The invention discloses a simple
boundary scan test
system based on a single-
chip microcomputer. The simple
boundary scan test
system comprises a control platform, a
USB-to-
serial port conversion circuit and a JTAG
control circuit, wherein the control platform is used for transmitting TMS signals and TCK signals to a tested
chip, controlling the tested
chip to enter the corresponding working state, and receiving TDO signals output by the tested chip; the
USB-to-serial-port conversion circuit is used for receiving
USB bus signals output by the control platform, converting the USB
bus signals into TMS signals and TCK signals in the serial
data format and outputting the TMS signals and the TCK signals to the JTAG
control circuit and also used for receiving TDO signals in the serial
data format output by the JTAG
control circuit, converting the TDO signals into the USB
bus signals and outputting the USB bus signals to the control platform; the JTAG control circuit is used for receiving TDO signals output by the tested chip and outputting the TDO signals to the USB-to-
serial port conversion circuit. The
boundary scan test
system is simple in structure and low in cost; the control platform of the system is independently developed, and thus the system is good in safety, and function extension is convenient to perform; the system is good in universality.