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1203results about How to "Reduced series resistance" patented technology

Double gate and tri-gate transistor formed on a bulk substrate and method for forming the transistor

Three-dimensional transistor structures such as FinFETS and tri-gate transistors may be formed on the basis of an enhanced masking regime, thereby enabling the formation of drain and source areas, the fins and isolation structures in a self-aligned manner within a bulk semiconductor material. After defining the basic fin structures, highly efficient manufacturing techniques of planar transistor configurations may be used, thereby even further enhancing overall performance of the three-dimensional transistor configurations.
Owner:ADVANCED MICRO DEVICES INC

III-nitride light-emitting device with increased light generating capability

InactiveUS6844571B2Excellent current spreadingLow series resistanceStatic indicating devicesSolid-state devicesPeak valueElectricity
The present invention is an inverted III-nitride light-emitting device (LED) with enhanced total light generating capability. A large area device has an n-electrode that interposes the p-electrode metallization to provide low series resistance. The p-electrode metallization is opaque, highly reflective, and provides excellent current spreading. The p-electrode at the peak emission wavelength of the LED active region absorbs less than 25% of incident light per pass. A submount may be used to provide electrical and thermal connection between the LED die and the package. The submount material may be Si to provide electronic functionality such as voltage-compliance limiting operation. The entire device, including the LED-submount interface, is designed for low thermal resistance to allow for high current density operation. Finally, the device may include a high-refractive-index (n>1.8) superstrate.
Owner:LUMILEDS +1

Silver conductive paste used for positive electrode of solar battery and preparation technique thereof

The invention provides a silver conductive paste used for positive electrode of solar battery and a preparation technique thereof. The paste comprises silver powder, glass powder, an organic carrier and an additive, wherein the silver powder accounts for 65 to 85 percent of the total weight of the paste and consists of two types of silver powder with different particle sizes; the first type of silver powder has the particle size range of 3 to 15 micrometers and is spherical; the second type of silver powder has the particle size range of 0.1 to 3 micrometers and is spherical; the first type of silver powder accounts for 20 to 50 percent of the total silver powder; the glass powder is of Pb-B-Si-Zn-Ti-Al-O series and accounts for 1 to 10 percent of the total weight of the paste; the organic carrier accounts for 10 to 20 percent of the total weight of the paste; and the additive accounts for 0.1 to 3 percent of the total weight of the paste, and consists of BaO powder and CaO powder. The silver powder with different particle size ranges is mutually filled, thus greatly improving the electrical property of the electrode and improving the photoelectric conversion efficiency of the battery. In addition, the invention can ensure good ohmic contact between the paste and a substrate.
Owner:CENT SOUTH UNIV

Composition and preparation method of silicon solar battery electrode slurry

The invention relates to composition and a preparation method of silicon solar battery electrode slurry. The silicon solar battery electrode slurry comprises silicon solar battery sunny slope grid electrode silver slurry, back surface field silver-aluminium slurry and back surface field aluminium slurry which are used for preparing an ohm contact layer containing silicon alloy powder. In the invention, silver powder, aluminium powder, a simple substance element and the silicon alloy powder are used as raw materials, and an organic bond and an inorganic bond are used as accessories, and after the raw materials and the accessories are evenly mixed, a three-roller rolling mill is utilized to roll the mixture into the silicon solar battery electrode slurry of which the fineness is 20.0-25.0mum and the viscosity is 20000-40000mpa.s.
Owner:谭富彬

Deep-UV light-emitting diode and preparation method thereof

The invention provides a deep-UV light-emitting diode and a preparation method thereof. A low-temperature GaN insertion layer is used to replace an AlN / AlGaN superlattice or a high-temperature GaN insertion layer to grow the deep-UV light-emitting diode. The low-temperature GaN insertion layer is a GaN with thickness of 20-50nm under the conditions of temperature being 400-900 DEG C, pressure being 30-200torr, and V / III being 1500-2500. The method can effectively lower the dislocation density in an epitaxial AlGaN layer and a quantum well, and improves the surface planeness. The prepared LED component has smooth surface, better crystal quality, starting voltage reduction, and smaller serial resistances of the component; and the electroluminescene peak value is ranged from 300nm to 370nm.
Owner:PEKING UNIV

Method for forming a raised source and drain without using selective epitaxial growth

A method for forming a raised source and drain structure without using selective epitaxial silicon growth. A semiconductor substrate is provided having one or more gate areas covered by dielectric structures. Doped polysilicon structures are adjacent to the dielectric structures on each side and are co-planar with the dielectric structures from a CMP process. The first dielectric structures are removed to form gate openings and a liner oxide layer is formed on the bottom and sidewalls of the gate openings. Dielectric spacers are formed on the liner oxide layer over the sidewalls of the gate openings, and the liner oxide layer is removed from the bottom of the gate openings and from over the doped polysilicon structures. Source and drain regions are formed in the semiconductor substrate by diffusing impurity ions from the doped polysilicon layer. A gate oxide layer and a gate polysilicon layer are formed over the semiconductor structure and the gate polysilicon layer is planarized to form a gate electrode. In a key step, the dielectric spacers are removed to form spacer openings, and impurity ions are implanted through the spacer openings and annealed to form source and drain extensions. The dielectric spacers are reformed and a self-aligned silicide layer is formed on the doped polysilicon structure and the gate electrode. Alternatively, the self-aligned silicide layer can be formed prior to removing the dielectric spacers and implanting ions to form source and drain extensions.
Owner:CHARTERED SEMICONDUCTOR MANUFACTURING
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