The invention discloses a automatic chip testing method, which is characterized by comprising the steps that: the system is powered on, and initialization is completed; the configuration is carried out, a test thread needs to be started is determined according to chip types, and an instrument transceiving end is configured; a test command is generated, test items and test parameter setting in a chip integrated test case configuration file are read and analyzed, and a command frame is generated and transmitted to a single-board system through a communication interface; and the command is analyzed, and setting and testing steps are carried out. The automatic chip testing method can achieve the automatical test and data storage of chips, can be used for testing the chips quickly, is high in test efficiency, saves test time to a certain extent, can achieve the purposes of automatic configuration of a tested DUT chip, automatic configuration of instruments, automatic recovery of test results and automatic generation of test reports, automatic generation of test case reports and automatic switching of test cases through the development of an automatic chip testing platform.