79results about How to "Realize non-destructive measurement" patented technology

The invention discloses a method and a device for measuring the wood density of a standing tree, and relates to the technical field of measurement. The method comprises the steps of: measuring the diameter of a part to be measured at a first height from the ground of the standing tree; transmitting and receiving microwaves within a preset frequency range at a first distance in the air; measuring afirst ratio of transmitted microwave signals to first received microwave signals at different frequencies; transmitting microwaves at a first height in the air to allow the microwaves to penetrate the part to be measured of the standing tree, receiving the microwaves at a first distance from the microwave transmitting position, and measuring a second ratio of the transmitted microwave signals tosecond received microwave signals at different frequencies; calculating a dielectric constant and an attenuation constant of the standing tree according to the first ratio, the second ratio and the diameter; and determining a relational expression among the wood density of the standing tree, the dielectric constant and the attenuation constant, and calculating the wood density of the standing treeaccording to the relational expression. By adopting the measurement method disclosed by the embodiment of the invention, the measurement accuracy of the wood density is improved.

The present invention relates to a test method for testing fatigue characteristics of nanometer thickness films. The main practice of the present invention is as follows: an indentation device is utilized to continuously record the load F and displacement ht data of a nanometer thickness film in a fatigue test, and the numerical value of contact rigidity in every loading / unloading cycle; when thecontact rigidity drops continuously and rapidly, corresponding cycle number is judged as the fatigue life-span number of the film. The test method is simple to operate, accurate and reliable in test result, broad in applicability and capable of realizing the research on fatigue characteristics of various ultra-thin films, and can achieve the test effect and precision which macroscopic tests cannot achieve, so as to provide reliable basis for the research on the fatigue performance of nanometer thickness films.

The utility model discloses a method using a spherical indenter for measuring the phase transition properties of shape memory alloy (SMAs). The phase transition is induced under the pressure of the spherical indenter pressed into the surface of the shape memory alloy; the load signals and the displacement signals in the unloading process are detected by a sensor at the same time, and the ht curve of the load F-displacement is obtained; the load-displacement curve obtained in the test is transformed to a corresponding nominal stress Sigmam-nominal stress Epsilonm curve according to the analysis; then properties of the transformation stress, the elastic modulus and other aspects of the SMAs can be obtained. The test method has advantages that the method is easy in operation, and the nondestructive measurement of the materials can be elementally realized; the method not only can be widely used in the measurement of the phase transition properties of various super-elastic and shape memory SMAs, but also is particularly suitable for the phase transition measurement of the SMAs films with the low thickness only up to a plurality of micrometers or the SMAs micro devices with the micrometer order typical structure size; the method has accurate and precise measured value, which can supply the reliable measurement basis of the phase transition property for the application of the SMAs in the micro-electro-mechanical system.