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3495results about "Digital circuit testing" patented technology

Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits

A method and apparatus for tracing hardware states using dynamically reconfigurable test circuits provides improved debug and troubleshooting capability for functional logic implemented within field programmable logic arrays (FPGAs). Special test logic configurations may be loaded to enhance the debugging of a system using FPGAs. Registers are used to capture snapshots of internal signals for access by a trace program and a test multiplexer is used to provide real-time output to test pins for use with external test equipment. By retrieving the hardware snapshot information with a trace program running on a system in which the FPGA is used, software and hardware debugging are coordinated, providing a sophisticated model of overall system behavior. Special test circuits are implemented within the test logic configurations to enable detection of various events and errors. Counters are used to capture count values when system processor execution reaches a hardware trace point or when events occur. Comparators are used to detect specific data or address values and event detectors are used to detect particular logic value combinations that occur within the functional logic.
Owner:IBM CORP

Testing apparatus and method for thin film transistor display array

The present invention discloses a testing circuit and method for thin film transistor display array, for testing the yield of thin film transistor array. The testing circuit comprising: An array tester, a test panel (DUT), a sense amplifier array. The sense amplifier is composed by a plurality of trans- impedance amplifier unit and a plurality of parasitic capacitance discharge circuit unit. Every sense amplifier includes: a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance, the trans-impedance amplifier is used to form an integrated circuit, the output is transmitted to a sampling / hold circuit via a switch; a parasitic capacitance discharge circuit is used to form a discharge rout for the charge of the parasitic capacitance.
Owner:PRIMETECH INT CORP

Method and user interface for debugging an electronic system

Techniques and systems for analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level are described. Although the hardware designs (which were designed in HDL) have been fabricated in integrated circuit products with limited input / output pins, the techniques and systems enable the hardware designs within the integrated circuit products to be comprehensively analyzed, diagnosed, and debugged at the HDL level at speed. The ability to debug hardware designs at the HDL level facilitates correction or adjustment of the HDL description of the hardware designs.
Owner:SYNOPSYS INC

Method for prediction random defect yields of integrated circuits with accuracy and computation time controls

A method of computing a manufacturing yield of an integrated circuit having device shapes includes sub-dividing the integrated circuit into failure mechanism subdivisions (each of the failure mechanism subdivisions includes one or more failure mechanism and each of the failure mechanisms includes one or more defect mechanisms), partitioning the failure mechanism subdivisions by area into partitions, pre-processing the device shapes in each partition, computing an initial average number of faults for each of the failure mechanisms and for each partition by numerical integration of an average probability of failure of each failure mechanism, (the numerical integration produces a list of defect sizes for each defect mechanism, and the computing of the initial average includes setting a maximum integration error limit, a maximum sample size for a population of each defect size, and a maximum number of allowable faults for each failure mechansim), and computing a final average number of faults for the integrated circuit by iterativelly reducing a statistical error of the initial average number of faults for each of the failure mechanisms until the statistical error is below an error limit.
Owner:GOOGLE LLC

Pair-swap independent trellis decoder for a multi-pair gigabit transceiver

InactiveUS6865234B1Channel dividing arrangementsDigital circuit testingGigabitMulti-gigabit transceiver
A method and a system for compensating for a permutation of L pairs of cable such that the compensation is localized in a trellis decoder of a receiver. The L pairs of cable correspond to L dimensions of a trellis code associated with the trellis decoder. The trellis code includes a plurality of code-subsets. The permutation of the L pairs of cable is determined. A plurality of sets of swap indicators based on the permutation of the L pairs of cable is generated. Each of the sets of swap indicators corresponds to one of the code-subsets. The code-subsets are remapped based on the corresponding sets of swap indicators.
Owner:AVAGO TECH INT SALES PTE LTD
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