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19213results about "Resistance/reactance/impedence" patented technology

Correlation of electrical test data with physical defect data

Method and apparatus are disclosed for analyzing defect data produced in testing a semiconductor chip from a logic design. In various embodiments, input for processing is a first inspection data set that identifies a first set of physical locations that are associated with defects detected during fabrication of the chip. Also input is a second test data set that includes one or more identifiers associated with failing circuitry in the chip. A second set of physical locations is determined from the one or more identifiers of failing circuitry, hierarchical relationships between blocks of the design, and placement information associated with the blocks. Each of the one or more identifiers is associated with at least one of the blocks. Correspondences are identified between physical locations in the first inspection data set and the second set of physical locations.
Owner:XILINX INC

Capacitive sensor systems and methods with increased resolution and automatic calibration

Methods and systems for capacitive proximity and contact sensing employ one or more simple sensors (which may be a conductive fiber or pattern of conductive ink) in communication with a microcontroller. Digital signal processing executed by the microcontroller enables resolution enhancement, automatic and continuous calibration, noise reduction, pattern recognition and the configuration of virtual sensors capable of detecting how an object incorporating the sensors is being manipulated.
Owner:IROBOT CORP

Advanced analyte sensor calibration and error detection

Systems and methods for processing sensor data and self-calibration are provided. In some embodiments, systems and methods are provided which are capable of calibrating a continuous analyte sensor based on an initial sensitivity, and then continuously performing self-calibration without using, or with reduced use of, reference measurements. In certain embodiments, a sensitivity of the analyte sensor is determined by applying an estimative algorithm that is a function of certain parameters. Also described herein are systems and methods for determining a property of an analyte sensor using a stimulus signal. The sensor property can be used to compensate sensor data for sensitivity drift, or determine another property associated with the sensor, such as temperature, sensor membrane damage, moisture ingress in sensor electronics, and scaling factors.
Owner:DEXCOM
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