101 results about "Focus (optics)" patented technology

An efficient image capture system is disclosed that integrates functions to control a lens including one or more of focus or object distance, zoom, temperature compensation, and stabilization within an image signal processor (ISP) with appropriate algorithms. In particular, the integrated ISP circuitry may control the motion of the focus and zoom optics of an optical assembly, control stabilization, control the flash, provide enhanced functions and features for controlling the zoom and focus lenses to enable enhanced image capture sequences and/or tracking lens data, provide a set of algorithms within the ISP to alter the aspect ratio (both height and width of an image) of the image, for example to compensate for the addition of an anamorphic lens, and integrate an anamorphic lens into the module to alter an image's projected aspect ratio onto the focal plane array.

The invention discloses a method for improving an optical scanning holographic tomography effect, and belongs to the field of optical tomography. The method can solve the defect in the conventional optical scanning technology that restored section images have louder out-of-focus noise, in real time. The method comprises the following steps: utilizing a random phase in the optics encryption technique, changing a certain pupil function in a conventional optical scanning holographic system into a stochastic phase pupil function, and equaling restore of out-of-focus layer images into decryption under the condition of mistakenly decrypting a secret key, thereby enabling the out-of-focus layer images overlaid on the restored section images to be gaussian white noise with statistical independence and greatly reducing the influence of the out-of-focus noise on the focus layer images. Meanwhile the out-of-focus noise can also be filtered through design of a gaussian filter, so that the longitudinal resolution of the system can be improved; besides, through the adoption of the method, the bandwidth of the optical transfer function is wider, and the transverse resolution of the restored section images can be higher.

The invention discloses a single-vision overall depth information acquisition method based on diffraction blurring and belongs to the technical field of image processing. A first image is collected when the focal length, the image distance, the numerical aperture, the imaging wave length and the proportionality coefficient between the blur circle radius and the ambiguity of the same camera are fixed; under the condition that the aspects are not changed, the distance between the camera and an object is changed, and then a second image is collected, wherein the change magnitude of the distance is delta s; a diffraction blurring model is established and used for describing the relation between the depth of the object and the image blurring degree; the diffraction blurring model and the two blurred images are used for determining the overall depth information of the second image; a 3D image of the second image is formed according to the obtained overall depth information. According to the single-vision overall depth information acquisition method based on diffraction blurring, the diffraction mechanism is fused into traditional geometrical optical convex lens blurring imaging, a mathematical model of the relation between diffraction blurring and the 3D depth of the object is established, and the accuracy of an out-of-focus object depth acquisition method based on traditional geometrical optics is improved.

A thermal imaging camera may be used to capture a visible-light (VL) image and an infrared (IR) image. In some examples, the camera includes adjustable focus IR optics. For example, the camera may include a focus mechanism coupled to the IR optics and configured to move the IR optics to various focus positions so as to focus the IR optics. The various focus positions may include a hyperfocal position in which a scene is in focus between a set distance and infinity, and a plurality of focus positions in which the scene is in focus between the set distance and a minimum focus distance. Depending on the configuration of the camera, the IR optics of the camera may define an F-number greater than 1.0, and an axis of the IR optics may be offset from an axis of the VL optics by a distance less than 1.7 inches.

The invention discloses a test device for a planar three-dimensional shape based on multiple-beam angle adaptive optics and a processing method thereof. The test device mainly comprises a bearing platform, a bracket, a XY platform, a rotating platform, a tilting platform and a multi-beam angle sensor. Laser beams generated by a semiconductor laser in the technical solution of the invention pass through a pinhole of a first filter plate, and is aligned by a collimator lens, and then projected on surface of a workpiece under action of a beam splitter. Reflected beams from surface of the workpiece completely reach a microlens array through the beam splitter. Incident light is divided into a plurality of small samples by the microlens array and then focused on a detector array, thereby producing many separated optical focuses on a CMOS camera. The positions of the optical focuses are directly related to a slope of the workpiece. An algorithm is used to process an images detected from the CMOS camera, determine the positions of the focuses, finally calculate the slope by comparing with an original position, and reconstruct a contour from the slope.

