359 results about "Test card" patented technology

A test card for drugs of abuse has a thin flat member having the size and shape of a business card. A plurality of immunoassay test strips extend longitudinally from top to bottom at the card and are fastened side by side in parallel on one or both sides of the test card within the outline of the card. Each test strip is reactive to provide a visual indication in response to a particular drug of abuse. The test card thus provides for the simultaneous detection of multiple analytes. Processes are also disclosed for making the drug test card with test strips on one and both sides of the card.

Electrochemical test strip cards that can be singulated to produce electrochemical test strips are provided. The electrochemical test cards are made up of two or more electrochemical test strip precursors, where each precursor is characterized by the presence of a dry reagent housing reaction chamber bounded by opposing electrodes. In gaseous communication with each reaction chamber of the card is an integrated desiccant. Also provided are methods of using the subject electrochemical test strips cards, as well as kits that include the same. The subject test strips and cards find use in the detection / concentration determination of a number of different analytes, including glucose.

A disk drive test apparatus has a plurality of bays each for receiving a respective disk drive to be tested. A plurality of card slots are provided each for receiving a test card via which a disk drive can be tested. Each of the test cards is either an environment test card or an interface test card. The card slots and the test cards are arranged such that each card slot (6) can selectively receive an environment test card or an interface test card. Other arrangements for disk drive test apparatus or disk drive mounting apparatus are disclosed.

The invention provides a test paper reading method and a test paper reading device, which can read dry chemical test paper strips, colloidal gold immunochromatograohic assay test paper strips / cards and rapid pesticide residue test cards, are easy to operate, need no extra detection instrument and equipment, can automatically judge and read the detection result by only acquiring corresponding developing pictures through electronic equipment such as computers or mobile phones, have reliable testing accuracy and are particularly suitable for personal and household wide application. The method comprises the following steps: A. acquiring images; B. processing the acquired images; C. performing negative and positive discrimination; and D. performing concentration conversion on a sample which is discriminated to be positive in the step C through a concentration-gray scale relation to obtain a concentration value of the to-be-tested paper card / strip. The device comprises a shell and a built-in standard gray scale strip, wherein the shell is provided with a standard gray scale strip display window and is also provided with a first card slot, a second card slot and a third card slot for arranging the colloidal gold card, the rapid pesticide residue test card and the dry chemical test paper respectively.

The invention discloses a vidicon definition detection method based on a definition test card, comprising the following steps of: 1) selecting a video definition test card, selecting vidicons with different definition grades, shooting an image of the definition test card, and measuring a definition function value of the definition test card, wherein the specific processes are as follows: 1.1) detecting a horizontal gradient, a vertical gradient and a total gradient of the image; 1.2) carrying out threshold value process; 1.3) calculating definition evaluation function values; 1.4) carrying out normalization process, and storing the obtained definition function value of the image shot by the vidicons with different definition grades and the definition grades of the vidicons into a database; 2) shooting a picture of the definition test card by a vidicon to be detected, calculating the definition function value of the picture, comparing the obtained definition function value with the definition function value of the image stored in the database, and selecting the most approximate numerical value as the definition grade of the vidicon to be detected. The method disclosed by the invention has the advantages of convenience, rapidness and good reliability.

Disclosed is an automatic detection system for a mobile phone camera. The system comprises a test clamp module for placing a mobile phone; a signal feedback device for leading out a test result; a control unit which is electrically connected with the test clamp module through a test control line so as to control a test to start or end and output whether the test result is qualified and is eclectically connected with the mobile phone through a shooting control line so as to send a shooting instruction and feed a shot test image; and a test cart card module which is opposite to the test clamp module for shooting and comparison of the camera. The mobile phone is placed on the test clamp module, a control interface module sends a signal to be detected to the control unit, the control unit sends a test starting instruction to the mobile phone through the shooting control line so as to drive the mobile phone to start a test, after the test card chart module is shot, the mobile phone transmits a detected image to the control unit through the shooting control line for comparison calibration, and the control unit, according to a comparison analysis result, gives a feedback to a signal feedback device so as to output and display whether the test result is qualified.

