A method and apparatus for adaptively adjusting the
operating voltage of an
integrated circuit in response to tester-to-
system variations, worst-case testing techniques, process variations, temperature variations, or reliability wearout mechanisms. The minimum
operating voltage of an
integrated circuit is determined either during external testing of the
integrated circuit or during built-in-self-testing. The minimum
operating voltage is transmitted to a variable
voltage regulator where it is used to set the output of the
regulator. The output of the
regulator supplies the integrated circuit with its operating
voltage. This technique enables tailoring of the operating
voltage of integrated circuits on a part-by-part basis which results in
power consumption optimization by adapting operating voltage in response to tester-to-
system variations, worst-case testing techniques, process variations, temperature variations or reliability wearout mechanisms. Alternatively, the invention enables adaptive adjustment of the
operating frequency of an integrated circuit. The invention enables
system designers to adaptively optimize either system performance or
power consumption on a part-by-part basis in response to tester-to-system variations, worst-case testing techniques, process variations, temperature variations or reliability wearout mechanisms.