Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An acceleration method for resistance calculation mesh division

A technology of resistance and triangulation, which is applied in calculation, image analysis, electrical digital data processing, etc., can solve the problems of complex pattern body, increase the difficulty and time of resistance extraction, etc.

Inactive Publication Date: 2016-07-27
北京华大九天科技股份有限公司
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] As the layout becomes larger and more complex, various shapes and more vias and layers increase the difficulty and time of resistor extraction

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An acceleration method for resistance calculation mesh division
  • An acceleration method for resistance calculation mesh division
  • An acceleration method for resistance calculation mesh division

Examples

Experimental program
Comparison scheme
Effect test

example

[0016] Combined with a specific example method, the operation process steps are as follows:

[0017] 1) Open a layout;

[0018] 2) Determine the rectangular frame of the graph and divide it into mxn parts;

[0019] 3) Take the intersection graph between the published graph and each grid in (2), and record the adjacent edges.

[0020] 4) Perform interpolation operation on each adjacent edge.

[0021] 5) Triangulate the graphics obtained in 3, and judge whether the graphics can be reused before dividing. If possible, directly copy the triangulation of the existing graphics and perform displacement.

[0022] 6) Merge the triangulations of all graphs for resistance calculations.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Owing to the development of the ultra-deep submicron technology, simple parameters can no longer describe the characteristics of interconnection lines. The rapid and accurate extraction of the parasitic parameters (the resistance, the inductance, the capacitance and the electric conductance) of the interconnection lines is of great importance for the successful design of high performance chips. The invention provides a rapid resistance extraction method. By using the technology of graphic cutting and the technology of graphic reuse, the speed of resistance extraction is increased, so that the problem that resistance extraction costs much time because of the complexity of a layout is solved; by using the triangulation finite element method, the accuracy of resistance extraction is better guaranteed.

Description

technical field [0001] The grid division acceleration method for resistance calculation is an acceleration method for calculating resistance in layout parameter extraction, and the invention belongs to the field of EDA design. Background technique [0002] Today, with the rapid development of information technology, flat panel display (FPD) has become another pillar industry of the world's electronic information industry. Especially in China, FPD technology has developed rapidly in recent years. With the development of FPD process technology, the design size is increasing day by day, and the design requirements are also increasing day by day. As an important stage in the overall design, the layout design of FPD is directly related to the overall performance of FPD. In layout design, accurate calculation of parasitic resistance is of great significance to successful design. The emergence of various complex graphics in the layout puts forward higher requirements for the acc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50G06T7/00
Inventor 闫海霞陆涛涛李相启
Owner 北京华大九天科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products