1219 results about "Test station" patented technology

Systems and methods for providing a boundary scan test of a wired or wireless network having a plurality of network nodes are presented. The system includes a test station communicatively coupled with the network. The test station creates a MAC layer scan test route sequence that includes each link in the network and is independent of the routing mechanism and protocol used for the network. The test station also creates a test agent that is configured to traverse each link in the scan test route sequence. The test agent is then deployed on the network and information about a link is reported back to the test station after the test agent examines the link. The scan test route sequence can be created by sending out a series of broadcast messages from one or more nodes in the network, sequentially applying a network tour to cover the entire network, or performing a depth first search on the entire network.

A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.

A semiconductor wafer is placed into a probe fixture with a front side of the wafer facing up. Power and signal probes are then placed on an integrated circuit (IC) formed on the front side of the wafer. The probe fixture is retained at a test station either in a upright or an inverted position for testing and optical failure analysis. The probe fixture includes a position adjustment mechanism to locate the entire probe above the wafer and to more precisely position a tip of the probe on the IC. Optical failure analysis techniques are performed on the front side or the back side of the wafer while the wafer is retained in the test fixture and the probes are connected to the IC.

A method of controlling an additive fabrication process includes providing a primary substrate and a test substrate. Polymer test material is extruded onto the test substrate utilizing an extrusion head. The extrusion head is moved relative to the test substrate, and a force required to move the extrusion head relative to the test substrate is measured to thereby generate test data. A part is fabricated by extruding polymer material onto the primary substrate utilizing the extrusion head. The test data is utilized to control at least one process parameter associated with extruding polymer material onto the primary substrate.

Systems and methods for providing a boundary scan test of a wired or wireless network having a plurality of network nodes are presented. The system includes a test station communicatively coupled with the network. The test station creates a MAC layer scan test route sequence that includes each link in the network and is independent of the routing mechanism and protocol used for the network. The test station also creates a test agent that is configured to traverse each link in the scan test route sequence. The test agent is then deployed on the network and information about a link is reported back to the test station after the test agent examines the link. The scan test route sequence can be created by sending out a series of broadcast messages from one or more nodes in the network, sequentially applying a network tour to cover the entire network, or performing a depth first search on the entire network.

A wireless integrated circuit test method and system is presented. The invention allows testing of one or more integrated circuits configured with a wireless interface and a test access mechanism which controls input of test data received over a wireless connection from a test station to test structures which test functional blocks on the integrated circuit. Via the wireless connection, multiple integrated circuits or similarly equipped devices under test can be tested simultaneously. The invention also enables concurrent testing of independently testable functional blocks on any given integrated circuit under test.

With the present invention, a component may be identified based upon selected physical characteristics of the component. In one embodiment, a system is provided for storing information pertaining to components within a set of components. A characterization function, which is a function of relevant physical characteristics shared by each component within the set of components, is associated with the set of components. The system includes a characterization value test station and a database. The characterization value test station is used to determine the characterization values of the components pursuant to the characterization function. The database stores information that pertains to each component with the component's characterization value linked as an identifier to the information. In this manner, information pertaining to a component may be retrieved from the database based on the component's characterization value.

A probe assembly that acts as a temporary interconnect between terminals on an IC device and a test station. The probe assembly includes a plurality of stud bumps arranged on a first surface of a substrate in a configuration corresponding to the terminal on the IC device. The stud bumps include a shape adapted to temporarily couple with the terminals on the IC device. A plurality of conductive traces on the substrate electrically couple the stud bumps with the test station.

A wireless integrated circuit test method and system is presented. The invention allows testing of one or more integrated circuits configured with a wireless interface and a test access mechanism which controls input of test data received over a wireless connection from a test station to test structures which test functional blocks on the integrated circuit. Via the wireless connection, multiple integrated circuits or similarly equipped devices under test can be tested simultaneously. The invention also enables concurrent testing of independently testable functional blocks on any given integrated circuit under test.

A clinical test apparatus employing a mobile robot is provided. The clinical test apparatus includes a stage unit, a test station provided in the stage unit and configured to perform a clinical test, a mobile robot configured to move on a top surface of the stage unit and to transfer a plate on which samples and reagents are loaded to the test station, and a docking unit disposed in the stage unit and configured to reset a position of the mobile robot. A variety of test stations for a clinical test can be integrated, and multiple tests can be performed at the same time through a plurality of mobile robots.

This invention relates to an automatic monitor method and a system of city gas ductworks, which sets up test stations at the nodes of the ductwork to collect gas flow signals in pipes of the nodes, sets a monitor center server transmitting data information collected by the test stations to the test stations via radio communication network and storing space geographical data of the parts of the ductwork and installing and operating data process and leakage monitor software based on the GIS technology to pre-warn leakage of ductwork and transmitting the leakage information to maintenance stations.

