Field programmable gate array (FPGA)-based integrated circuit chip testing system and method

Abstract

The invention discloses a field programmable gate array (FPGA)-based integrated circuit testing system, and a method for testing a digital-analog hybrid integrated circuit chip provided with a digital module or using a digital module as a main module and provided with a few analog modules by using the testing system. The system mainly comprises a personal computer (PC) machine, a main control chip, a FPGA chip, configuration information storage equipment and testing vector storage equipment. The testing method is implemented by the following steps that: the main control chip configures the FPGA chip, the main control chip sends a testing command to the FPGA chip, the FPGA chip sends an excitation signal to a chip to be tested and acquires the output response of the chip to be tested, or the analog parameter module acquires analog output response, the FPGA chip compares the output response or the analog output response of the chip to be tested with the testing information and judges the consistency of the output response and the testing information, and the chip to be tested is an accepted product or a defective product is judged. The system and the method can be widely applied in the field of integrated circuit chip test.

Description

technical field [0001] The invention relates to an FPGA-based integrated circuit chip test system, and a method for testing integrated circuit chips with digital modules or digital-analog hybrid integrated circuit chips with digital modules as the main part and a small number of analog modules by using the test system . Background technique [0002] With the development of the integrated circuit industry, the proportion of the test cost of integrated circuit chips continues to rise. After the chip is designed and produced, the integrated circuit design company often needs to find a professional chip testing machine to test the chip to identify and pick out bad chips. , Only qualified chips that pass the test can be sold and used. At present, domestic integrated circuit chip testing is mainly carried out by integrated circuit design companies purchasing test machines or entrusting professional testing institutions to conduct testing. However, due to the high price of profes...

AI Technical Summary

Problems solved by technology

However, due to the high price of professional testing machines, domestic design companies are generally unwilling to invest a large amount of money in purchasing expensive equipment. At the same time, there are not many professional testing institutions in China, resulting in chip testing becoming a major bottleneck for products that cannot be put into the market quickly.

At present, there are a lot of integrated circuits in the market that are dominated by digital modules and a small amount of analog modules. The design cycle is short, the cost is low, and the shipment volume is large. Therefore, the test cost control of such chips is also relatively strict.

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