589 results about "Atomic force microscopy" patented technology

The magnetic recording medium comprises a magnetic layer comprising a ferromagnetic powder and a binder on a nonmagnetic support. In the magnetic recording medium, a number of protrusions equal to or greater than 10 nm in height on the magnetic layer surface, as measured by an atomic force microscope, ranges from 50 to 500 / 1,600 μm2, the binder comprises a polyurethane resin with a weight average molecular weight ranging from 100,000 to 200,000, and the magnetic layer further comprises a carbonic ester having a molecular weight ranging from 360 to 460.

An apparatus and method for performing nucleic acid (DNA and / or RNA) sequencing on a single molecule. The genetic sequence information is obtained by probing through a DNA or RNA molecule base by base at nanometer scale as though looking through a strip of movie film. This DNA sequencing nanotechnology has the theoretical capability of performing DNA sequencing at a maximal rate of about 1,000,000 bases per second. This enhanced performance is made possible by a series of innovations including: novel applications of a fine-tuned nanometer gap for passage of a single DNA or RNA molecule; thin layer microfluidics for sample loading and delivery; and programmable electric fields for precise control of DNA or RNA movement. Detection methods include nanoelectrode-gated tunneling current measurements, dielectric molecular characterization, and atomic force microscopy / electrostatic force microscopy (AFM / EFM) probing for nanoscale reading of the nucleic acid sequences.

The invention provides a liquid cell for an atomic force microscope. The liquid cell includes a liquid cell housing with an internal cavity to contain a fluid, a plurality of conductive feedthroughs traversing the liquid cell housing between the internal cavity and a dry side of the liquid cell, a cantilevered probe coupled to the liquid cell housing, and a piezoelectric drive element disposed on the cantilevered probe. The cantilevered probe is actuated when a drive voltage is applied to the piezoelectric drive element through at least one of the conductive feedthroughs. A method of imaging an object in a liquid medium and a method of sensing a target species with the liquid cell are also disclosed.

Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.

A harmonic cantilever for use in a tapping-mode atomic force microscope includes a cantilever arm and a probe tip. The cantilever arm has a shape selected to tune the fundamental resonance frequency or a resonance frequency of a selected higher order mode so that the fundamental and higher-order resonance frequencies have an integer ratio or near integer ratio. In one embodiment, the cantilever arm can be shaped to tune the fundamental resonance frequency. Alternately, the cantilever arm can include a geometric feature for tuning the resonance frequency of the fundamental mode or the selected higher order mode. An imaging method using the harmonic cantilever is disclosed whereby signals at the higher harmonics are measured to determine the material properties of a sample. In other embodiment, a cantilever includes a probe tip positioned at a location of minimum displacement of unwanted harmonics for suppressing signals associated with the unwanted harmonics.

An approach is presented for designing the polymeric recording layer for nanometer scale thermomechanical storage devices. Cross linked polymers are used as the recording layers in atomic force microscopy data storage devices, giving significantly improved performance when compared to the previously reported linear polymers. This results in superior wear resistance and enhanced erasing, critical features for the long-term multiple read-write cycles of such thermomechanical storage devices. In addition, this ability to introduce a predetermined extent of cross linking allows fine tuning of the thermal and force parameters in the R / W / E (read-write-erase) cycles.

A cantilever for the use in atomic force microscopy includes a cantilever arm having a fixed end being attached to a base member and a free end where the cantilever arm has a first shape and an axis of torsion associated with the first shape, and a probe tip projecting from the cantilever arm near the free end where the probe tip is positioned in an offset displacement from the axis of torsion. Alternately, the cantilever arm has a first shape selected to tune a torsional resonance frequency of a selected torsional mode or the fundamental flexural resonance frequency of the fundamental mode so that the torsional resonance frequency and the fundamental flexural resonance frequency has an integer ratio. In this manner, the torsional motion of the torsional harmonic cantilever at that harmonic frequency will be largely enhanced by the corresponding torsional resonance.

This invention provides a method of depositing high-quality Si or SiGe epitaxial layers on SiGe substrates. By first depositing a thin Si seed layer on the SiGe substrate, the quality of the seed layer and of the subsequently deposited layers is greatly improved over what is obtained from depositing SiGe directly onto the SiGe substrate. Indeed, whereas the RMS surface roughness of the deposition of SiGe directly on SiGe, as measured by atomic-force microscopy (AFM), was 3-4 nm, it was more than an order of magnitude better when a thin Si seed layer was employed. This work was performed on an ultra-high-vacuum chemical vapor deposition (UHV / CVD) system; however, the same method would apply to other deposition systems such as atmospheric-pressure, low-pressure and rapid-thermal CVD.

