The invention discloses a multiple-workpiece ion beam polishing system and method. The multiple-workpiece ion beam polishing system comprises a vacuum chamber. A required ion source, a clamp and a movement mechanism are arranged in the vacuum chamber. The ion source generates an ion beam, the clamp is used for clamping workpieces, and the movement mechanism is used for conducting machining control. The multiple workpieces are clamped on the clamp at the same time. According to the multiple-workpiece ion beam polishing system and method, the multiple-workpiece clamp is adopted, the multiple workpieces are clamped at one time, and therefore the time, required by vacuum pumping and debugging of a single workpiece, of a machine is omitted, machining of the multiple surfaces can be conducted onthe multiple workpieces at the same time, the machining time and the machining cost are greatly saved, and the machining efficiency is greatly improved. According to the multiple-workpiece ion beam polishing method, the multiple-station clamp is arranged in the polishing system, the multiple workpieces can be simultaneously clamped to be machined at the same time, and therefore the production efficiency of the machine is further improved. In addition, the distances between the multiple workpieces are judged, an appropriate machining method is adopted, and therefore the purpose of polishing the workpieces on the same clamp at the same time can be achieved.