The invention discloses a wavefront phase difference detection method based on a long short-term memory deep network. The wavefront phase difference detection method comprises the steps of inputting characteristic parameters of a certain actual optical system and generating a training data set; generating a focus plane PSF image i1 (x, y) and an out-of-focus PSF image i2 (x, y) from the training data set according to the Fourier optics principle; extracting feature vectors of the focal plane PSF image i1 (x, y) and the out-of-focus PSF image i2 (x, y) as input data; extracting a feature vector of a PSF image sequence collected from an actual optical system; inputting the PSF image sequence into the trained convolutional neural network model according to a time sequence t to determine a wavefront distortion phase so as to obtain a series of distortion phase parameters for training; and generating input data and output data for LSTM deep network training, initializing network parameters, and repeatedly training the LSTM deep network until a loss function of the LSTM deep network is converged.

An apparatus includes a beam source, beam forming optics, a first focusing lens having a focal length, a second focusing lens having a focal length similar to the focal length of the first lens, and a lens translator configured to move the second lens transversely relative to the beam forming optics and to the first lens, and thereby move the elongated focus transversely. In some embodiments, the beam forming optics are positioned between the beam source and the first focusing lens, the first focusing lens is positioned between the beam forming optics and the second focusing lens, and the beam forming optics, the first focusing lens, and the second focusing lens are arranged to receive a beam of laser radiation from the beam source and to form the beam into an elongated focus.

The invention relates to the field of optics and the field of MEMS, and concretely relates to a focus-adjustable micro lens. The micro lens is structurally characterized in that a flexible polymer isplaced between a glass film and supporting glass, the glass film is small in hardness and prone to deformation, and the supporting glass is large in hardness and not prone to deformation. An intelligent material IPMC annular driver is placed on the topmost layer. A metal shell is arranged on the outermost side of the whole structure and plays a role in supporting and protecting. When voltage is applied to the annular IPMC, the outer side of the IPMC is fixed, downward displacement is generated on the inner side of the IPMC, the glass film and a flexible polymer deform, and a plano-convex lensstructure is formed. Through different applied voltages, driving forces generated by the IPMC are different, convex curvatures of the plano-convex lenses are different, and focal lengths are different. The micro lens is a typical MEMS integrated product and has the advantages of being small in size, low in power consumption, simple in structure, free of magnetic interference and the like.

The invention provides a lens group and near-to-eye display equipment, and relates to the technical field of optics; and the lens group comprises a focusing convergent lens assembly, a first optical element and a second optical element which are sequentially arranged in a light outgoing direction. The first optical element is used for enabling an incident light beam to be partially transmitted andpartially reflected, a reflected light beam, reflected by the first optical element, of the convergent light beam emitted from the focus-adjustable convergent lens assembly is emitted towards a second optical element, and after being reflected by the second optical element, the reflected light beam is imaged in a target area through the first optical element. When a myopia or hyperopia user findsthat an image is not clear when watching a picture in a target area through the lens group, the focal length of the whole lens group can be adjusted by adjusting the focal length of the focus-adjustable converging lens assembly, so that the watching requirement of the myopia or hyperopia user when using the lens group is met, and the use experience of the user is improved.

The invention relates to a method and a device for the optical measurement of technical surfaces by means of a confocal sensor, where light from a light source (2) is directed towards the surface (8)of a sample to be measured by means of an optical system (5, 16). According to the invention, the optical system (5, 16) comprises an electrically controlled adaptive optics (7), wherein the focus ofthe optical system (5, 16) is varied by an electric signal (f (t)) in the Z-direction. The light reflected back from the sample surface (8) is directed to at least one photosensor (10), where the sensor signal is measured over time by means of a detection device (11) and the time of a signal maximum is determined. The detection device (11) derives the height Z of the surface (8) from the electricsignal at the time of the signal maximum.

The invention discloses a focus calibration system and a focus calibration method based on light beam scanning angle modulation, and belongs to the technical field of optics. The invention proposes a theoretical model that describes the amplitude of a focus calibration signal that is measured after the reference grating using phase sensitive detection as a function of the alignment grating mark z position. According to the focus calibration system and the focus calibration method based on light beam scanning angle modulation, the method has the advantages that the z-direction position of the grating mark can be accurately determined through the self measurement performance of the alignment measurement system, and the situation that z-direction calibration needs to be carried out through other sensors of a photoetching system in the prior art is changed. According to the method, the focus calibration precision of the alignment measurement system is high, the sub-nanometer level can be achieved, algorithm support is provided, and adjustment is more accurate.