A system and method for accessing data to generate documents for use in MICR line testing. The system comprises a MICR testing station for testing MICR processing. The MICR testing station comprises a MICR line testing module for generating at least one MICR testing document for use in testing MICR processing. The MICR line testing module further comprises: (1) an application determination module for determining an application based on a bank selection provided by a tester, (2) a routing / transit number determination module for determining a routing / transit number based on the bank and the application determined, and (3) a tran code determination module for determining a tran code based on the routing / transit number determined; and at least one client station connected to the MICR testing station via a communications network, the at least one client station being used by at least one tester to provide particulars about at least one MICR line.

Enterprise test configuration and data management systems and associated methods are disclosed for test, measurement and automation environments that allow management, configuration and analysis of test systems and associated data across enterprise-wide test operations. These systems and methods are directed to the production process from the test and test station point of view and provides a variety of mechanisms for test configuration and data management for test stations (or automated test equipment (ATEs)) including the capability of managing data about each test station, hardware resources, software resources, test configuration, test steps, acquired measurements, test execution, and / or other information related to the tests, the test stations or the units-under-test (UUT). Standardized interfaces are also contemplated for the test station (or ATE) software to communicate with server systems and other ATEs if needed, thereby greatly simplifying the coding required for these systems and allowing each test station (or ATE) to talk through the same standardized interface.

A disposable liquid specimen collector and testing device can be manipulated to distribute a quantified portion of a liquid specimen to separate chromatographic strip-mounting testing stations while shielding the remainder of the specimen from cross-contamination by the immunoassay reagents present in the testing strips. In the resting state, the device exposes the testing station to a desiccant. A separate test station provides for a quick revelation of any adulterating component in the sample specimen. The geometry of the test station and fluid distribution channels assures isobaric conditions throughout the testing areas.

The invention discloses an intelligent flexible production line based on automatic robot assembling and an operating method thereof. The production line consists of an industrial personal computer, a track, a mobile platform, an industrial robot, an industrial robot control cabinet, a rivet feeding system, a vacuum scrap suction device, a main control cabinet, a knife test station, and a flexible tool. The industrial robot, the industrial robot control cabinet, the rivet feeding system, the vacuum scrap suction device, the main control cabinet are installed on the mobile platform; an end effector is carried on the tail end of the industrial robot; and the flexible tool and the knife test station are arranged at one side of the track. According to the invention, the processing process of the high-intelligence control can be realized; the process can be controlled precisely; the product processing quality is high and stability is high; and the production line and the operating method are suitable for various products.

The invention discloses an external field antenna pattern testing method. A test station is looked for as an auxiliary antenna and an antenna rotation platform system are installed on a mobile maneuvering device and move around a measured antenna; a total station in an optical surveying and mapping instrument is innovatively adopted for locating the angle and the distance when the antenna moves and a test station with the corresponding deviation angle can be accurately located. By the adoption of the test station locating method where the maneuvering device, the total station in the optical surveying and mapping instrument and the antenna rotation platform system are combined, the measuring angle can be located accurately to local conditions under conditions of an external field. Meanwhile, after the measuring station is located, the total station is used for automatically tracking azimuth information and a horizontal scan frame on the antenna rotation platform system is used for moving the auxiliary antenna, so that the auxiliary antenna can be accurately located at all measuring stations within a certain measurement angle range at each measuring station, the moving frequency of the maneuvering device is lowered, errors brought by moving of the maneuvering device are reduced and the testing efficiency is improved.

This Invention provides a system-level framework for an enterprise-level test environment. The environment provides test development, automation, and execution processes for product validation and verification, and allows the interoperability of test cases, data, equipment information, and results across various enterprise platforms. The system, with its processes and methods, provides various mechanisms for managing test configurations, developing test plans, managing test data, and developing test reports from one or more test-stations and / or from one or more test equipment(s) for one or more Device(s) Under Test (DUT). These mechanisms include, but are not limited to, functions such as data management and sharing, test library reusability, test station management, test configuration management, test execution, test report development, and data mapping / plotting. The system can be customized to support scalable enterprise requirements. The development of the standardized data handling and communication processes and methods allows inter-system communication and interoperability of test information across various platforms.

Aspects of the invention relate to a test station for a fuel cell power module (FCPM). The fuel cell power module has at least one fuel cell therein and a FCPM controller. The test station includes a test controller arranged to communicate with the FCPM controller to determine performance of the FCPM under a simulated load. The test station and FCPM may be arranged in various combinations and configurations for testing one or more FCPM's. One embodiment relates to a master-slave arrangement in which a master controller controls a number of slave test stations, each slave test station being arranged to test a respective power module under a simulated load

The invention discloses a high-altitude and low-pressure characteristic simulation test station of an air compressor in an internal-combustion engine, relating to a characteristic simulation test station of an air compressor in an internal-combustion engine, and comprising an air pipeline system and a lubricating system, wherein the air pipeline system comprises a vacuum pump, a pressure stabilizing box, and an air filter, a flow testing section, an air inlet parameter testing section, a flow stabilizing section and an air compressor sequentially connected with an outlet of the pressure stabilizing box, and an air exhaust parameter testing section, a back pressure regulating valve, a stopping valve and an air exhaust intercooler sequentially connected with an outlet of the air compressor;the lubricating system comprises an oil tank, an oil supplying system and a lubricant intercooler; an outlet of the air exhaust intercooler is connected with the pressure stabilizing box so that an air pipeline of the test station forms a sealed air circulation system; and the oil tank is arranged inside the pressure stabilizing box so as to improve the sealing property of the test station. The test station can simulate the environmental pressure at the altitude of 0-30,000 meters and performs the high-altitude simulation characteristic test of the air compressor in the turbo-charged internal-combustion engine, therefore, the sealing property and simulated altitude of the test station are higher than those of the existing simulation test station of the same type.

