2596 results about "Automatic test equipment" patented technology

A method for testing a semiconductor device with a multi-gigabit communications receiver includes combining a data output from a high-speed communications transmitter with a perturbation signal generated by automatic test equipment. The combined signal data signal including jitter and low voltage swings is input to the communications receiver port under test. The automatic test equipment determines the bit error rate of the parallel data output from the receiver port under test. This test method is appropriate for semiconductor devices with multiple transceiver ports.

A fill time and stabilize and measurement time are determined for a pneumatic testing procedure. The fill time is computed by identifying, in the filling of a sample unit, a time when a substantial portion of variations of a measured variable (due to stabilization) are completed. The stabilize and measurement time is determined by comparison of the measurement variable behavior when filling sample unit(s) that do not leak, to the measurement variable behaviors when filling a sample unit that is in communication with an orifice simulating a leak. A measurement performance factor may be computed from this data at each of several possible times after a unit is filled. A gauge repeatability factor may be computed based on variance of nonleaking units at each possible time, compared to the variable change made on a sample unit when coupled to a leak-simulating orifice. Either factor may be used to select a stabilize and measurement time.

This invention relates generally to releasable connectors with a wireless connection between automotive test equipment and an automobile On-Board Diagnostic computer wherein the data link connection (DLC) cable is replaced, using two connectors which have been pre-programmed to communicate with each other.

A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.

The invention discloses automatic test equipment for the volatiles of bituminous coal. The automatic test equipment comprises a bituminous coal heating module and a bituminous coal weighing module, wherein the bituminous coal heating module has the function of automatically opening / closing a furnace door, and the bituminous coal weighing module is capable of automatically weighing the masses of each crucible containing bituminous coal before and after an experiment; experimenters only need to place the crucibles on a crucible tray and do not need to participate in the later experiment process. The invention discloses automatic test equipment which is simple and compact in structure, convenient to operate, capable of automatically weighing the masses of each crucible before and after the experiment, and capable of carrying out a volatile experiment on 20 crucibles simultaneously.

The invention provides automatic test equipment for mobile terminal functional testing. The automatic test equipment comprises a test box and a controller. A drawer in-and-out mechanism, a test fixture, a finger touch test mechanism, an upper light source mechanism and a vision audio test mechanism are arranged in the test box, the test fixture is arranged on the drawer in-and-out mechanism, the finger touch test mechanism is hung on the test fixture, the upper light source mechanism is hung on the finger touch test mechanism, the vision audio test mechanism is hung on the upper light source mechanism, the finger touch test mechanism is provided with light avoiding through holes allowing light of the upper light source mechanism to penetrate through, the upper light source mechanism is provided with camera shooting avoiding through holes, and the drawer in-and-out mechanism, the test fixture, the finger touch test mechanism, the upper light source mechanism and the vision audio test mechanism are respectively and electrically connected with the controller. The automatic test equipment has the advantages of achieving automation of the mobile terminal functional testing and improving efficiency.

The present invention relates to the automatic test method and the system of mobile phone software. The method mainly includes five steps; firstly, the keystroke operation of a mobile phone is simulated by a program-controlled switching switch; secondly, communication between a base station and the mobile phone is simulated by a comprehensive mobile phone tester; thirdly, the images of the display screen of the mobile phone are real-timely collected by a camera; fourthly, according to a test task, an industrial control computer controls the unified operation of the program-controlled switching switch and the comprehensive mobile phone tester, collects information coming from the serial port of the mobile phone and the camera-collected real-time images of the display screen of the mobile phone and compares the collected real-time images with corresponding preset template images; fifthly, according to the information coming from the serial port of the mobile phone and the comparison result of the images, the industrial control computer judges the operation state of the mobile phone software. The present invention can accurately simulate the process in which a person operates a mobile phone, so the test result is more accurate. Moreover, the present invention can increase the test efficiency and ensure the comprehensive traversal of test cases.

