Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

777 results about "Rapid testing" patented technology

Method and apparatus for at-speed testing of digital circuits

A scheme for multi-frequency at-speed logic Built-In Self Test (BIST) is provided. This scheme allows at-speed testing of very high frequency integrated circuits controlled by a clock signal generated externally or on-chip. The scheme is also applicable to testing of circuits with multiple clock domains which can be either the same frequency or different frequency. Scanable memory elements of the digital circuit are connected to define plurality of scan chains. The loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. The BIST controller, Pseudo-Random Pattern Generator (PRPG) and Multi-input Signature Register (MISR) work at slower frequency than the fastest clock domain. After loading of a new test pattern, a clock suppression circuit allows a scan enable signal to propagate for more that one clock cycle before multiple capture clock is applied. This feature relaxes the speed and skew constraints on scan enable signal design. Only the capture cycle is performed at the corresponding system timing. A programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative impact of clock skew between clock domains.
Owner:MENTOR GRAPHICS CORP

Satellite universal automatic testing platform and data interaction method thereof

The invention relates to a satellite universal automatic testing platform and a data interaction method thereof, aims to solve the technical problem that existing satellite test equipment has poor universality and a low automation degree, and belongs to the technical field of satellite testing. The satellite universal automatic testing platform provided by the invention consists of a peripheral equipment layer, an intermediate service layer and a user terminal layer, wherein the peripheral equipment layer comprises measurement and control system automatic testing equipment, control system automatic testing equipment, CAN (Controller Area Network) monitoring equipment, plug-failure signal monitoring equipment and solar cell array simulating equipment, and is used for making a response to aremote control command of a comprehensive testing server, uploading the remote control command to a satellite, finishing signal collection of the satellite data simultaneously, transmitting a collected signal to the comprehensive testing server to perform signal processing and data storage. According to the testing platform and a data interaction way thereof, the rapid testing demand at each stageof the satellite is met; a system of satellite distribution test control and comprehensive integration management is formed, and universal and automatic satellite testing is realized. The satellite universal automatic testing platform has the advantages of high universality and high automation degree.
Owner:CHANGGUANG SATELLITE TECH CO LTD

Method and apparatus for at-speed testing of digital circuits

A scheme for multi-frequency at-speed logic Built-In Self Test (BIST) is provided. This scheme allows at-speed testing of very high frequency integrated circuits controlled by a clock signal generated externally or on-chip. The scheme is also applicable to testing of circuits with multiple clock domains which can be either the same frequency or different frequency. Scanable memory elements of the digital circuit are connected to define plurality of scan chains. The loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. The BIST controller, Pseudo-Random Pattern Generator (PRPG) and Multi-Input Signature Register (MISR) work at slower frequency than the fastest clock domain. After loading of a new test pattern, a clock suppression circuit allows a scan enable signal to propagate for more that one clock cycle before multiple capture clock is applied. This feature relaxes the speed and skew constraints on scan enable signal design. Only the capture cycle is performed at the corresponding system timing. A programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative impact of clock skew between clock domains.
Owner:MENTOR GRAPHICS CORP

In-use lubricating oil quality rapid testing method

The invention relates to an in-use lubricating oil quality rapid testing method which comprises the following steps that: (1) a representative lubricating oil sample is collected as a training set; (2) the infrared spectrum of the training set lubricating oil sample is determined, corresponding pre-treatment is carried out, and the spectrum data after pre-treatment serves as a variable; (3) through a multivariate calibration method, the relationship model between the in-use lubricating oil quality index and the spectrum is built; and (4) for the quality testing of the lubricating oil sample to be tested, first the infrared spectrum is determined, and then pre-treatment which is the same with that of Step (2) is carried out, and the lubricating oil quality index is determined through the lubricating oil quality analysis model built in Step (3). The method of the invention can rapidly determine 7 quality indexes, i.e. the in-use lubricating oil water content, TAN, TBN, 40DEG C viscosity, 100DEG C viscosity, the flash point, the pour point and the like, and the lubricating oil quality is monitored. The in-use lubricating oil quality rapid testing method has high analysis speed, is convenient to operate, and greatly improves the lubricating oil quality monitoring capability.
Owner:PETRO OIL & LUBRICANT RES INST OF THE GENERAL LOGISITIC DEPT OF PLA