The invention discloses a system for automatically testing the parameters of a quartz crystal oscillator, which comprises a master computer and a parameter test card connected with the main board of the master computer, wherein the parameter test card comprises a singlechip and a test circuit and a reference circuit which are connected with the singlechip respectively. The singlechip has a D / A module, an A / D module, a first counter, a second counter and a timer. The test circuit comprises a current amplification circuit, a voltage sampling resistor, a frequency dividing circuit, a first measurement gate control circuit and the crystal oscillator to be measured. The reference circuit comprises a reference frequency source, a frequency multiplication circuit, a second measurement gate control circuit and a frequency dividing and high-frequency signal latch circuit. In the invention, the test card integrates the functions of all apparatuses such as a frequency counter, a digital voltmeter and a digital oscillometer and can be directly inserted in the main board of the computer, and the fully automatic test of various parameters, such as working frequency, working current and start up time, of the quartz crystal oscillator can be realized by a control program.

The invention provides a throughput test method and a test system. The test method includes the following steps: test equipment sends out a message to first equipment to be tested at a port to be tested; the first equipment to be tested includes a port to be tested and a plurality of ports, the equivalent bandwidths of a plurality of the ports are the same as the port to be tested; the first equipment to be tested receives the message, adopts the port to divide a virtual LAN and utilizes second equipment to be tested the same as the first equipment to be tested to generate equivalent bandwidth flow rate of the port to be tested by self circulation and then transmits the message to the equipment to be tested; the equipment to be tested judges whether the number of the sent message is equivalent to the number of the received message; if so, the throughput test is passed. The invention needs no a trillion test card, and only utilizes the test equipment to realize the throughput test of trillion ports or other ports with any rate, with the advantages of cost saving, and test flexibility and practicability improvement.

A logic analyzer having internal access to the test buses, clocks and events of a chip is used to debug the chip. The logic analyzer is designed with the capability to share existing memory in the chip during the debug process. Additionally, the configuration of the logic analyzer and observation of the acquired results in the shared memory can be accessed through normal control interfaces of the chip and does not require special test cards. The logic analyzer includes a clocking function, a trigger function, a signal multiplexer, and a memory block. The clocking function is configured to select as the sample clock for the function any of the clocks in the integrated circuit. In addition, the clocking function may provide a means to decimate these clocks by some factor to sample over larger intervals.

An immunodiagnostic test card includes a plurality of transparent chambers wherein each chamber includes a quantity of testing material that combines with a patient sample, when mixed, to produce an agglutination reaction. A plurality of indicia are disposed to aid in the manufacture and determining the usability of the cards prior to test and also in objectively grading the agglutination reactions that are formed or lack of agglutination.

The invention discloses a multi-module simultaneous test device for mobile phone camera modules. The device comprises multiple sets of camera board cards that are connected together by a circuit board, the camera board cards comprise test units, each test unit comprises a pressure block (1), a probe seat (2), a bottom plate (3), a flexible flat cable (4) and a cover plate (8), an article tray (5) is arranged on the bottom plate, camera modules (6) are arranged on the article tray (5), a PCB (7) is arranged below the bottom plate (3), wherein each camera comprises a sensor, an image is transmitted to an FPC conducting wire through a mipi interface, one end of the FPC conducting wire is connected with the sensor through an edge connector, a gold finger is arranged on one side, after the article tray is placed, the cover plate (8) at the upper side presses the camera modules (6), the gold finger is connected with a board at the lower side through a probe, the board is connected with a test card to transmit image data to the test card, and the test card transmits the image data to a PC after parsing a MIPI signal.