An apparatus for facilitating automated testing of one or more communication devices may include a processor and memory storing executable computer code causing the apparatus to at least perform operations including capturing one or more recorded sequences of events in which at least one of the events corresponds to a detection of a touch input. The recorded sequences correspond to at least one designated test. The computer program code may further cause the apparatus to enable provision of the recorded sequences of events to one or more communication devices. The computer program code may further cause the apparatus to facilitate sending of one or more generated commands to at least one of the communication devices instructing the communication device to perform the recorded sequences. Corresponding methods and computer program products are also provided.

The invention discloses a automatic test method and system based on task scheduling. The method comprises the following the steps: configuring test topology environment and enrolling test execute end to test task scheduling end, receiving execute role, decomposing execute role and generating task scheduling queue by the test task scheduling end, monitoring the operation status of the test execute end, asking for the test sub-role of the test execute end satisfying present idle state, and sending to the test execute end to test and execute by the test task scheduling end. The method and system realize synchronous execution a plurality of test sub-task by using task scheduling modus so improves automation test efficiency and test resource using rate, and also improves automation test level greatly.

A re-configurable test circuit for use in an automated test equipment includes a test circuit, a test processor and a programmable logic device. The pin electronics circuit is configured to interface the re-configurable test circuit with a DUT. The test processor includes a timing circuit configured to provide one or more adjustable-timing signals having adjustable timing. The programmable logic device is configured to implement a state machine, a state sequence of which depends on one or more input signals received from the pin electronics circuit, to provide an output signal, which depends on a current or previous state of the state machine, to the pin electronics circuit in response to the signal(s) received from the pin electronics circuit. The test processor is coupled to the programmable logic device to provide at least one of the adjustable-timing signal(s) to the programmable logic device to define timing of the programmable logic device.

The embodiment of the invention discloses an automatic test method. The method comprises the following steps of: performing an automatic test, namely a Monkey test on a mobile terminal; acquiring a log file which is generated in the process of the Monkey test according to an acquiring command, wherein the log file is used for recording the process of the Monkey test; and extracting test information which is recorded in the acquired log file and uploading to a server. The embodiment of the invention also discloses an automatic test device. By using the method and the device, the test information of the Monkey test can be automatically and quickly acquired, and other persons can quickly know the process of the Monkey test by uploading the test information to the server.

The invention relates to a satellite universal automatic testing platform and a data interaction method thereof, aims to solve the technical problem that existing satellite test equipment has poor universality and a low automation degree, and belongs to the technical field of satellite testing. The satellite universal automatic testing platform provided by the invention consists of a peripheral equipment layer, an intermediate service layer and a user terminal layer, wherein the peripheral equipment layer comprises measurement and control system automatic testing equipment, control system automatic testing equipment, CAN (Controller Area Network) monitoring equipment, plug-failure signal monitoring equipment and solar cell array simulating equipment, and is used for making a response to aremote control command of a comprehensive testing server, uploading the remote control command to a satellite, finishing signal collection of the satellite data simultaneously, transmitting a collected signal to the comprehensive testing server to perform signal processing and data storage. According to the testing platform and a data interaction way thereof, the rapid testing demand at each stageof the satellite is met; a system of satellite distribution test control and comprehensive integration management is formed, and universal and automatic satellite testing is realized. The satellite universal automatic testing platform has the advantages of high universality and high automation degree.

The invention discloses smart phone test equipment in the field of automatic test equipment and a test method thereof. The equipment comprises a protecting box, a main product testing mechanism, a simulating artificial mechanism, a vision photographing mechanism, a display mechanism and a control mechanism. The smart phone test equipment is high in automation degree and stability, and can efficiently detect a series of functions of products. The smart phone test equipment can simulate organs such as the artificial fingers, the artificial ears and the artificial mouth and carry out full-automatic detection on mobile phone voice frequency, vision, an LCD screen, a USB, Bluetooth, a headset, WIFI and the like. By means of one piece of equipment, performance of all aspects of a mobile phone can be tested comprehensively and integrally, the occupied space is small, the investment in manpower resources is small, the protecting box can insulate sounds and is antimagnetic, the whole testing process is not influenced by external factors, and is coherent and orderly, errors are few, and the precision is high.

