296 results about "Metastability" patented technology

The invention relates to an apparatus and process for solid-state deposition and consolidation of powder particles entrained in a subsonic or sonic gas jet onto the surface of an object. Under high velocity impact and thermal plastic deformation, the powder particles adhesively bond to the substrate and cohesively bond together to form consolidated materials with metallurgical bonds. The powder particles and optionally the surface of the object are heated to a temperature that reduces yield strength and permits plastic deformation at low flow stress levels during high velocity impact, but which is not so high as to melt the powder particles.

A new class of light or reactive elements and monophase α′-matrix magnesium- and aluminum-based alloys with superior engineering properties, for the latter being based on a homogeneous solute distribution or a corrosion-resistant and metallic shiny surface withstanding aqueous and saline environments and resulting from the control during synthesis of atomic structure over microstructure to net shape of the final product, said α′-matrix being retained upon conversion into a cast or wrought form. The manufacture of the materials relies on the control of deposition temperature and in-vacuum consolidation during vapor deposition, on maximized heat transfer or casting pressure during all-liquid processing and on controlled friction and shock power during solid state alloying using a mechanical milling technique. The alloy synthesis is followed by extrusion, rolling, forging, drawing and superplastic forming for which the conditions of mechanical working, thermal exposure and time to transfer corresponding metastable α′-matrix phases and microstructure into product form depend on thermal stability and transformation behavior at higher temperatures of said light alloy as well as on the defects inherent to a specific alloy synthesis employed. Alloying additions to the resulting α′-monophase matrix include 0.1 to 40 wt. % metalloids or light rare earth or early transition or simple or heavy rare earth metals or a combination thereof. The eventually more complex light alloys are designed to retain the low density and to improve damage tolerance of corresponding base metals and may include an artificial aging upon thermomechanical processing with or without solid solution heat and quench and annealing treatment for a controlled volume fraction and size of solid state precipitates to reinforce alloy film, layer or bulk and resulting surface qualities. Novel processes are employed to spur production and productivity for the new materials.

A circuit design that contains at least two clock domains is simulated using a novel system and method for injecting the effects of metastability. The system includes detectors for detecting, during simulation, when a clock in a transmit clock domain and a clock in a receive clock domain are aligned and when the input of a register receiving a clock-domain-crossing signal is changing. The system includes coverage monitors for measuring, during simulation, statistics related to metastability injection. The system accurately models the effects of metastability by, at appropriate times during simulation, pseudo-randomly inverting outputs of registers receiving clock-domain-crossing signals. By accurately modeling the effects of metastability, errors in the circuit design can be detected while simulating a pre-existing simulation test. The simulation with metastability effects injection is repeatable and requires no modification of pre-existing RTL design files or simulation test files.

Systems and methods of generating ions at atmospheric pressure are presented. These systems and methods include spatially dependent analysis of a sample using an effusive ionization source. Systems and methods of isolating samples at atmospheric pressure are presented. These systems and methods include using a barrier to prevent metastables or electrons from an effusive ion source from reaching a sample unless the sample is in an analysis position. Systems and methods of using metastables in collisionally induced dissociation are presented.

A correcting asynchronous Successive-Approximation Register (SAR) analog-to-digital converter (ADC) detects and corrects metastability errors. An analog signal is synchronously sampled by a system clock, but data bits are converted asynchronously. A valid detector compares true and complement outputs of a comparator that compares the sampled voltage to a DAC voltage generated from digital test value from the SAR. Once the true and complement outputs diverge past logic thresholds, the valid detector activates a VALID signal indicating that comparison is completed. The compare result is then latched in as a data bit and the SAR advances to the next test value. Once all bits have been converted, an End-of-Conversion (EOC) is signaled. If the EOC does not occur by the end of the system clock, a metastability error is detected. The current bit that never finished comparison is forced high and all other unconverted bits are forced low.

A random number generator includes a ring oscillator having an EX-OR gate and four inverters together forming a loop. This loop enters stable state for a start signal having the low level and oscillates for the start signal having the high level. When the start signal has a pulse of a width shorter than the loop's delay time, output nodes responsively, sequentially enter metastable state hovering between the high and low levels. The metastable waveform becomes smaller with time and finally disappears. As metastable state cannot be controlled in longevity, it disappears at any random number node. A counter thus outputs a signal serving as true random number data depending on the longevity of the metastable state. A random number generator miniaturized and having reduced power consumption, and of high performance can thus be implemented.

