A measuring device and a measuring method for dynamic contact resistors of conductive devices are disclosed. The invention provides a special-purpose measuring device for accurately measuring dynamic and static contact resistors which are applied to conductive devices in a variety of models in the aviation and aerospace field. The measuring device comprises a liquid crystal display, an industrial control computer system, a multipath micro resistor measurement unit, a switch control module, a keyboard, a mouse, a system power supply, a test connection cable, conductive devices to be measured and the like. According to the invention, dynamic and static contact resistors between conducting rods and electric brushes of conductive devices in a variety of models such as 96 rings, 76 rings, 60 rings, 54 rings and the like can be accurately measured, parameters such as the measuring ring number, the measuring mode, the measuring number of times and the like of the conductive devices can be set, and functions such as automatic sampling, storage, processing of measured data, and report generation, historical data query and the like are achieved.