A system and method for providing an intelligent wire testing capability for complex hardware systems. The system is comprised of a software application with a relational database interfacing with an automatic test equipment module. The relational database contains all of a system's architecture information plus all of the text and parametric information associated with the design. During a system test, the subject invention uses the wiring / system architecture as disclosed in the relational database together with an automatically generated test program to identify faults in a unit under test. Using the architecture knowledge, the subject invention is capable of automatically generating a wire harness schematic for printout or display on a CRT. The architecture knowledge also allows a technician to quickly distinguish between a broken wire and an unused pin in a connector. After the test, the observed values are stored in a testing results file for later review and trend analysis. Data from the trend analysis provides the technician with the data necessary to assess the state of the wiring in the UUT. At the completion of testing, the testing results file stays with the UUT thereby ensuring access to a complete testing history of the UUT at any time.

The invention discloses an automatic test method and a test platform of a network server-side interface. The method comprises the following steps: leading test case data; extracting and encapsulating the test case data; simulating a client to transmit a request, and testing the network server-side interface; monitoring a test process, and recording a log; analyzing the test result and generating a test report. The test platform comprises a test management unit, a test control unit, a log unit and a test report unit, wherein the test management unit is used for leading and managing the test case data; the test control unit is used for encapsulating the test case data, simulating the request of the client, testing the network server-side interface and monitoring the test process; the log unit is used for generating a log according to the data fed back by the test control unit, and recording an alarm, an error parameter value and position information; and the test report unit is used for carrying out cumulative statistics analysis based on anticipation of the test management unit according to an execution state of the test case data fed back by the test control unit, and automatically generating a test report.

Enterprise test configuration and data management systems and associated methods are disclosed for test, measurement and automation environments that allow management, configuration and analysis of test systems and associated data across enterprise-wide test operations. These systems and methods are directed to the production process from the test and test station point of view and provides a variety of mechanisms for test configuration and data management for test stations (or automated test equipment (ATEs)) including the capability of managing data about each test station, hardware resources, software resources, test configuration, test steps, acquired measurements, test execution, and / or other information related to the tests, the test stations or the units-under-test (UUT). Standardized interfaces are also contemplated for the test station (or ATE) software to communicate with server systems and other ATEs if needed, thereby greatly simplifying the coding required for these systems and allowing each test station (or ATE) to talk through the same standardized interface.

The invention comprises: a photoinduction dielectrophoresis chip, machine vision unit, a vision servo unit and a virtual electrode writing unit. Said photoinduction dielectrophoresis chip is located on a supporting unit and is used for placing the simple cell suspension; said photoinduction dielectrophoresis chip is a three layer hamburger structure; said three layer structure comprises a conducting glass layer, a micro channel layer and a photoinduction chip; on the conducting glass, respectively setting an inlet and an outlet.

The invention discloses an automatic test method and an automatic test platform for a graphic user interface (GUI) based on extensive makeup language (XML) packaging key words. The method comprises the following steps: step a, a test architecture designer builds an XML architecture file for describing test key words comprising GUI elements; step b, a test example designer compiles an XML file according to the key words to form a test example which comprises test example logic, test data and an expectant result; and step c, a test platform developer develops an automatic test engine, analyzes the XML file in the test example, explains the test key words, locates the GUI elements, executes the test and verifies the result. The test logic and the test data are drawn out of test scripts and constructed by the automatic test developer and the developer, so that the automatic test developer and the tester can allow full play to individual superiorities without interaction.

