other industries. Background technique [0002] The detection of trace phosphorus, sulfur, and chlorine in light-based materials such as pharmaceutical intermediates and organic light-emitting materials usually uses traditional wet analysis: such as spectrophotometry, ion electrode selection method, ICP-MS, etc., the detection limit of traditional ...

Claims

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Application Information

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IPC IPC(8): G01N23/223
CPCG01N23/223G01N2223/076
Inventor 程大伟刘明博胡学强廖学亮倪子月杨博赞陈吉文
Owner NCS TESTING TECH
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