The present invention relates to a testing method of interconnection buss for peripheral components. It utilizes PCI test card to directly operate I / O and internal memory space of PCI bus map, firstly, the PCI test card is inserted into PCI slot, then according to the configuration information the parameters required for host access can be distributed for said PCI test card, then the parameters can be written into the PCI configuration space of PCI test card, according to said configuration space the port mapping mode of said PCI test card can be defined, the data can be written into 32-bit and 64-bit address respectively, finally, according to fetch result the test conclusion can be obtained.

The invention discloses an analog and digital mixed signal chip test card. A chip test circuit on the test card comprises a system interface module, a configuration chip, an FPGA processing module and a digital-to-analog conversion module; the system interface module is connected with the FPGA processing module through a bus; the FPGA processing module connected with the configuration chip is connected with an input end of the digital-to-analog conversion module through a digital signal output end, and is connected with a tested chip carrier through a control end; an output end of the digital-to-analog conversion module is connected with an analog signal input end of the tested chip carrier; and a digital signal output end of the tested chip carrier is connected with a digital signal input end of the FPGA processing module. The chip test card has reasonable design, has the characteristics of steady performance, quick test speed, high efficiency, flexible and convenient use and the like, and meets the test need of analog and digital mixed signal chips; in addition, the chip test card can also be matched with other types of test cards or functional boards so as to realize the test need of different types of chips.

This invention discloses multi-link testing devices and methods which can realize boundary scan. Including: PC module, boundary-scan test card and boundary scan card expansion card; described boundary-scan extended card composed by boundary scan expansion modules , used in a number of boundary-scan test link, through analytical sent from the PC port choice test configuration, boundary scan port expansion card on the number of boundary scan link together into a new boundary scan link , for testing. The invention through the boundary-scan test device provide to PC users easy-to-use interface, test vector generation and the analysis of test data, through PC hardware and procedures rapidly with good boundary-scan test and link extension, chains expansion is easy and convenient flexible scanning, reduced the frequency of chains replacement and increase test coverage and achieve program simple, economical and practical.

The invention discloses a kind of system and method to automatically measure radio-frequency identification system, the system comprises: control panel, virtual terminal and load server. The method includes: run multiple virtual terminals simultaneously according to the tested system architecture on the load server, supports a wide range of environment, automatically calculate service response time, repeat load scenes easily, verify if the application process adjustment have a favourable impact on the service performance. Test the whole structure of application system, analyze problems and gives out solutions to help optimize application performance of middleware and information networks, used for RFID-based enterprise MES, CRM, ERP systems, or public information service platform for the public to inquire information. The present invention provides an ideal means of authentication before put on line, the virtual terminal simplify the difficulties of testing, improve test efficiency, simplifies configuration process through typical scenes and typical user behavior, and achieve computer-aided decision-making through automatic analysis of test card.

The invention discloses a digital and analog mixed signal chip test card. A chip test circuit on the test card comprises an interface module, a configuration chip, an FPGA processing module and an analog-to-digital conversion module, the interface module is connected with the FPGA processing module through a bus, the FPGA processing module connected with the configuration chip is connected with the analog-to-digital conversion module and a tested chip carrier through a control end respectively, and is connected with the tested chip carrier through a digital signal output end, an analog signal output end of the tested chip carrier is connected with an input end of the analog-to-digital conversion module, a data clock signal and a state signal of the tested chip carrier are connected with the FPGA processing module respectively, a control end of the analog-to-digital conversion module is connected with the tested chip carrier, and an output end of the analog-to-digital conversion module is connected with a digital signal input end of the FPGA processing module. The test card has reasonable design, has the characteristics of steady performance, quick test speed, high efficiency, flexible and convenient use and the like, and realizes the test function for digital and analog mixed signal chips.