The present invention is suitable for test field and provides an automatic test method, system and multimedia device of test sample. The method of the invention comprises the following steps: storing at least one test sample which is input through a remote controller and comprises a series of pushbutton key value instructions and pushbutton time interval data; automatically testing the device to be tested according to the test sample, and simultaneously outputting the information of pushbutton time interval instruction which is sent by the test sample each time through serial port. In the embodiment of the invention, at least one test sample which is input through remote controller beforehand is stored. The test sample is used for automatically testing the device to be tested. Simultaneously the information of pushbutton key value instruction which is sent by the test sample each time is output. The method, system and multimedia device of the invention have the advantages of simple operation, reduced manpower cost and increased test efficiency.

The invention discloses a keyword drive-based automatic test method of urban rail drive control units. The method comprises the following steps: determining a keyword set of a tested object; compiling a test script according to the keyword set; establishing a keyword drive-based automatic test frame and constructing a top layer test data table, a middle layer test data table, a bottom layer test data table and a keyword support library for the automatic test frame; inputting the test script into the automatic test frame, successively calling drives of the layers to inquire the contents in the test data tables on the basis of a test drive engine of the automatic test frame in allusion to each objective keyword in the test script; and calling bottom layer functions of the keyword support library to output a script bottom layer execution sequence file and directly and interactively carrying out test with the tested object. The keyword drive-based automatic test method of urban rail drive control units has the advantages of reducing the skill requirement for the test personnel, being high in test script reusability and good in maintainability and portability, shortening the test script development and maintenance time and reducing the test script development and maintenance cost.

The invention discloses a hardware-in-the-loop simulation system of an automatic mechanical transmission (AMT) controller, which comprises a LABCAR system, wherein the LABCAR system comprises a gasoline engine vehicle model, the gasoline engine vehicle model comprises a vehicle submodel, the vehicle submodel comprises an automatic transmission case submodel, and the automatic transmission case submodel comprises a signal collection model, a transmission system model, an execution mechanism model and a shift-level processing model. The invention also discloses a method for the hardware-in-the-loop simulation system to automatically test the AMT controller. Due to the adoption of the hardware-in-the-loop simulation system and the method, the interaction between vehicles and the AMT controller can be actually simulated, so different tests can be performed on the AMT controller.

The present invention discloses a probing system for integrated circuit devices, which transmits testing data between an automatic test equipment (ATE) and an integrated circuit device. The ATE includes a first transceiving module, and the integrated circuit device includes a core circuit, a built-in self-test (BIST) circuit electrically connected to the core circuit, a controller configured to control the operation of the BIST circuit, and a second transceiving module configured to exchange testing data with the first transceiving module. Preferably, the integrated circuit device further includes a clock generator and a power regulator electrically connected to the second transceiving module, wherein the ATE transmits a radio frequency signal via the first transceiving module, and the second transceiving module receives the radio frequency signal to drive the power regulator to generate power for the integrated circuit device to initiate the BIST circuit.

A accurate time measurement circuit. The design is amenable to implementation as a CMOS integrated circuits, making the circuit suitable for a highly integrated system, such as automatic test equipment where multiple time measurement circuits are required. The circuit uses a delay locked loop to generate a plurality of signals that are delayed in time by an interval D. The signal to be measured is fed to a bank of delay elements, each with a slightly different delay with the difference in delay between the first and the last being more than D. An accurate time measurement is achieved by finding coincidence between one of the TAP signals and one of the delay signals. The circuit has much greater accuracy than a traditional delay line based time measurement circuit with the same number of taps. It therefore provides both accuracy and fast re-fire time and is less susceptible to noise.

The invention provides an air conditioning controller automatic test device and method which employs single-chip computer technology. The device can carry out complete automatic test, even in one person-multi-testers automatic test way and can realize the generalization of testers, reducing the quantity of testers significantly. Diversified working conditions under which the air conditioner works can be obtained by simulating with voltage, thereby reducing the difficulty of the air conditioning controller test. The device comprises a tester, a thimble connected with a contact of a controller under test, a thimble mounting seat and a connecting lead connecting the thimble and an element of the tester circuit. The tester comprises a shell and elements of the tester circuit which comprises a main-board, a connecting board between the main-board and the thimble mounting seat and a light board. The main-board comprises an HV feedback signal processing circuit, a scavenging motor detecting circuit, a control signal output circuit, an infrared signal transmission circuit, a simulation temperature voltage signal generating circuit, a light board driving circuit and a single-chip microcomputer. The light board of the tester is provided with a display device.

