Dynamic allocation method for on-line programming of integrated circuit tester

Abstract

The invention discloses a dynamic allocation method for on-line programming of an integrated circuit tester. A microprocessor directly acquires a command from a NorFlash and executes the command by setting a boot flash selection pin in a lower computer when a testing program error occurs, so as to wait for downloading of the testing program for integrated circuit testing. Under the normal conditions, the testing task can be conducted by directly copying data in a NandFlash to an external SDRAM (Synchronous Dynamic random access memory) and operating the data; and in the testing process, the microprocessor automatically stores the downloaded testing program into the NandFlash to overwrite the existing testing program if receiving the testing program transmitted from an upper computer, and then automatically reboots the testing program to conduct testing according to the new testing program. Therefore, dynamic testing environment allocation can be achieved rapidly according to the requirements of users without switching memories. Meanwhile, the lower computer of the integrated circuit tester can be operated independently from the upper computer so as to achieve rapid testing and dynamic allocation.

Description

technical field [0001] The invention belongs to the technical field of online programming, and more specifically relates to a dynamic configuration method for online programming of an integrated circuit tester. Background technique [0002] 1. Testing of integrated circuits [0003] It has been nearly 60 years since TI Corporation of the United States announced that it has developed the world's first IC chip. With the development of integrated circuit technology and its industry, it has promoted high and new technologies such as computer technology, software technology, communication technology, and information technology, providing a good foundation for the development and modernization of various industries in the national economy. Nowadays, integrated circuit products are more and more widely used in social life, such as communication equipment, aerospace, defense equipment, industrial manufacturing, digital products and even various household appliances and toys. Integr...

AI Technical Summary

Problems solved by technology

[0014] The method (1) cannot realize online programming, and the update of the test program is troublesome, which can no longer meet the actual needs of the current integrated circuit tester

Although the method (2) can realize online programming, the first method must use special download software every time the program is downloaded, and the program currently running needs to be stopped when downloading the program, so it does not meet the requirements of integrated circuit testing. The demand for dynamic configuration of the online programming instrument; the second type of method is obviously cumbersome because the user may change the test program frequently, and it is necessary to manually switch and select the memory each time when downloading.

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