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140 results about "Electrical resistance meter" patented technology

Overview. Electrical resistance meters can be thought of as similar to the Ohmmeters used to test electrical circuits. Archaeological features can be mapped when they are of higher or lower resistivity than their surroundings.

Digital display tape measuring device

A digital display tape measuring device is disclosed having a display screen exteriorly for displaying the measured distance. A tape having electrical conductivity capabilities and an insulator disposed longitudinally along the tape dividing the tape into two electrical conductors, and having a tip thereof electrically connecting both of the electrical conductors together such that an electrical circuit is formed with resistance that varies as the tape is extracted from device. An ohmmeter electrically coupled across the electrical circuit for measuring the circuit resistance. A microprocessor having inputs thereof coupled to outputs of the ohmmeter and having outputs coupled to said display screen. The microprocessor computes measurements made by as a function of the resistance measured by the ohmmeter.
Owner:WEEKS PEGGY

A resistance-type nitrogen dioxide gas sensor, and an apparatus manufactured with the sensor

The invention discloses a resistance-type nitrogen dioxide gas sensor, and an apparatus manufactured with the sensor. The sensor comprises a gas-sensitive material layer with tungsten oxide as a main gas-sensitive material, and gold conductive electrode plates arranged with an interdigitated structure, wherein the gold conductive electrode plates contact the gas-sensitive material layer. The conductive electrode plates are printed on an alumina planar medium substrate. The back side of the medium substrate is provided with a platinum heating resistor. The sensor is arranged on a pedestal with a small hole. A cap with a ventilating central hole is covered on the pedestal. Platinum conductors are respectively led out from the platinum heating resistor and the interdigitated gold conductive electrodes. The conductors led out from the platinum heating resistor are connected with a heating controlling circuit, and the conductors led out from the interdigitated gold conductive electrodes are connected with a resistance calculating circuit. The apparatus provided by the invention has a simple structure, and employs a novel gas-sensitive material. With the apparatus, an accuracy of nitrogen dioxide volume concentration detection can be improved to a PPB (parts per billion) grade. The apparatus has advantages of good gas selectivity and short reaction time.
Owner:刘震国

Estimation of temperature states for an electric water heater from inferred resistance measurement

A water heater that includes a cylindrical storage tank and at least one heating element, is modeled using a one-dimensional model that includes: a vertical stack of disks representing the water volume in the cylindrical storage tank, and a stack of annular segments surrounding the vertical stack of disks. Various temperature measurements are determined via resistance calculations of the at least one heating element. The stack of annular segments represents the cylindrical wall of the cylindrical storage tank. The one-dimensional model may be used by a condition-based maintenance system comprising an electronic data processing device configured to detect a failure mode present in the water heater based on an output of the water heating model component. Some illustrative failure modes include insulation disturbance, heating element failure, excessive sediment buildup, or a drip tube rupture.
Owner:BATTELLE MEMORIAL INST

An acceleration method for resistance calculation mesh division

Owing to the development of the ultra-deep submicron technology, simple parameters can no longer describe the characteristics of interconnection lines. The rapid and accurate extraction of the parasitic parameters (the resistance, the inductance, the capacitance and the electric conductance) of the interconnection lines is of great importance for the successful design of high performance chips. The invention provides a rapid resistance extraction method. By using the technology of graphic cutting and the technology of graphic reuse, the speed of resistance extraction is increased, so that the problem that resistance extraction costs much time because of the complexity of a layout is solved; by using the triangulation finite element method, the accuracy of resistance extraction is better guaranteed.
Owner:北京华大九天科技股份有限公司

Ohm voltage drop automatic compensation rapid scanning circuit based on solution resistance measurement

The invention discloses an ohm voltage drop automatic compensation rapid scanning circuit based on solution resistance measurement. The circuit comprises a potentiostat, a current/voltage conversion circuit, a digital potentiometer, an amplifying circuit, a first electronic switch, a second electronic switch, a solution resistance measuring circuit and a microcontroller. The microcontroller controls the switching-on of the first electronic switch and the second electronic switch; a solution resistance measuring circuit measures and obtains equivalent resistance in an electrochemical cell; thesolution resistance measuring circuit transmits the obtained equivalent resistance to the microcontroller; the microcontroller calculates a tap coefficient of the digital potentiometer based on the equivalent resistance of the solution; a tap position of the digital potentiometer is adjusted according to the tap coefficient, so the digital potentiometer outputs a feedback voltage signal matched with the tap coefficient; the potentiostat superposes the feedback voltage signal and the scanning voltage signal and then acts on the electrochemical cell, and therefore, the ohmic voltage drop automatic compensation is realized. The circuit has the advantages of no overcompensation problem and higher accuracy on the basis of simplicity and convenience in operation.
Owner:NINGBO UNIV

