4928 results about "Test facility" patented technology

An apparatus for detection and quantitation of an electrochemically-detect- able analyte, such as glucose, in blood or interstitial fluid includes a meter unit, a lancet and an electrochemical sensor. Of these components, the meter is preferably reusable, while the lancet and the electrochemical sensor are preferably incorporated in assemblies intended for single-use. The meter unit has a housing, within which a lancet is engaged with a mechanism for moving then lancet; a connector disposed within the housing for engaging an electrochemical sensor specific for the analyte and transmitting a signal indicative of the amount of analyte, and a display operatively-associated with a connector for displaying the amount of the analyte to user. The electrochemical sensor is adapted for detection of a particular analyte. In addition, the electrochemical sensor has an absorptive member for uptake of a sample of blood or interstitial fluid. In one version, the lancet moves from a initial position to a piercing position in which skin of the user is pierced and optionally back to a retracted position. The electrochemical sensor is disposed such that the absorptive member takes up a sample from the pierced skin of the user when it is pierced by the lancet without movement of the apparatus. In an alternative version, the lancet is a hollow cannula through which blood or interstitial fluid is transported from the puncture site to an absorbent portion of the electrochemical sensor. In either version, the apparatus provides single-step operation in which sample acquisition and analysis occur as a result of the single action of pressing the apparatus against the users skin.

An automated application test system comprises a plurality of clients (3) providing test interfaces to corresponding users, and a network of test nodes (4a) connected to the clients (3); wherein each said test node (4a) comprises one or more test devices locally connected to the test node (4a); and an agent (6) arranged to execute one or more test applications on the locally connected test devices (4b) in accordance with requests from the clients (3).

An analyte detection system is provided with calibration information uniquely specific to the set of test strips to which the sample is to be applied. The calibration information may be stored in permanent memory of the testing device, such that the device is discarded after use of all the test strips in a kit, or it may be stored in a calibration chip accompanying the set of test strips and distributed therewith, thereby enabling re-use of the testing device with a different set of test strips and associated calibration chip.

A method for testing a ZigBee device included in an IC Card includes associating a predetermined Personal Area Network (PAN) Identifier to the ZigBee device, and providing a test device, for initializing a ZigBee network. The method may include connecting the ZigBee device to the ZigBee network and transmitting the corresponding PAN Identifier to the test device. The method may include returning a fault message, indicative of a failure of connecting and transmitting, if the test device does not receive the PAN Identifier. The predetermined PAN Identifier may be stored in a memory portion of the test device and include, in the fault message, the PAN Identifier if the test device does not receive the PAN Identifier, in order to identify the ZigBee device as a defective device.

A route planning device includes: a search unit that searches for a plurality of facilities located near the minimum-cost route from a current position to the destination, where the battery can be charged; a guided route calculation unit that sets a waypoint on the minimum-cost route via which the moving object can be guided to each facility, and calculates a guided route from the waypoint to the each facility and a first power requirement indicating an amount of power required to travel through the guided route; and a facility designating unit that designates a target facility to which the moving object is to be guided, based upon third power requirements each calculated by adding a second power requirement, indicating an amount of power required to allow the moving object to travel from the current position to the waypoint, to the first power requirement and remaining power in the battery.

A method and apparatus for tracing hardware states using dynamically reconfigurable test circuits provides improved debug and troubleshooting capability for functional logic implemented within field programmable logic arrays (FPGAs). Special test logic configurations may be loaded to enhance the debugging of a system using FPGAs. Registers are used to capture snapshots of internal signals for access by a trace program and a test multiplexer is used to provide real-time output to test pins for use with external test equipment. By retrieving the hardware snapshot information with a trace program running on a system in which the FPGA is used, software and hardware debugging are coordinated, providing a sophisticated model of overall system behavior. Special test circuits are implemented within the test logic configurations to enable detection of various events and errors. Counters are used to capture count values when system processor execution reaches a hardware trace point or when events occur. Comparators are used to detect specific data or address values and event detectors are used to detect particular logic value combinations that occur within the functional logic.

The present invention discloses a testing circuit and method for thin film transistor display array, for testing the yield of thin film transistor array. The testing circuit comprising: An array tester, a test panel (DUT), a sense amplifier array. The sense amplifier is composed by a plurality of trans- impedance amplifier unit and a plurality of parasitic capacitance discharge circuit unit. Every sense amplifier includes: a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance, the trans-impedance amplifier is used to form an integrated circuit, the output is transmitted to a sampling / hold circuit via a switch; a parasitic capacitance discharge circuit is used to form a discharge rout for the charge of the parasitic capacitance.

A testing circuit and method for thin film transistor display array, for testing the yield of a thin film transistor array is provided. The testing circuit includes an array tester, a test panel (DUT) and a sense amplifier array. The sense amplifier is composed of a plurality of trans-impedance amplifier units and a plurality of parasitic capacitance discharge circuit units. Every sense amplifier includes a trans-impedance amplifier, which is implemented by an operational amplifier, two switches and an operation capacitance. The trans-impedance amplifier is used to form an integrated circuit and the output is transmitted to a sampling / hold circuit via a switch. Also included is a parasitic capacitance discharge circuit that is used to form a discharge route for the charge of the parasitic capacitance.

