Resistance calculation method for conducting material with equal-thickness irregular shapes

Abstract

The invention provides a resistance calculation method for a conducting material with equal-thickness irregular shapes. The method comprises the following steps of (1) determining any two points on a wire as a first detection point and a second detection point; (2) determining the shortest route between the first detection point and the second detection point in the current direction, wherein the shortest route comprises a plurality of line sections; (3) calculating the resistance of each line section, and adding the resistance of each line section up to obtain the total resistance of the conducting material, wherein the method for calculating the resistance of each line section comprises the following steps of determining the length of each line section as L, dividing each line section into n equal parts, and obtaining the length, t, of each equal part of each line section to be L / n; drawing straight lines perpendicular to each line section at n equally divided points respectively, determining the length, L1, L2, L3, ...Ln, between two intersection points which are formed due to the intersection of the straight lines and the outer contour line of the conducting material, and calculating the total resistance of each line section according to a formula. By the resistance calculation method for conducting materials with equal-thickness irregular shapes, the resistance between any two initial-final points on the wire can be calculated, and an absolute resistance within the wire can be calculated.

Description

technical field [0001] The invention relates to the field of electric power, in particular to a method for calculating the resistance of conductive materials with equal thickness and irregular shapes. Background technique [0002] In the wiring design of LCD screens, touch screens, OLED screens, etc., it is often necessary to simulate and calculate the resistance of the wiring to evaluate the performance of the product. Often these wirings are irregular patterns, which cannot be calculated with simple resistance calculation formulas and require special calculations. method calculation. [0003] In the prior art, CN102004825A discloses a method for optimizing the calculation of the resistance value of the conductive film layer inside the liquid crystal display, specifically: the area of ​​the conductive film layer is divided into several rectangular shapes ignoring the triangular shape, and each rectangular shape is then determined by Composed of N square-shaped square elect...

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Problems solved by technology

But there is following defective in this method: (1) refer to figure 1 , only regular ITO traces can be calculated, and the two sides of the traces to be tested must be parallel, otherwise it cannot be calculated. In fact, the traces are irregular or circular in many cases, and this method cannot be calculated; (2) This method can only calculate the starting point to the end point of the trace, and cannot calculate the resistance between any two points on the trace; (3) This method is not an accurate algorithm, it is only used to calculate the relative resistance, and is used to evaluate multiple wires. Difference in resistance between traces, not used for absolute resistance calculations

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