Smooth silicon films having low compressive stress and smooth tensile silicon films are deposited by plasma enhanced chemical vapor deposition (PECVD) using a process gas comprising a silicon-containing precursor (e.g., silane), argon, and a second gas, such as helium, hydrogen, or a combination of helium and hydrogen. Doped smooth silicon films and smooth silicon germanium films can be obtained by adding a source of dopant or a germanium-containing precursor to the process gas. In some embodiments dual frequency plasma comprising high frequency (HF) and low frequency (LF) components is used during deposition, resulting in improved film roughness. The films are characterized by roughness (Ra) of less than about 7 Å, such as less than about 5 Å as measured by atomic force microscopy (AFM), and a compressive stress of less than about 500 MPa in absolute value. In some embodiments smooth tensile silicon films are obtained.

A perpendicular magnetic recording medium, comprising:(a) a non-magnetic substrate having a surface; and(b) a layer stack formed over the substrate surface, comprising in overlying sequence from the substrate surface:(i) a magnetically soft underlayer;(ii) an interlayer structure for crystallographically orienting a layer of a perpendicular magnetic recording material formed thereon; and(iii) at least one crystallographically oriented magnetically hard perpendicular recording layer;wherein the magnetically soft underlayer is sputter-deposited at a sufficiently large target-to-substrate spacing and at a sufficiently low gas pressure selected to provide the underlayer with a smooth surface having a low average surface roughness Ra below about 0.3 nm, as measured by Atomic Force Microscopy (AFM).

Sensors and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided. The sensors include a cantilever and one or more probes, each of which has an electrode at its tip. The tips of the probes are sharp, with a radius of curvature of less than about 50 nm. In addition, the probes have a high aspect ratio of more than about 19:1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.

An atomic force microscopy (AFM) nanoprobe comprising a nanocone base and a nanoprobe tip wherein the length to base diameter aspect ratio is at least 3 or more. The AFM nanoprobe tip structure comprises an orientation-controlled (vertical or inclined), high-aspect-ratio nanocone structure without catalyst particles, with a tip radius of curvature of at most 20 nm.

An improved method is provided for performing nanomanipulations using an atomic force microscope. The method includes: performing a nanomanipulation operation on a sample surface using an atomic force microscope; determining force data for forces that are being applied to the tip of the cantilever during the nanomanipulation operation, where the force data is derived along at least two perpendicularly arranged axis; and updating a model which represents the topography of the sample surface using the force data.

A method of scanning probe microscopy includes using a cantilever having a planar body, generally opposed first and second ends, and a tip disposed generally adjacent the second end and extending downwardly towards a surface of a sample. Preferably, the sample is disposed on a support surface. The method includes directing a beam of light onto the second end in a direction substantially parallel to the support surface. In operation, the second end directs the beam towards a detector apparatus at a particular angle. Then, the method monitors a change in the angle of deflection of the beam of light caused by deflection of the cantilever as the cantilever tip traverses the surface of the sample, the change being indicative of a characteristic of the surface. Preferably, the second end includes a flat reflective surface, with the flat reflective surface being generally non-planar with respect to the planar body of the cantilever. In addition, the flat reflective surface comprises a mirror fixed to the second end, while in another embodiment, the flat reflective surface is microfabricated integrally with the cantilever.

A cantilever for the use in atomic force microscopy includes a cantilever arm having a fixed end being attached to a base member and a free end where the cantilever arm has a first shape and an axis of torsion associated with the first shape, and a probe tip projecting from the cantilever arm near the free end where the probe tip is positioned in an offset displacement from the axis of torsion. Alternately, the cantilever arm has a first shape selected to tune a torsional resonance frequency of a selected torsional mode or the fundamental flexural resonance frequency of the fundamental mode so that the torsional resonance frequency and the fundamental flexural resonance frequency has an integer ratio. In this manner, the torsional motion of the torsional harmonic cantilever at that harmonic frequency will be largely enhanced by the corresponding torsional resonance.

The invention relates to a non-aperture tip enhanced Raman scattering probe and a manufacturing method thereof, belonging to the field of near-field Raman spectroscopy detection technology. The non-aperture tip enhanced Raman scattering probe is characterized in that the surface of the traditional Raman scattering probe is provided with 3-20 tiny tips, the diameter of the tiny tips is 5-25 nm, and the curvature radius of the tiny tips is 2-15 nm. In the invention, a scanning probe microscopy / atomic force microscopy (SPM / AFM) probe with a noble metal film layer is selected, a carbon layer is deposited on the noble metal film layer, and excess carbon layers are removed by washing after the impact of an argon ion beam. The manufactured non-aperture tip enhanced Raman scattering probe has great application potential in the fields of trace analysis, qualitative detection even single-molecule detection and the like.

A scanning probe microscope detects or induces changes in a probe-sample interaction. In imaging mode, the probe 54 is brought into a contact distance of the sample 12 and the strength of the interaction measured as the probe 54 and sample surface are scanned relative to each other. Image collection is rapidly performed by carrying out a relative translation of the sample 12 and probe 54 whilst one or other is oscillated at or near its resonant frequency. In a preferred embodiment the interaction is monitored by means of capacitance developed at an interface between a metallic probe and the sample. In lithographic mode, an atomic force microscope is adapted to write information to a sample surface.