An apparatus for monitoring bioelectric signals of a patient which includes a processing system and an interface for receiving external electrical signals representative of a condition of the patient. The interface is configured to convey a representation of the received external signals to the processing system, and includes a common mode cancellation amplifier circuit which is adapted to reduce common mode signal noise present in the external signals.

A method and system for calibrating a time constant within an integrated circuit. A voltage storage element is charged, and the time required to achieve a reference voltage on the storage element is measured. The measured time is compared to a desired time. It necessary, an adjustable impedance is modified to change the charging time, and the cycle may be repeated until the charging time matches the desired time. In this novel manner, an actual RC time constant, as rendered in a particular integrated circuit, is measured and potentially adjusted to match a desired time constant. Advantageously, configuration information of the adjustable impedance may be communicated to other circuitry within the integrated circuit to enable such circuitry to implement the same RC time constant in analog signal processing. Consequently, embodiments of the present invention overcome incidences of wide tolerance in passive components implemented in integrated circuits. Beneficially, no external test equipment is required.

Methods and systems to screen equipment operators for impairments, such as intoxication, physical impairment, medical impairment, or emotional impairment, to selectively test the equipment operators and control the equipment if impairment of the equipment operator is determined. One embodiment is a method to screen an equipment operator for intoxication. A second embodiment is a method to screen an equipment operator for impairment, such as intoxication, physical impairment, medical impairment, or emotional impairment. A third embodiment is an equipment operator screening system to determine impairment, such as intoxication, physical impairment, medical impairment, or emotional impairment.

A test strip platform for a testing apparatus of the type using test strips, wherein the platform has a shroud defining a strip track for positioning an inserted strip over an optical aperture for making analytical determinations. The platform has a hood permanently mounted to the shroud for overlying the optical window and protecting the testing apparatus optics. The strip track has stabilizing members for holding the strip in testing position. The hood provides camming members for guiding the leading edge of an inserted strip into cooperative engagement with the stabilizing members for ensuring proper insertion of the strip.

A method for testing a semiconductor device with a multi-gigabit communications receiver includes combining a data output from a high-speed communications transmitter with a perturbation signal generated by automatic test equipment. The combined signal data signal including jitter and low voltage swings is input to the communications receiver port under test. The automatic test equipment determines the bit error rate of the parallel data output from the receiver port under test. This test method is appropriate for semiconductor devices with multiple transceiver ports.

An innovative testing apparatus and method for a multi-paths simulating system is proposed. The testing apparatus comprises a shielded chamber to avoid the external electromagnetic interference and other unexpected transmission paths. The multi-paths simulating system is utilized by attenuators for simulating a communication effects in a MIMO channel propagation environment. A control unit can set of MIMO and SISO modes of TD, RD and DUT to determine attenuation difference and downlink, uplink throughputs difference of the TD, RD and DUT.

A test system comprises a sensor container and a testing device. The sensor container has a base and a lid. The container encloses test sensors therein. The container includes a calibration label attached thereto. The label includes electrical contacts located thereon. The electrical contacts encode calibration information onto the calibration label. The testing device has an auto-calibration feature externally located thereon. The testing device is adapted to determine the analyte concentration in a fluid sample. The auto-calibration feature includes calibration elements that communicate with the electrical contacts on the calibration label. The testing device is adapted to determine the calibration information encoded on the calibration label in response to the calibration elements engaging the electrical contacts. The encoded calibration information is determined without inserting the sensor container or the calibration label into the testing device.

The invention relates to a puncturing system for generating a puncture wound for obtaining a sample of a body fluid, comprising a press-on part to be pressed onto a body part in which a puncture wound is to be generated, a triggering means, by the actuation of which a user can trigger a puncturing motion of a puncturing element after the press-on part is pressed on, and a testing facility for determining at least one test parameter on which a sample-obtaining probability depends. A securing facility is also provided that, in a locked state, locks the triggering means such that no puncturing motion can be triggered, and, in a triggering state, releases the triggering means such that a puncturing motion can be triggered by actuation thereof, whereby the securing facility is transitioned from the locked state to the triggering state by the testing facility when the test parameter determined by the testing facility meets defined minimum requirements. A signaling facility is also provided for signaling a transition of the securing facility to the triggering state and / or for signaling that the securing facility is in the triggering state. The invention also relates to a method for preparing a puncturing system for generating a puncture wound.

A probe pin for testing electric characteristics of a semiconductor device comprises a silicon pin core (3, 23, 33), and a conductive film (4, 24, 34) covering the entire surface, including the bottom face, of the pin core. The bottom face of the probe pin is connected directly to an electrode (7, 37) positioned in or on a print wiring board. A number of probe pins can be connected to the associated electrodes at a high density, thereby forming a fine-pitch probe card having a superior high-frequency signal characteristic.