Multi-operating condition extreme load testing system and method for wheel loader transmission system

The invention discloses a multi-operating condition extreme load testing system and a testing method for a wheel loader transmission system. The system mainly comprises a power loading module, a support module, a simulation road surface module, a traction module and a data acquiring and recording module, wherein technical means such as active loading, road surface modulation and the like are adopted, so that the system can be suitable for different spading operating conditions, different road surfaces and loaders of different sizes, and rapid testing of the extreme load of the loader transmission system is realized by testing frictional drag applying on each tire; and according to the method, loads are actively applied to a loader and a bucket through a hydraulic cylinder and a traction module, so that the stress state of the bucket is the same as the stress state during practical operation, loading is flexible, various operating conditions of the loader can be simulated, and testing cost is lowered. Due to the adoption of the system and the method, the extreme loads on a single half shaft, a front transmission shaft, a back transmission shaft, a transmission case output shaft and the like in the transmission system in the operating process of a wheel loader can be obtained.
Owner:JILIN UNIV

Load and freeze-thaw cycle coupled concrete durability testing device and evaluation method

The invention discloses a load and freeze-thaw cycle coupled concrete durability testing device and an evaluation method. The device comprises a concrete load and freeze-thaw cycle coupling device, aconcrete strain testing system and a freeze-thaw testing machine. The concrete load and freeze-thaw cycle coupling device is placed in the freeze-thaw testing machine for a freeze-thaw cycle couplingtest. Sample strain data is recorded at real time through the concrete strain testing system, and by testing parameters such as rate of strain change, rate of mass change, etc. of a test piece after acertain times of load and freeze-thaw cycle coupling, durability of the concrete is evaluated. According to the invention, durability of loaded concrete (member) serving in severe cold areas can be rapidly tested, and load and freeze-thaw cycle coupling effect in actual service is accurately simulated. The method is simple to operate and is scientific and effective. The invention provides technical support for durability design and material selection of large-scale engineering structures under complex service conditions such as severe cold condition, etc.
Owner:CENT SOUTH UNIV +1

Memory testing device and method

A memory testing apparatus rapidly tests memory devices with a relatively small error catch memory. The memory testing apparatus provides an address compressing module that minimizes an amount of error catch memory necessary to test one or more memory devices. The memory testing apparatus further divides each of the memory devices into a plurality of areas, and tests each area sequentially until a bit failure is detected in the area thereby attenuating testing time.
Owner:MACRONIX INT CO LTD

SOC (system on chip) chip and method for testing same

The invention discloses SOC (system on a chip) chip and method for testing the same. The SOC chip comprises first IO MUXs, at least one result and state module and at least one second IO MUX, wherein the first IO MUXs are used for transmitting test data from an external test signal generator to a bus MUX, and the bus MUX selects and drives peripheral equipment or an accelerator to test; the result and state modules are used for receiving results of tests carried on the peripheral equipment and / or the accelerator and sending the test results to the corresponding second IO MUXs; and the second IO MUXs are used for sending the test results to an external test data analyzer so as to analyze the test results. The technical scheme solves the problem that the SOC chip cannot quickly test and improves the correct rate and the efficiency of the chip test so as to quickly select chips with sound functions.
Owner:SANECHIPS TECH CO LTD

Testing method and apparatus for geological mechanics parameter under coal mine

InactiveCN1818337ASimple structurePractical and reliable functionTesting machinesStressed stateUltimate tensile strength
A geology mechanics parameter speedy test method and the equipment of underground colliery: drill test hole at operating face; measure the design value of the surrounding rock by sight scope which has lateral direction device deep-lying sightglass; speedy measure the stress state of the rock by using the method of hydraulic pressure leading split; then put the sightglass into the test hole, measure the split curve and direction by using the directional device on it; measure the intensity of resistant to compression and modulus of elasticity in the test hole. The invention offers a new method and the sight scope has double functions which are screen and save the images of front and side drilling-hole.
Owner:康红普

