Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Buried-point testing method, as well as data query method and device

A test method and point data technology, applied in the computer field, can solve the problems of low buried point test efficiency, unfavorable buried point test, and high technical threshold, and achieve convenient query of buried point data, convenient viewing of buried point data, and avoidance of packet capture operations. Effect

Active Publication Date: 2015-09-16
KINGSOFT
View PDF4 Cites 60 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the problem with the related buried point testing method is: due to the large number of buried points, the tester needs to frequently use the packet capture tool to capture packets, and when the data is encrypted, the tester also needs to decrypt the data to view the buried point data , testers need more steps to view buried point data, viewing buried point data is time-consuming and labor-intensive, and the efficiency of buried point testing is low
In addition, testers need to master the use of packet capture tools, and the technical threshold is high, which is not conducive to buried point testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Buried-point testing method, as well as data query method and device
  • Buried-point testing method, as well as data query method and device
  • Buried-point testing method, as well as data query method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032]Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0033] The buried point test method, data query method and device of the embodiments of the present invention will be described below with reference to the accompanying drawings.

[0034] figure 1 It is a flow chart of a buried point testing method according to an embodiment of the present invention.

[0035] Such as figure 1 As shown, the buried point testing method includes:

[0036] S101. Execute the software to be tested.

[0037] Wherein, there are multiple buried points in the software to be tested, and the multiple buri...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a buried-point testing method, as well as a data query method and device. The buried-point testing method comprises: implementing software to be tested, wherein the software to be tested contains a plurality of buried points, and the buried points respectively correspond to a plurality of function modules in the software to be tested so as to be triggered when the corresponding function modules are implemented; when the situation a buried point in the software to be tested is triggered is monitored, obtaining buried-point data corresponding to the corresponding buried point; reporting the buried-point data to a query server so as to generate a database of a query server, wherein the query server offers the corresponding buried-point data according to the input buried-point information. Through the adoption of the buried-point testing method, users can conveniently view the buried-point data, so that the operation of the users for viewing the buried-point data is simplified, the efficiency of viewing the buried-point data for the users is improved, and further the testing efficiency can be improved.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a buried point testing method, a data query method and a device. Background technique [0002] With the rapid development of software technology, various software that can realize functions such as text editing, image processing, chatting, and playing audio and video emerge in an endless stream. Many buried points. When the user is using the software, if the user triggers a function module with preset buried points, the software will send the corresponding buried point data to the server. By analyzing the buried point data, you can know whether the software function is good or not, and then adjust or Improve software functionality. [0003] In order to ensure that the set buried points can be used normally, usually software testers need to test the buried points after setting the buried points. The relevant buried point test method is as follows: After setting the bu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F17/30
Inventor 刘小梅
Owner KINGSOFT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com