The invention provides an electric automobile vehicle controller test method and system, including: configuring an operation environment required by a model, and adding an I / O interface of the model; adding a vehicle controller model required by test and files corresponding with operation; adding and configuring hardware board cards required by test, and simulating load output signals based on test signal demands through pulling up or pulling down a resistor; configuring a CAN channel based on test demands; connecting I / O ports of software and hardware modules; and downloading compiling to form files required by test and perform test. In test, in dependence on test signal demands, and through pulling up or pulling down a resistor, a load output signal can be simulated, which requires no purchase of a load test card, reduces test cost, obtains a wider adjustable range of resistance values and allows a greater coverage rate of simulatable load output signals. Test contents can be compiled, so that data information of vehicles under specific conditions can be obtained; meanwhile, high voltage does not exist in test, which avoids potential safety hazards to a great extent.

The invention discloses a penetrance type filling test piece to test cam and using method, which is characterized by the following: setting the surface of the test piece as cell; arranging several concentric circles on the background; arranging digital scale on crosswise and diagonal direction; setting the center of positioning point as the center of concentric circle. This invention can finish above two optical experiments one time.

A radio diagnosis device for car faults includes: a host including a CPU, a supply module, a radio communication module, an input module, a display module, a test card and a printer, the diagnosis test box including a general interface circuit, a primary CPU, a slave CPU, a program storage, a data storage amd a radio communication module, in which, the host is separated with the box, which is connected with a special diagnosis base in communication, the host and the box communicate by the radio communication module to realize data exchange and transmission and the host touch screen inputs instructions to realize test to different kinds of cars and the color LCD displays the result.

The present invention discloses a display device definition testing card and the dynamic definition measuring method thereof. The testing card uses simple graphic combination such as a radial testing line, a round testing fiducial ring, and the like, and includes a testing center fiducial line, a testing symmetry marking line, a graphic fiducial center, a fan-shaped testing line group, a testing ficucial ring, and a testing graph boundary. The measuring method uses the rotation of the radial testing line of the testing card, and the adjustment and the change of the relevant parameter to realize and complete the test of the dynamic definition of the moving image on the display device. The measuring method can be used conveniently and rapidly, and the measurement result is actual and accurate.

An improved Flash memory device is described with a protection register lock bit erase enable circuit. A bond pad coupled to the lock bit erase enable circuit of the improved Flash memory is not bonded when the individual Flash memory chip wafer is packaged. This allows the memory manufacturer to access the bond pad and erase the lock bits while the chip is still in wafer form via a test card probe, but makes the lock bits effectively uneraseable when the chip wafer is packaged. This enables the memory chip manufacturer to enhance reliability and fault tolerance of the Flash memory device by thoroughly testing the lock bits and protection register functionality. Additionally, the lock bit erase enable circuit increases manufacturing flexibility by allowing the memory chip manufacturer to reprogram the protection register and lock bits in case of organizational changes or inadvertent or erroneous programming of the protection register.

A method of manufacturing a plurality of test strips is described where a web is formed containing conductive and base layers. A plurality of test strips are formed on the web by electrically isolating a first group of conductive components. Subsequently, a second group of conductive components are electrically isolated on the web by a different process. A test card for quality control analysis is also described, where the test card includes a plurality of attached test strip traces.

A disposable test card configured to accept a fluid sample for an assay, and a method of manufacturing same, is disclosed herein. In a general example embodiment, a test card for analysing a fluid sample includes a first substrate layer including an inlet port and an outlet port, a channel layer bonded to the first substrate layer, the channel layer including a microchannel placing the inlet port in fluid communication with the outlet port, and a second substrate layer bonded to the channel layer, the second substrate layer having electrodes printed adjacent to a target zone of the microchannel of the channel layer, wherein the electrodes are configured to raise the temperature of the fluid sample within the target zone of the microchannel when a current is applied thereto.