Resistance calculation method for conducting material with equal-thickness irregular shapes

The invention provides a resistance calculation method for a conducting material with equal-thickness irregular shapes. The method comprises the following steps of (1) determining any two points on a wire as a first detection point and a second detection point; (2) determining the shortest route between the first detection point and the second detection point in the current direction, wherein the shortest route comprises a plurality of line sections; (3) calculating the resistance of each line section, and adding the resistance of each line section up to obtain the total resistance of the conducting material, wherein the method for calculating the resistance of each line section comprises the following steps of determining the length of each line section as L, dividing each line section into n equal parts, and obtaining the length, t, of each equal part of each line section to be L / n; drawing straight lines perpendicular to each line section at n equally divided points respectively, determining the length, L1, L2, L3, ...Ln, between two intersection points which are formed due to the intersection of the straight lines and the outer contour line of the conducting material, and calculating the total resistance of each line section according to a formula. By the resistance calculation method for conducting materials with equal-thickness irregular shapes, the resistance between any two initial-final points on the wire can be calculated, and an absolute resistance within the wire can be calculated.
Owner:TRULY SEMICON

Internal resistance detection system and method based on weighting compensation degree factor

The invention discloses a storage battery internal resistance detection system and method based on a weighting compensation degree factor. According to the invention, through an internal resistance detection module, sine voltage excitation signals, storage battery temperature parameters, and discharging current parameters are acquired, processed through a signal conditioning circuit and then sentto an MSP430 single-chip microcomputer to carry out data processing. By use of above acquired parameters, the internal resistance initial value and a weighting compensation degree factor of the storage battery are calculated, so the finally corrected internal resistance value of the storage battery is calculated. The beneficial effects are that through software and hardware circuits, precision isimproved; and through a hardware filtering circuit, by improving an internal resistance calculation algorithm, and comprehensively considering effect weights of the parameters to the battery internalresistance, compensation of misalignment of the internal resistance is achieved.
Owner:广州邦禾检测技术有限公司

Flexible direct-current power transmission system MMC sub-modules key element synchronous online monitoring method

The invention relates to a flexible direct-current power transmission system MMC sub-modules key element synchronous online monitoring method. The method comprises the following steps that: S1, an MMC-HVDC system is constructed; S2, sensors are configured to acquire bridge arm voltage, bridge arm current and sub-module capacitor voltage; S3, a sub-module IGBT, diode and capacitor on-line monitoring mathematical model is constructed; S4, IGBT on-state voltage bias, diode on-state voltage bias, diode on-state resistance and a capacitor capacitance value are obtained online through a Kalman filtering algorithm; S5, estimated IGBT on-state voltage is calculated according to the IGBT on-state voltage bias and IGBT on-state resistance, and on-state voltage and on-state resistance are calculated;and S6, the obtained IGBT on-state voltage, the diode on-state voltage, the diode on-state resistance and the capacitor capacitance value are compared with set parameter threshold values, and aging identification and residual life estimation are carried out on sub-modules. With the method of the invention adopted, the synchronous on-line monitoring of semiconductor devices and capacitors in a monitoring MMC can be realized.
Owner:FUZHOU UNIV

Method for calculating induced current of metal sheath of cable under multi-phase and multi-point grounding

ActiveCN108761167ASolve the dilemma of the magnitude of the induced currentCurrent/voltage measurementElectrical resistance and conductanceThree-phase
The invention discloses a method for calculating the induced current of a metal sheath of a cable under multi-phase and multi-point grounding, which comprises the steps of S1, calculating and measuring the resistance R and reactance X of the metal sheath of the cable, the grounding resistance R1 and R2 at two ends of the cable and the earth leakage resistance Re; S2, calculating the length proportions [alpha]i, [beta]j and [gamma]t of each small section to the total line, and measuring fault grounding resistance Rki, Rgj and Rft; S3, calculating the metal sheath reactance Zki, Zgj and Zft of each section of the branches of the three-phase cable, and calculating circuit induced electromotive forces Uki, Ugj and Uft, which are generated by wire core current of the three-phase cable, of eachsection; S5, calculating induced electromotive forces Uki', Ugj' and Uft', which are generated by circulating current in the sheath of the three-phase cable, of each section; and S6, calculating induced current Iki, Igj and Ift of each section of the branches of the three-phase cable. The induced current value on each section of the cable under the multi-phase and multi-point grounding condition can be conveniently calculated according to the invention.
Owner:SOUTH CHINA UNIV OF TECH