A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading / unloading semiconductor devices in / from test trays, and greatly increasing the number of simultaneously testable semiconductor devices. The handler includes a loading station, an unloading station, test trays, an exchanging station comprising a horizontal moving unit for horizontally moving a selected one of the test trays by a predetermined pitch at a working place, a test station in which at least one test board having a plurality of test sockets to be electrically connected with semiconductor devices is mounted, the test station performing a test while connecting the semiconductor devices in one of the test trays, which is fed from the exchanging station to the test station, to the test sockets, device transfer units for transfer the semiconductor devices between the loading station and the exchanging station and between the exchanging station and the unloading station, respectively, and a tray transfer unit for transfer the test trays between the exchanging station and the test station.

The invention relates to a tide predicting method for the tide is influenced by various factors, including cyclical factors, such as tidal generation force, and non-cyclical factors, such as wind power, atmospheric pressure, coast characteristics, rainfall, dip angles of the lunar orbit and the like. The predicting accuracy of the traditional harmonic analysis method is influenced by partial tide number, and the traditional harmonic analysis method cannot analyze the influence of non-cyclical factors; the artificial neural network method developed recent years overcomes the defect that the non-cyclical factors cannot be predicted by the harmonic analysis method to a certain extent, but has great data volume required by study training samples and wide involve range, can cover various possible conditions, but has less station historical data of non-cyclical factors. The invention provides a predict model, wherein factors which influence tide non-cyclically, such as wind directions, rainfall, storm surge, coast characteristics and the like, can be fused into the model, and small sample data can receive more accurate results. In the method, a support vector machine (SVM)-based predict model is established, wherein, an SVM toolbox is imported into MATLAB 7.8; training sample data is trained by utilizing svmtrain function; the formed model is tested by using a test sample svmpredict function; and the trained and tested data can predict the tide in the same tide test station.

A method and apparatus for determining misalignment of a radar sensor unit mounted to a vehicle includes providing targets on an alignment apparatus. A vehicle is located at predetermined location on a test station an exact given distance from the alignment apparatus. The actual locations and distances of the targets from each other and from radar sensor unit of the vehicle at the test station are known and pre-stored. At least one target is a greater distance from the vehicle than the other targets. The targets receive and return a radar wave from the radar sensor unit. The radar sensor unit determines locations and distances of the targets and compares with the given or actual locations and distances of the targets to determine misalignment of the radar sensor unit. A calibration program automatically calibrates azimuth and elevation to adjust for misalignment.

A system and method for the remote administration of respirator fit tests are disclosed, along with a system and method for administering qualitative respirator fit tests to two or more test subjects simultaneously. Remote administration of respirator fit tests involves the testing of test subjects located at one facility by a test administrator located at a different facility. The two facilities may be located, for example, in the same city, in different countries, etc. As a result, a single test administrator may, for example, be able to administrate fit tests with test subjects located in a variety of facilities in one day without traveling. Qualitative respirator fit testing systems and methods of the invention include multiple test stations and an aerosol generator system in fluid communication with each of the test stations. The aerosol generator system may be capable of delivering aerosol to the test stations in repeatable, selected amounts and may also be capable of delivering the aerosols to some or all of the stations simultaneously.

A test station for wireless devices and methods for calibration thereof. The test station includes a signal generator, a calibrator, a scanner having receiving and transmitting antennas, a signal analyzer, and a computer. Under the direction of the computer, the signal generator generates a calibration signal in accordance with a programmable calibration signal script. The calibrator may be used to emulate either a wireless device in transmit mode by transmitting the calibration signal to the scanner for analysis by the signal analyzer, or a wireless device in receive mode by receiving the calibration signal from the scanner for analysis by the signal analyzer. The behavior of the test station is calibrated by correlating signal parameters of the calibration signal as specified by the calibration signal script and as measured at the signal analyzer.

A test station for wireless devices and methods for calibration thereof. The test station includes a signal generator, a calibrator, a scanner having receiving and transmitting antennas, a signal analyzer, and a computer. Under the direction of the computer, the signal generator generates a calibration signal in accordance with a programmable calibration signal script. The calibrator may be used to emulate either a wireless device in transmit mode by transmitting the calibration signal to the scanner for analysis by the signal analyzer, or a wireless device in receive mode by receiving the calibration signal from the scanner for analysis by the signal analyzer. The behavior of the test station is calibrated by correlating signal parameters of the calibration signal as specified by the calibration signal script and as measured at the signal analyzer.