38results about How to "Reduce accumulation time" patented technology

Disclosed is a method of recovering 1,3 -butadiene from a C4 stream containing butane, isobutane, 2-butene, 1-butene, isobutene, butadiene and acetylene. The process of recovering highly pure 1,3 -butadiene includes acetylene conversion for selectively converting acetylene through liquid-phase hydrogenation, so that the acetylene content is decreased to 70 wt ppm or less, and 1,3 -butadiene extraction using an extractive distillation column, a pre-separator, a solvent stripping column, a solvent recovery column, and a purification column. Through the acetylene conversion, the concentration of vinylacetylene is decreased to 70 wt ppm or less, after which 1,3-butadiene is recovered using only one extractive distillation column, thereby considerably decreasing the degree of utility and the loss of streams in the course of extraction. The number of units necessary for the process is decreased, thus remarkably reducing the time during which impurities can accumulate in a processing unit.

A spectrophotometer, in which an emission spectrum of the light source is measured. Based on the measured emission spectrum, a threshold is set to allow only an outstanding spectral intensity in a specific wavelength region to be greater than the threshold. Then, a ratio between the setup threshold and a peak spectral intensity in the specific wavelength region greater than the threshold is calculated. Then, an electric-charge accumulation time for a light-receiving element corresponding to a wavelength region equal to or less than the threshold is set at an upper limit of electric-charge accumulation time causing no saturation in any light-receiving element. Based on the ratio between the threshold and the peak spectral intensity in the specific wavelength region greater than the threshold, an electric-charge accumulation time for the light-receiving element corresponding to the specific wavelength region greater than the threshold is set.

Techniques are described herein which minimize the impact of virtual machine snapshots on the performance virtual machines and hypervisors. In the context of a volume snapshot which may involve (i) taking virtual machine snapshots of all virtual machines associated with the volume, (ii) taking the volume snapshot, and (iii) removing all the virtual machine snapshots, the virtual machine snapshots may be created in a first order and removed in a second order. Specifically, snapshots for busy virtual machines (i.e., virtual machines with higher disk write activity) may be created last and removed first. Consequently, snapshots of busy virtual machines are retained for the shorter periods of time, thereby minimizing the effect of virtual machine snapshots on those virtual machines (and their associated hypervisors) that would be most negatively impacted by virtual machine snapshots.

The present invention relates to a method of testing catalysts and catalyst systems via a plurality of stations in which each station can accommodate a common reactor module in order to accomplish unattended, automated, rapid serial experimentation. The method includes the steps of: providing within a purged chamber a storage station of pre-loaded catalyst reactors, a hydrocarbon reaction station, one or more additional pre-treatment and / or post-treatment stations in series with said hydrocarbon reaction station, and a robotic means for moving catalyst reactors within the purged chamber between stations, pre-treating the pre-loaded catalyst reactor with a treatment gas in the post-treatment station, reacting the pre-loaded catalyst reactor with a hydrocarbon reactant in the hydrocarbon reaction station, post-treating the pre-loaded catalyst reactor with a treatment gas in the post-treatment station, and repeating the foregoing steps such that the pre-treating, reacting and post-treating steps occur simultaneously for two different pre-loaded catalyst reactors. The advantages of the present invention include improved accuracy, reproducibility and quality of test data generated, increased testing throughput rate, providing for automated unattended operation of the device, providing for the ability the ability to program a variety of sequences and settings, providing for the combination of a variety of processes (pre-treatment, HC reaction testing, post-treatment, aging, and characterization), and providing for higher temperature operation. The method finds application in laboratory test environments, and in particular in high throughput testing environments.

The invention provides a back lighting type photodiode receiving chip and a manufacturing method thereof. The chip comprises an epitaxial layer, the epitaxial layer comprises a P-shaped table face, an N-shaped table face and an indium phosphide substrate; the P-shaped table face comprises an InGaAs absorbing layer, an InGaAsP gradient layer, a reflective mirror layer, an indium phosphide top layer and an InGaAs contact layer; the N-shaped table face comprises an indium phosphide buffer layer; the indium phosphide buffer layer, the InGaAs absorbing layer, the InGaAsP gradient layer, the reflective mirror layer, the indium phosphide top layer and the InGaAs contact layer are grown on the indium phosphide substrate in sequence; an integrated micro lens is arranged at one side of the indium phosphide substrate, and the integrated micro lens and the indium phosphide buffer layer are at the different sides of the indium phosphide substrate. According to the back lighting type photodiode receiving chip and a manufacturing method, on the condition of guaranteeing that chip diffused source area keeps constant, the light absorption area of the chip is expanded, the problem of low coupling efficiency caused by small chip diffused source area is solved, and through the addition of the reflective mirror layer, the quantum efficiency of the chip can be improved.

