Automatic test approach and system

Abstract

The invention relates to an automatic test method and system. The automatic test method comprises: distributing a test module respectively for each tested equipment according to configuration files and loading configuration information in each test module respectively. The configuration file comprises: relative information of tested equipment; the test module configures the tested equipment corresponding to the test module according to configuration information and transmits configuration-finishing information to a main test module after finishing configuration; the main test module sets a test instrument and chooses corresponding port to the tested equipment on auxiliary equipment; the test instrument tests the tested equipment through the port under the control of main test module and transmits the test information to the test module corresponding to the tested equipment. The test information is processed by the test module to obtain the test result of the tested equipment. The invention realizes that multiple tested equipments share single test instrument simultaneously, which improves the resource utilization rate of the test instrument.

Description

technical field [0001] The invention relates to the field of automatic testing, in particular to an automatic testing method and system. Background technique [0002] Usually, automated testing of communication products generally requires configuring a corresponding automated testing platform for the communication product under test. That is, an automated test platform can only test one device under test at the same time. When it is necessary to test multiple devices under test at the same time, it is necessary to set up multiple automated test platforms at the same time, which not only requires a lot of manpower and material resources, but also And it is not conducive to the centralized management of the test. An automated test platform generally consists of a test instrument and a script execution server. Since test instruments are generally expensive, if each device under test is equipped with a test instrument, there will be insufficient resources, which will lead to a...

AI Technical Summary

Problems solved by technology

Since test instruments are generally expensive, if each device under test is equipped with a test instrument, there will be insufficient resources, which will lead to a corresponding extension of the test cycle, and even the failure to complete the test project on time

[0003] In addition, the existing automated testing process is generally linear, and only one thing can be done at the same time. For example, the test equipment cannot be set while configuring the device under test, that is, the test steps can only be executed sequentially, so that Reduce the efficiency of automated execution and lengthen the time of automated testing

Moreover, in this way, the test records and test reports output by the automated test program are independent, which is not conducive to the unified management and summary of test records. For example, if it is necessary to compare product differences between products, it is necessary to add a test record summary the process of

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