The invention relates to a method and a device for testing the tensile strength of an axial lead of a glass shell
diode, in particular to a method and a device for testing a glass shell
diode, belonging to the technical field of electronic element testing and aiming at solving the problem that the
controllability of tension and temperature change range can not be simultaneously satisfied in the
tensile testing process of the glass shell
diode in the prior art. The invention mainly comprises the device and the method for testing the tensile strength of the axial lead of the glass shell diode, wherein the device comprises a hot air
source system, an axial lead tension application
system and a
forward voltage measuring
system. The operations of tensile application and removal, current application,
voltage measurement, and the like of the axial lead are carried out outside a high-temperature cabinet. A cabinet door of the high-temperature cabinet is unnecessary to be opened in the whole testing process of
forward voltage drop of the diode under the tension and
temperature control conditions, thereby ensuring the stability of the
environmental temperature inside the cabinet, not influencing the
environmental temperature (150 DEG C) of the diode and satisfying the requirements that the
environmental temperature of the diode is within 150+ / -5 DEG C.