The invention discloses a POCT detection card transmission management system, which includes a manipulator mechanism, a manipulator displacement mechanism and a carrying tray mechanism for carrying POCT detection cards: the manipulator mechanism includes an upper manipulator arm and a lower manipulator arm that can be clamped or released; The manipulator shift mechanism includes a shift rod and a support rod. The manipulator mechanism is connected to the support rod, and moves up and down as the support rod moves left and right along the shift rod or up and down with the support rod; the carrying tray mechanism includes a POCT test card for carrying pallets and their supports. The invention has a manipulator that can move and grab automatically, so the manpower cost is saved and the working efficiency is improved.

A kind of overcurrent protection method of the wafer test card and the wafer test system which has the overcurrent protection component. The exist wafer test system has the problem that the high current is short of protecting because of the fault that the butt contact short or other fault. The overcurrent protection method of the wafer test card in this invention includes the following steps: provides a wafer test card, the said wafer test card has several probes, one end of the said probes connects a test machine by down-lead; an overcurrent protection component is connected in series between the said probe and the lead; makes the other end of the said probe contacts with one tested wafer to do wafer test. Uses the overcurrent protection method and wafer test system in this invention can avoid the high current destroying the wafer test card effectively, it can also shows the position of the fault fast, expressly, so it provides convenience to the subsequent work.

An improved apparatus and method for conducting and recording tests on a sample of urine. A large sample collection cup is provided with a testing compartment incorporated into the side of the cup. A small channel at the base of the cup allows urine to flow into the testing compartment immediately upon collection. A test card with pretreated reaction sites is provided inside the testing compartment. At least a portion of the sample interacts with the test card and the results of the test can be read through the front of the testing compartment. Abbreviations on the test card indicate which tests are being run. The front of the testing compartment is flat so the results of the test can be easily photocopied or scanned for record keeping purposes. Physical and electronic templates are also provided to aid in the documentation process.

The present invention provides a PCIE test card, including a control module, a bus arbiter, an indicating device, at least two PCIE pins having different specifications and at least PCIE bus having different specifications which is corresponding to the PCIE pins, PCIE pins are used for cuttage grafting PCIE slot of the mainboard corresponding specifications to be tested, the control module transmits data with the corresponding PCIE pins via the PCIE bus, the bus arbiter controls the control module and switches to the corresponding PCIE mode according to the specifications of PCIE slot of the PCIE pins cuttage grafting, the indicating device is electrically connected with the control module, used for showing the test whether passing or not. The PCIE test card gathers PCIE pins of different specifications, processing test by cottage grafting PCIE pins of different specifications, substituting for multiple PCIE test cards of different specifications, reducing the test cost.

A RF test interconnection system for connecting a measurement device to a device under test includes, a probe card having a probe extending from a first side of the card for making electrical contact with the device under test and a coaxial connector extending from a second side of the card, a test head having a test head coaxial connector that will mate with the probe card coaxial connector when the probe card and the test head are urged together, and a de-mating device attached to either the probe card or the test head for urging the probe card and the test head apart by applying a separating force therebetween. The probe card and the test card coaxial connectors are electrically connected when the test head and the probe card are urged together by a connection force and electrically disconnected when the connection force is removed.

An immunodiagnostic test card includes a plurality of transparent chambers wherein each chamber includes a quantity of testing material that combines with a patient sample, when mixed, to produce an agglutination reaction. A plurality of indicia are disposed to aid in the manufacture and determining the usability of the cards prior to test and also in objectively grading the agglutination reactions that are formed or lack of agglutination.

A logic analyzer having internal access to the test buses, clocks and events of a chip is used to debug the chip. The logic analyzer is designed with the capability to share existing memory in the chip during the debug process. Additionally, the configuration of the logic analyzer and observation of the acquired results in the shared memory can be accessed through normal control interfaces of the chip and does not require special test cards. The logic analyzer includes a clocking function, a trigger function, a signal multiplexer, and a memory block. The clocking function is configured to select as the sample clock for the function any of the clocks in the integrated circuit. In addition, the clocking function may provide a means to decimate these clocks by some factor to sample over larger intervals.