Air quality sensors and methods of monitoring air quality

An air quality sensor includes a detector element array, a processor operatively connected to the detector element array, and a memory. The memory is disposed in communication with the processor and has instructions recorded on the memory that, when read by the processor, cause the processor to execute certain operations including measuring electrical resistance of one of more detector element of the detector element array. A difference is calculated between the measured resistance and a reference resistance, and a determination is made of presence or absence of a contaminant in air communicated to the detector element array from an atmosphere of an aircraft cabin based on the difference between the measured resistance and the reference resistance. Aircraft and methods of monitoring air quality also described.
Owner:HAMILTON SUNDSTRAND CORP

Graphene temperature strain sensor

The application relates to a Graphene temperature strain sensor; the first strain resistance grids and second strain resistance grids in the graphene sensor are the same in shape and are alternately and symmetrically arranged, and the ratio of the resistance temperature coefficients of the first strain resistance grids and the second strain resistance grids is not equal to the ratio of the resistance strain coefficients of the first strain resistance grids and the second strain resistance grids. Real-time voltage of the first strain resistance grid and the second strain resistance grid is output to the detection circuit through a signal output circuit composed of four electrodes. The detection circuit can detect a first voltage across the two ends of the first strain resistance grid and asecond voltage across the two ends of the second strain resistance grid, calculate a first real-time resistance and a second real-time resistance according to the first voltage and the second voltage,and finally calculate the temperature and strain of the object to be detected according to the first real-time resistance and the second real-time resistance. Therefore, the graphene temperature strain sensor provided by the invention can realize accurate measurement of temperature and strain on the premise of not needing any temperature or strain compensation element, and can realize effective simplification of a circuit.
Owner:北京石墨烯技术研究院有限公司

Method and system for detecting rationality of power-on time sequence of PG pin, and related components

The invention discloses a method for detecting rationality of a power-on time sequence of a PG pin. The method comprises the following steps: acquiring a pull-up level of the PG pin of a VR chip; determining the value of a pull-up resistor of the PG pin as a first resistance value when the current value of the pull-up level injected into the VR chip is equal to the maximum withstand current of theVR chip; acquiring equivalent resistance to ground when the PG pin is at a low level, and calculating a value of a pull-up resistor of the PG pin as a second resistance value based on the equivalentresistance to ground when the output voltage of the PG pin is equal to a preset interference voltage limit value; and when it is judged that the actual resistance value of the pull-up resistor is lower than the first resistance value or the second resistance value, outputting first prompt information. By means of the scheme, whether the power-on time sequence of the PG pin in the VR chip is reasonable or not can be determined, and misoperation of a subsequent circuit is avoided. The invention also provides a system for detecting the rationality of the power-on time sequence of the PG pin and arelated assembly. The system and the assembly have corresponding effects.
Owner:SUZHOU LANGCHAO INTELLIGENT TECH CO LTD

Aerospace current-carrying slip ring temperature rise modeling method based on multi-physics field coupling

The invention relates to an aerospace current-carrying slip ring temperature rise modeling method based on multi-physics field coupling, and belongs to the technical field of conductive friction pairs. The method comprises the following steps: firstly, calculating a theoretical contact region of a brush contact and a confluence disc, and calculating contact resistance and contact resistance heat of the brush contact and the confluence disc based on conductive spots; in addition, the resistance Joule heat is calculated based on the resistance of the bus plate, and the friction heat between the sliding contact and the bus plate is further calculated. and finally, the total heat generated by the contact resistance heat, the confluence disc resistance Joule heat and the friction heat is synthesized, the heat dissipation rate is calculated through heat radiation, and the heat dissipation rate and the generated heat reach dynamic balance to calculate the steady-state temperature. Compared with a previous experimental measurement method, the method has the advantages that the coupling relation among a thermal field, a force field and an electric field is explored, modeling is performed on a temperature rise mechanism of the current-carrying slip ring for spaceflight, and factors influencing the temperature of the current-carrying slip ring are analyzed, so that the method has the advantages of saving a large amount of funds and time and improving the working reliability of the satellite current-carrying slip ring.
Owner:TONGJI UNIV

Method for testing resistivity of silicon carbide buffer layer

The invention belongs to the technical field of epitaxial growth of silicon carbide, and provides a method for testing resistivity of a silicon carbide buffer layer. The method comprises the followingsteps: measuring the thickness of a silicon carbide substrate at a preset position of the silicon carbide substrate so as to obtain a first thickness; separately measuring the thickness and the resistance of a silicon carbide wafer at a position identical with the preset position so as to obtain a second thickness and a square resistance, wherein the silicon carbide wafer is a sample obtained bygrowing a buffer layer on the silicon carbide substrate; and calculating the resistivity of the buffer layer according to the thickness of the silicon carbide substrate, and the thickness and the square resistance of the silicon carbide wafer. Thus, the resistivity of the buffer layer can be quickly and accurately obtained. The method for testing the resistivity of the silicon carbide buffer layerhas the advantages of free of damage, easiness, rapidness and high accuracy.
Owner:HEBEI POSHING ELECTRONICS TECH
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