A scheme for multi-frequency at-speed logic Built-In
Self Test (BIST) is provided. This scheme allows at-speed testing of
very high frequency integrated circuits controlled by a
clock signal generated externally or on-
chip. The scheme is also applicable to testing of circuits with multiple
clock domains which can be either the same frequency or different frequency. Scanable memory elements of the digital circuit are connected to define plurality of scan chains. The loading and unloading of scan chains is separated from the at-speed testing of the logic between the respective domains and may be done at a faster or slower frequency than the at-speed testing. The BIST controller, Pseudo-
Random Pattern Generator (PRPG) and Multi-input Signature Register (MISR) work at slower frequency than the fastest
clock domain. After loading of a new test pattern, a clock suppression circuit allows a scan enable
signal to propagate for more that one clock cycle before multiple capture clock is applied. This feature relaxes the speed and
skew constraints on scan enable
signal design. Only the capture cycle is performed at the corresponding
system timing. A programmable capture window makes it possible to test every intra- and inter-domain at-speed without the negative
impact of
clock skew between clock domains.