Rapeseed quality non-destructive testing method and device based on near infrared spectrum technology

The invention discloses a rapeseed quality non-destructive testing method and a device based on a near infrared spectrum technology. For the device, a sample chamber is inserted inside an integrating sphere, an incident light source, the sample chamber and a tester are integrated on a casing of the integrating sphere by fully utilizing the structural characteristics of the integrating sphere, andthe device comprises a spectrum signal collection device, a microcomputer and a result display device; and the method comprises the following steps of: transmitting received spectrum signals into themicrocomputer by the tester at the stage of rapid testing through building a correlation model of such quality indexes as moisture content, fat content and the like of rapeseeds and corresponding spectrum signals; and calling model parameters of corresponding quality by the microcomputer and performing calculation to obtain such quality indexes as the moisture content, fat content and the like ofthe rapeseeds so as to realize the non-destructive testing of quality of rapeseeds. The invention has the advantages of high testing accuracy, good result consistency, high automatic degree and the like, not only provides monitoring basis for acquisition process of primary products, but also further creates conditions for standardized grades of primary products based on quality.
Owner:JIANGSU UNIV

Rapid testing method for optical fiber gyroscope scale factor parameter

The invention discloses a rapid testing method for optical fiber gyroscope scale factor parameters. The testing method comprises the following steps: fixedly mounting an optical fiber gyroscope on a rotating table and rotating along with the rotating table in an identical sine angle velocity, acquiring to obtain output digital amount of the optical fiber gyroscope and the rotation sine angle velocity of the rotating table at different time points, performing linear least square method fitting, calculating to obtain the optical fiber gyroscope scale factor parameters, testing a plurality of sine angle velocity periods, averaging output digital amounts of the optical fiber gyroscope under the identical sine angle velocity in each sine angle velocity period so as to obtain an average output digital amount of the optical fiber gyroscope under the identical sine angle velocity, and further performing linear least square method fitting to calculate the optical fiber gyroscope scale factor parameters. The testing method is short in testing time, the optical fiber gyroscope scale factor parameters can be rapidly evaluated, the testing equipment is lowly required, no special rotating table adaptive interface line is needed, the testing system is simple and reliable and high in security coefficient, and rapid testing on the optical fiber gyroscope scale factor parameters is achieved.
Owner:ZHEJIANG UNIV

Dynamic allocation method for on-line programming of integrated circuit tester

The invention discloses a dynamic allocation method for on-line programming of an integrated circuit tester. A microprocessor directly acquires a command from a NorFlash and executes the command by setting a boot flash selection pin in a lower computer when a testing program error occurs, so as to wait for downloading of the testing program for integrated circuit testing. Under the normal conditions, the testing task can be conducted by directly copying data in a NandFlash to an external SDRAM (Synchronous Dynamic random access memory) and operating the data; and in the testing process, the microprocessor automatically stores the downloaded testing program into the NandFlash to overwrite the existing testing program if receiving the testing program transmitted from an upper computer, and then automatically reboots the testing program to conduct testing according to the new testing program. Therefore, dynamic testing environment allocation can be achieved rapidly according to the requirements of users without switching memories. Meanwhile, the lower computer of the integrated circuit tester can be operated independently from the upper computer so as to achieve rapid testing and dynamic allocation.
Owner:UNIV OF ELECTRONIC SCI & TECH OF CHINA

Rapid test apparatus

Provided herein are methods and devices for rapid testing of solid, semi-solid, or liquid specimens, such as stool, blood, urine, saliva, or swab specimens of the cervix, urethra, nostril, and throat, and for environmental testing.
Owner:QUIDEL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products