The invention relates to an InAs / GaSb secondary category
superlattice infrared detector. The
infrared detector comprises: a substrate; a buffer
ohmic contact layer, which is manufactured on the substrate; a first secondary category
superlattice layer, which is manufactured on the buffer
ohmic contact layer so as to enable table tops to be formed at two sides above the buffer
ohmic contact layer; an intrinsic secondary category
superlattice light
absorption layer, which is manufactured on the first secondary category superlattice layer; a second secondary category superlattice layer, which is manufactured on the intrinsic secondary category superlattice light
absorption layer; an ohmic
contact layer, which is manufactured on the second secondary category superlattice layer; a
passivation layer, which covers portions of the table tops at the two sides of the buffer ohmic
contact layer, side surfaces of the first secondary category superlattice layer, the intrinsic secondary category superlattice light
absorption layer, the second secondary category superlattice layer and the ohmic
contact layer as well as two side surfaces on the ohmic contact layer; upper electrodes, which are manufactured at two sides of a
light transmission opening; and lower electrodes, which are manufactured inside
electrode windows. Specifically, the
light transmission opening is arranged in the middle of the
passivation layer covering the ohmic contact layer; and the
electrode windows are respectively arranged on the two table tops at two sides of the
passivation layer covering the buffer ohmic contact layer.