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System for automatically testing parameters of quartz crystal oscillator

An automatic test system, quartz crystal technology, applied in electronic circuit testing, measurement using digital measurement technology, frequency measurement device, etc., can solve the problems of large overall structure, expensive equipment and complicated use

Inactive Publication Date: 2010-05-26
天津必利优科技发展有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These instruments are very expensive
Moreover, a separate instrument is used for measurement, and the overall composition is huge and complicated to use.

Method used

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  • System for automatically testing parameters of quartz crystal oscillator
  • System for automatically testing parameters of quartz crystal oscillator
  • System for automatically testing parameters of quartz crystal oscillator

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Embodiment Construction

[0025] The automatic testing system for the parameters of the quartz crystal oscillator of the present invention will be described in detail below in conjunction with the accompanying drawings of the embodiments.

[0026] The quartz crystal oscillator parameter automatic testing system of the present invention is composed of an upper computer and a parameter test card connected with the main board of the upper computer. Described upper computer can adopt computer, and described parameter test card has integrated the function of instrument equipment such as frequency counter, digital voltmeter, digital oscilloscope, is inserted on the PCI socket of computer motherboard, through control program to quartz crystal oscillator The operating frequency, operating current and start-up time are tested, and the test results are automatically saved.

[0027] Such as figure 1 As shown, the parameter test card includes: a single-chip microcomputer U1 and a test circuit A and a reference ci...

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Abstract

The invention discloses a system for automatically testing the parameters of a quartz crystal oscillator, which comprises a master computer and a parameter test card connected with the main board of the master computer, wherein the parameter test card comprises a singlechip and a test circuit and a reference circuit which are connected with the singlechip respectively. The singlechip has a D / A module, an A / D module, a first counter, a second counter and a timer. The test circuit comprises a current amplification circuit, a voltage sampling resistor, a frequency dividing circuit, a first measurement gate control circuit and the crystal oscillator to be measured. The reference circuit comprises a reference frequency source, a frequency multiplication circuit, a second measurement gate control circuit and a frequency dividing and high-frequency signal latch circuit. In the invention, the test card integrates the functions of all apparatuses such as a frequency counter, a digital voltmeter and a digital oscillometer and can be directly inserted in the main board of the computer, and the fully automatic test of various parameters, such as working frequency, working current and start up time, of the quartz crystal oscillator can be realized by a control program.

Description

technical field [0001] The present invention relates to one. In particular, it relates to an automatic test system for parameters of the quartz crystal oscillator which is used for fully automatic testing of the operating frequency, operating current and start-up time of the quartz crystal oscillator. Background technique [0002] The main basic characteristic parameters of the quartz crystal oscillator are operating frequency, operating current and start-up time. Generally, the operating frequency is measured with a frequency counter, the operating current is measured with a digital voltmeter, and the start-up time is measured with a digital oscilloscope. In addition, two program-controlled power supplies are required to provide voltage. The prices of these instruments and equipment are very expensive. Moreover, a separate instrument is used for measurement, and the overall composition is huge and complicated to use. Contents of the invention [0003] The technical pro...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R19/25G01R23/10
Inventor 刘贵枝李建平董维来杨红永
Owner 天津必利优科技发展有限公司
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