A computer program (100, 200) encoded in a computer-programmable medium, and for causing a computer to perform circuit design. The code causes the computer to perform a set of steps. The steps comprise describing a first set of circuitry and describing a second set of circuitry. The steps also comprise describing a digital signal for passing from the first set of circuitry to the second set of circuitry and detecting (230) transitions of the digital signal with respect to a timing constraint (240) of at least a portion of the second set of circuitry. Lastly, the steps comprise, responsive to detecting metastability with respect to timing of a transition of the digital signal relative to the timing constraint of at least a portion of the second set of circuitry, forcing (160) the digital signal to a random value and passing the random value to the second set of circuitry.

A first stage circuit for a pipeline ADC first stage combines the functions of an input sample-and-hold-plus-amplifier (SHA) stage, and the functions of the first analog-to-digital conversion stage of an ADC, including a multiplying DAC (MDAC), stage-flash ADC (SFADC) comparators, and residue opamp (RAMP). The ADC first stage is duplicated, inputs and outputs are connected, and an autozero circuit using a switched-capacitor filter feedback loop controls the RAMP bias circuitry to reduce 1 / f noise and DC offsets. The sampling capacitors may be connected to the ADC input for one full sample clock time period and are disconnected from the analog input period before connecting the sampling capacitors to an amplifier voltage output or voltage reference, thereby sampling the input and allowing sufficient time for the SFADC comparators to resolve and control the MDAC capacitor settings with a low metastability error rate.

A clock signal selector circuit is disclosed including a synchronizer circuit, two switching circuits, and a multiplexer. The synchronizer circuit synchronizes a first control signal to a first clock signal, thereby producing a second control signal. A first switching circuit produces the first clock signal at a first node when the second control signal is asserted. The multiplexer drives a second node with a signal at the first node when the second control signal is asserted. The second switching circuit forms an electrical connection between the first and second nodes when the second control signal is deasserted. The two switching circuits significantly reduce a probability of error at the second node due to metastability when the second control signal transitions from asserted to deasserted and the first clock signal is deselected. The second switching circuit provides electrical feedback from the second node to the first node.

Apparatus and methods for clock domain crossing between a first clock domain and a second clock domain. The apparatus comprises a first control logic element for processing a handshake signal and producing a first arbiter input signal. Concurrently a second control logic element processes a second handshake signal and produces a second arbiter input signal. Exemplary embodiments include exactly one arbiter element inputting the first arbiter input signal, inputting the second arbiter input signal, outputting a first clocking signal to the first sequential element and outputting a second clocking signal to the second sequential element. For managing metastability by controlling the timing of the clocking inputs of the sequential devices, the apparatus includes a first controllable lock delay element selected to satisfy the setup constraint of the second sequential element, and a second controllable lock delay element selected to satisfy the hold constraint of the second sequential element.

A system and method for modeling metastability decay through latches in an integrated circuit model are provided. With the system and method, asynchronous clock boundaries are identified in the integrated circuit model and latches in a receive clock domain are enumerated. Latches within a range of the asynchronous clock boundary are selected for transformation. These latches are transformed into metastability decay latches using new latch primitive logic that models the decay of an indeterminate value. The metastability decay latches maintains an indeterminate value during a metastability time period and achieve a randomly selected logic value at the end of the metastability time period. The transformed integrated circuit model may then be simulated and the results analyzed to generate reports of the integrated circuit model's operation. The transformed integrate circuit model more accurately represents the actual operation of the hardware implementation of the integrated circuit model.

A method, apparatus and computer program product are provided for facilitating combinatorial logic modeling at an asynchronous clock domain crossing. The modeling technique employs a simulation value of X in combinatorial logic at the asynchronous clock domain crossing of a circuit being modeled to facilitate modeling of a potential combinatorial logic glitch at the crossing during metastability periods thereof. Employing the simulation value of X includes: generating one or more equivalent functional equations for one or more combinatorial paths through the combinatorial logic at the crossing; propagating the simulation value of X through the combinatorial logic using the at least one equivalent functional equation; and then converting the simulation value of X at an output of the combinatorial logic of the asynchronous clock domain crossing to a random logic value for further propagation within the circuit being modeled.

Mechanisms for modeling metastability decay through latches in an integrated circuit model are provided. Asynchronous clock boundaries are identified in the integrated circuit model and latches in a receive clock domain are enumerated. Latches within a range of the asynchronous clock boundary are selected for transformation. These latches are transformed into metastability decay latches using new latch primitive logic that models the decay of an indeterminate value. The metastability decay latches maintains an indeterminate value during a metastability time period and achieve a randomly selected logic value at the end of the metastability time period. The transformed integrated circuit model may then be simulated and the results analyzed to generate reports of the integrated circuit model's operation. The transformed integrate circuit model more accurately represents the actual operation of the hardware implementation of the integrated circuit model.