A test system comprises a sensor container and a testing device. The sensor container has a base and a lid. The container encloses a plurality of test sensors therein. The container includes a calibration label attached thereto. The label includes electrical contacts located thereon that encode calibration information onto the calibration label. The testing device has a sensor-container opening formed thereon. The sensor-container opening has an auto-calibration feature located therein. The auto-calibration feature is external to the testing device. The auto-calibration feature includes calibration elements to communicate with the electrical contacts on the calibration label. The testing device determines the calibration information encoded on the calibration label in response to the calibration elements engaging the electrical contacts. A portion of the sensor container remains external to the meter while the encoded calibration information is being determined.

A method is provided for design and programming of a probe card with an on-board programmable controller in a wafer test system. Consideration of introduction of the programmable controller is included in a CAD wafer layout and probe card design process. The CAD design is further loaded into the programmable controller, such as an FPGA to program it: (1) to control direction of signals to particular ICs, even during the test process (2) to generate test vector signals to provide to the ICs, and (3) to receive test signals and process test results from the received signals. In some embodiments, burn-in only testing is provided to limit test system circuitry needed so that with a programmable controller on the probe card, text equipment external to the probe card can be eliminated or significantly reduced from conventional test equipment.

Diagnostic products having multiple test strips within a unitary diagnostic test device, or test icon, are described herein. In the preferred embodiments of the diagnostic test device of this invention, a fluid sample distribution system is provided wherein a sample collection and distribution port is provided in the housing for receipt of a biologic fluid sample and the channeling of such sample onto a sample receiving web. The sample receiving web, which is located within the test device, is in fluid communication with an array of test strips, and is configured to deliver an aliquot of biologic fluid sample to the test site of each such test strip at essentially the same rate. In the preferred embodiments of this invention, the sample receiving web comprises at least one base segment and at least one branched segment. Each of the base and branched segments can be formed or cut from a common sheet of material or from separate sheet material and thereafter placed in contiguous relationship one another. The relative placement of the sample receiving web within the test device is coincident with a portion of each test strip and designed to effect the balanced distribution and delivery of an aliquot of the biologic fluid sample to the test site of each of the test strips within the test device.

A detector and a variable signal generator are coupled so that one or more specific changes in the output of the detector will cause a change in the characteristics of the generated signal. This change in signal characteristics is non-transient, the change remaining in effect until such time that another change in the detector output causes another change in the signal characteristic. The system can provide remote-end positive wire identification with no additional instrumentation at the remote end. When this invention is embodied in an already existing piece of test equipment, such as a multimeter or time domain reflectometer, there need be no additional hardware instrumentation at either end.

The invention is test apparatus and methods for performing loopback tests. The tests involve generating a packet-based test message having a source address and a destination address. When the test message arrives at the destination, the addresses are exchanged and the message is returned to the source. The addresses can be level 2 addresses, such as MAC addresses, and / or level 3 addresses, such as IP addresses. The returned message and the propagation properties observed for the test message can be used to determine information about the network being tested.

A distributed operating system for a semiconductor test system, such as automated test equipment (ATE), is described. The operating system includes a host operating system for enabling control of one or more site controllers by a system controller. One or more local operating systems, each associated with a site controller, enable control of one or more test modules by an associated site controller. Each test module performs testing on a corresponding device-under-test at a test site.

Testing apparatus, and an associated method, for testing operation of a mobile terminal. Testing is performed, e.g., to determine compliance of the mobile terminal to E911 Phase II positioning requirements. A network and radio channel emulator emulates network signals generated and communicated to the mobile terminal in an actual operating environment. Positioning measurements made by the mobile terminal are monitored and determinations of the operation of the mobile terminal are made therefrom.

The present invention provides a system and method for testing compliance of a device with a bus protocol. The method comprises the steps of reading a configuration file containing predetermined parameters identifying the type of device and capabilities of the device, and then employing a configuration engine to dynamically generate a test environment for the device by creating selected test components which are coupled via the bus with a representation of the device to form the test environment, the test components being selected dependent on the configuration file. A test sequence is then executed, during which signals passed between the representation of the device and one or more of the test components are monitored to generate result data indicating compliance with the bus protocol. This approach has been found to provide a particularly user friendly and efficient approach for testing compliance of devices with a bus protocol.

An apparatus for monitoring a spatial area, in particular for safeguarding a hazardous area of an automatically operated installation, comprises an illumination device which at least temporarily emits light signals into the spatial area. A first image recording unit records a first image of the spatial area. The first image recording unit comprises an image sensor having a plurality of pixels. An evaluation unit determines a distance value for at least one spatial area point, which is located in the spatial area and is imaged on at least one pixel, by means of a propagation type measurement. The propagation type measurement suffers from a limited unambiguity range. Therefore, a test device is designed to check the distance value by means of a reference distance value determined from a second image of said spatial area.