46 results about "Scanning electrochemical microscopy" patented technology

Sensors and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided. The sensors include a cantilever and one or more probes, each of which has an electrode at its tip. The tips of the probes are sharp, with a radius of curvature of less than about 50 nm. In addition, the probes have a high aspect ratio of more than about 19:1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.

A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.

A method of controlling a scanning electrochemical microscopy probe tip comprising the following steps: oscillating the scanning electrochemical microscopy probe tip relative to the surface of interest; moving the oscillating scanning electrochemical microscopy probe tip towards the surface of interest; detecting damping of an amplitude of the oscillation of the scanning electrochemical microscopy probe tip resulting from the scanning electrochemical microscopy probe tip coming into contact with the surface of interest at the first location; using the detected damping to detect the surface of interest; retracting the scanning electrochemical microscopy probe tip away from the surface of interest without first translating the scanning electrochemical microscopy probe tip along the surface of interest while the scanning electrochemical microscopy probe tip is in intermittent contact with the surface of interest. The method further comprises measuring electrochemical signals produced at the oscillating scanning electrochemical microscopy probe tip while moving the oscillating scanning electrochemical microscopy probe tip towards and / or away from the surface of interest.

A method for characterizing the morphology of hydrogel micropore arrays. The hydrogel material selected first is polyethylene glycol dimethacrylate, and photomask method and template method are used to prepare The polyethylene glycol dimethacrylate hydrogel microwell array; then prepare the scanning electrochemical microscope probe and build the scanning electrochemical microscope detection system; finally apply the scanning electrochemical microscope to detect the polyethylene glycol dimethacrylate in the aqueous solution In situ characterization process of ester hydrogel microporous array morphology. In the present invention, the natural electron pair oxygen in the aqueous solution is used as the reducing pair, and the morphology of the polyethylene glycol dimethacrylate hydrogel micropore array in the aqueous solution is characterized in situ by using scanning electrochemical microscopy technology, and the water The two-dimensional pore size and three-dimensional shape information on the surface of the gel micropore array has the advantages of in-situ, reversible and non-destructive characterization of the sample in aqueous solution and gives the three-dimensional shape information of the hydrogel material.

The invention discloses a scanning electrochemical microscope, comprising: a three-dimensional ball screw scanner, a three-dimensional piezoelectric scanner, a conductive probe, a conductive base, a working platform and a micro-control unit. The three-dimensional ball screw scanner includes X The adjustment axis, the Y adjustment axis and the Z adjustment axis; the X adjustment axis, the Y adjustment axis and the Z adjustment axis are arranged perpendicular to each other, the X adjustment axis is arranged on the working platform, and the three-dimensional piezoelectric scanner is arranged on the Z adjustment axis On the shaft, the scanning electrochemical microscope of this scheme integrates a ball screw scanner with high stability, a piezoelectric scanner, a conductive probe, a conductive base and a micro-control unit, and the piezoelectric scanning is performed by the ball screw scanner. The scanning range and linearity of the detector are corrected, avoiding the use of precision distance testing instruments or standard samples, and has the advantages of simple operation and low cost.

The invention provides a method for preparing a working electrode of a scanning electrochemical microscope. The method for preparing the working electrode of the scanning electrochemical microscope is characterized in that by utilizing the characteristics of non-polarity and low melting point of paraffin, paraffin is used for manufacturing a paraffin mould with the inner diameter equal to the outer diameter of the working electrode in a pouring mode according to the size of standard the working electrode of the scanning electrochemical microscope provided by a manufacture factory; a sample to be tested is put in the center of the paraffin mould; a prepared liquid epoxy resin solution is poured into a gap between the paraffin mould and the sample to be tested; after an insulation layer material solution is solidified, namely insulation layer materials and the sample to be tested are melted into a whole, the sample to be tested with the insulation layer materials is pulled out, the operations of coarse grinding, fine grinding and fine polishing are carried out on the sample to be tested, the sample to be tested is cleaned with acetone and anhydrous ethanol and then is dried, and the working electrode of the scanning electrochemical microscope is obtained. Through the method for preparing the working electrode of the scanning electrochemical microscope, the working electrode which is the same as the standard electrode of the scanning electrochemical microscope in shape, size and dimension is prepared simply and rapidly.