The invention relates to a reclamation method for a sunk paddy field caused by mining in mountainous regions and belongs to the technical field of improvement and utilization of environment, ecology and damaged fields. The method includes: performing topsoil stripping to fissured positions where fissures are created by mining sinking and lead to water leakage of the paddy field; covering water holding materials on fissured areas after topsoil stripping; compacting the covered water holding materials, pouring slurry and standing; performing topsoil backfilling and grinding to the fissured areas after slurry pouring and standing, and flattening to enable the fissured areas to be a whole with pieces of the paddy field around the fissured areas; and irrigating, nourishing and improving the paddy field after backfilling and grinding. By the method, the cultivation land where the fissures are created by mining sinking and lead to water leakage of the paddy field can restore the paddy field utilization mode and reach production level of a normal paddy field as soon as possible, a stable self-maintaining farmland ecological system can be formed, a paddy field protecting system can be formed, soil microbial content can be increased, physicochemical property of soil can be improved, and benign farmland ecological system circulation can be formed.

A four-line CCD sensor is structured by line sensors R, G, B in which color filters are respectively disposed on surfaces of light receiving elements, and a line sensor BK at which no color filter is disposed. Amplitudes of signals which are outputted from the line sensors R, G, B at a time of reading a color document, and an amplitude of a signal which is outputted from the line sensor BK at a time of reading a monochrome document are adjusted so as to be substantially equal to one another. In a case in which a color document is read, outputs of the line sensors R, G, B are selectively provided, and in a case in which a monochrome document is read, output of the line sensor BK is selectively provided.

The invention discloses an accumulated pulse profile time delay measurement method by sparse representation, and aims to mainly solve the problem that the sampling frequency and signal to noise ratio of pulse profiles can affect measurement accuracy in the prior art. The method is realized by the steps of: (1) conducting standard pulse profile sampling, and constructing a waveform matching redundant dictionary; (2) employing a greedy optimization algorithm to calculate a first-order sparse coefficient vector of the measurement pulse profile under the waveform matching redundant dictionary; and (3) according to the column corresponding to the only nonzero element in the first-order sparse coefficient vector, calculating the accumulated pulse profile time delay. Compared with the prior art, the method provided in the invention significantly reduces computation, improves the measurement precision of time delay, shortens the pulse profile accumulation time, and can be used for measurement of the time difference of arrival (TDOA) of the pulse from a spacecraft to a solar system barycenter.

The invention relates to a frequency domain coherent joint capture method of a GNSS data / pilot mixed signal, more particularly to a coherent joint capture method of a GNSS data / pilot mixed signal. According to a traditional single-channel capture method, energies of a new-system navigation signal can not fully utilized, so that capture performance is poor; however, the above-mentioned problem canbe solved according to the invention. The method comprises the following steps that: with utilization of a phase relationship between a data channel signal and a pilot channel signal, coherent processing is carried out on the signals of the two channels aiming at a GNSS data / pilot mixed signal, and then capture is completed. The invention is suitable for application in a capture process of a GNSSdata / pilot mixed signal.

The invention discloses a computer integrated manufacturing system and a manufacturing method thereof. The system at least comprises an automatic delivery system, a material management system and a bench. The automatic delivery system obtains a ratio of the number of produced semi-finished products to the corresponding number of semi-finished products; the automatic delivery system obtains product information with a smallest ratio and generates a control instruction based on the product information; and the automatic delivery system controls the material management system to deliver a carrier corresponding to the production information to the bench based on the control instruction. Therefore, the emergency carrier can be dispatched to the bench quickly and thus the cargo stacking time can be reduced; and thus the benefits of the enterprise can be increased.