The invention relates to an automatic test method and system. The automatic test method comprises: distributing a test module respectively for each tested equipment according to configuration files and loading configuration information in each test module respectively. The configuration file comprises: relative information of tested equipment; the test module configures the tested equipment corresponding to the test module according to configuration information and transmits configuration-finishing information to a main test module after finishing configuration; the main test module sets a test instrument and chooses corresponding port to the tested equipment on auxiliary equipment; the test instrument tests the tested equipment through the port under the control of main test module and transmits the test information to the test module corresponding to the tested equipment. The test information is processed by the test module to obtain the test result of the tested equipment. The invention realizes that multiple tested equipments share single test instrument simultaneously, which improves the resource utilization rate of the test instrument.

A technique is described for performing critical parameter analysis (CPA) of a semiconductor device (DUT) by combining the capabilities of conventional automated test equipment (ATE) with a focused optical beam scanning device such as a laser scanning microscope (LSM). The DUT is provided with a fixture such that it can be simultaneously scanned by the LSM or a similar device and exercised by the ATE. The ATE is used to determine pass / fail boundaries of operation of the DUT. Repeatable pass / fail limits (for timing, levels, etc.) are determined utilizing standard test patterns and methodologies. The ATE vector pattern(s) can then be programmed to “loop” the test under a known passing or failing state. When light energy from the LSM scanning beam sufficiently disturbs the DUT to produce a transition (i.e., to push the device outside of its critical parameter limits), this transition is indicated on the displayed image of the DUT, indicating to the user which elements of the DUT were implicated in the transition.

A flexible closed-loop controller capable of being quickly and easily configured for a broad range of applications. The controller contains a set of control elements that may be configured or reconfigured for any specific application. Built-in configuration management automates configuration of the control elements dependent on user commands or operating conditions. The controller is autonomous after initial configuration, although it may be used interactively. This flexible closed-loop controller is suitable for switching power supplies, linear amplifiers, AC inverters, battery chargers, electronic loads, temperature and pressure management, motor or actuator drives, as well as industrial automation, data acquisition, and automatic test equipment. The controller reduces development time and cost, reduces parts count and cost, and improves performance and reliability of real-time closed-loop systems.

A vertical probe card for testing electronic devices includes a multi-layer ceramic substrate mounted on a printed circuit board. The multi-layer ceramic substrate provides a plurality of vertical probes arranged in a planar array and formed on the surface of the multi-layer ceramic substrate by micro-fabrication technology. The method of using the vertical probe card includes disposing a device to be tested under the card, aligning the card's probes with the I / O terminals of the device, and contacting the device with the card's ceramic substrate so that all of the contact portions of the I / O terminals are contacted and deformed by the probes. The relative positions of the electronic device and the apparatus are maintained while Automatic Test Equipment tests the device.

A testing method and circuit used to test high-speed communication devices on Automatic Test Equipment—ATE. The method and circuit provide a solution to testing very high speed (2.5 Gbps and above) integrated circuits. The circuit fans out the data streams from the output of the Device Under Test (DUT) to multiple tester channels which under-sample the streams. The testing method and circuit also allow for the injection of jitter into to the DUT at the output of the DUT. The skipping of data bits inherent in multi-pass testing is avoided by duplicating the tester resources to achieve effective real-time capture (saving test time and improving Bit Error Rate). Moreover the circuit synchronizes different DUTs with the timing of ATE hardware independent of DUT output data. Also, a calibration method is used compensate for differing trace lengths and propagation delay characteristics of test circuit components.