A method for determining properties of a sample surface using an atomic force microscope includes applying a first voltage between the sample and a probe, moving the probe towards the surface of the sample, and stopping movement of the probe towards the surface of the sample when current in the probe is initially detected. An oscillating magnetic field is applied to the probe such that the probe obtains stable contact with the surface of the sample.

An improvement for atomic force microscopes, more generally for light beam detecting systems, but also in part applicable to scanning probe microscopes, providing significant novel features and advantages. Particular features include using different objective lens regions for incident and reflected light, a flexure that allows three dimensional motion of the optics block, forming the housing and optics block of a composite material or ceramic, arranging the components so that the beam never hits a flat surface at normal incidence, and providing a resonant frequency of cantilever vibration greater than 850 HZ between the cantilever and sample and the cantilever and focusing lens.

The invention relates to a characterization method of an atomic force microscope for a micro-pore structure of a reservoir rock core. The method comprises the following steps of: (1) preparing for a characterization sample to ensure that a reservoir rock sample adapts to the characterization of an atomic force microscope; (2) reconstructing a characterization apparatus to ensure that the atomic force microscope adapt to a characterization reservoir rock sample; and (3) analyzing the data of a characterization image, and analyzing the characterization image to obtain useful information to guide production practice. By using the method, the characterization method of the micro-pore structure of the rock can be more complete and accurate so that the characteristics of a nano-grade structure and a micron-grade structure of a reservoir stratum can be indicated three-dimensionally and clearly, and the method has important scientific and economic significances in evaluating reserves of an oil-gas field or the characteristics of the rock micro-pore structure of the oil-gas field to increase the yield of the oil-gas field.

The invention relates to an electrochemical polishing method for the high purity aluminium under ultrasonic agitation, which belongs to the fields of the material chemistry and the electrochemistry. The electrochemical polishing method under the ultrasonic agitation comprises the following steps: high purity aluminium foil is added in absolute ethyl alcohol, so as to be cleaned with deionized water and through ultrasonic oscillations, and the natural oxide film in sodium hydroxide is removed; the aluminium foil after being pretreated is used as an anode, the platinum sheet is used as the cathode, the reference electrode is saturated calomel electrode, and the electropolishing solution is the mixed liquor composed of absolute ethyl alcohol and perchloric acid; the electrolysis vessel is positioned in an ultrasonic wave cleaner, and electrochemical polishing is performed on a constant potential rectifier. The self-organizing structure with nanoscale stripe shape is formed on the aluminium surface, the structure is observed by adopting the atomic force microscopy, and the size of the stripe-shaped nanostructure changes under the ultrasonic agitation; the composition of the polishing surface is analyzed through the Raman spectrum and the X-ray diffraction, so as to indicate that the composition of the polishing surface is amorphous aluminum oxide.

Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information using contact resonance with multiple excitation signals are also described.

A modular AFM / SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM / SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and / or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available.

Various microscopy probes and methods of fabricating the same are provided. In one aspect, a method of fabricating a microscopy probe is provided that includes providing a member and forming a first film on the member. The first film fosters growth of carbon nanotubes when exposed to a carbon-containing compound. A second film is formed on the first film. The second film has an opening therein that exposes a portion of the first film. A carbon nanotube is formed on the exposed portion of the first film.

A full metal probe and a method of making the metal probe for electrical atomic force microscopy. In one embodiment, the method comprises manufacturing the full metal probe using two lithography steps. The step of etching thin membranes is dropped or eliminated to substantially reduce the processing time. Thus, topside processing is sufficient. The probe and tip can be peeled off from the wafer using a metallization procedure.

An atomic force microscope (AFM) tip is used to selectively produce surface enhanced Raman scattering (SERS) for localized Raman spectroscopy. Spectra of thin films, undetectable with a Raman microprobe spectrometer alone, are readily acquired in contact with a suitably gold-coated AFM tip. Similarly, an AFM tip is used to remove sample layers at the nanometer scale and subsequently serve as a SERS substrate for ultra-trace analysis. This demonstrates the interface of an AFM with a Raman spectrometer that provides increases sensitivity, selectivity and spatial resolution over a conventional Raman microprobe. An AFM guiding the SERS effect has the potential for targeted single molecule spectroscopy.

The invention relates to a device for detecting the roundness of an arc of a tool tip of a diamond tool with an arc edge, which belongs to the technical field of the detection of the roundness of thearc of the tool tip of the diamond tool. The device can solve the problem that the existing device for detecting the roundness of the arc of the tool tip of the diamond tool with the arc edge has theshortcomings of low detection precision and inability of meeting the requirement for the high-precision measurement of the roundness of the arc of the tool tip. The device consists of an atomic forcemicroscopy system, a single-chip microcomputer controller, a measurement control computer, a two-dimensional precision displacement workbench and a rotary shaft system, wherein the rotary shaft systemis arranged on the two-dimensional precision displacement workbench, the measurement control computer is used for displaying detection data and outputting a control signal to the single-chip microcomputer controller for controlling the rotation of the rotary shaft system, the relative position of the rotary shaft system and a scanning probe of the atomic force microscopy system is regulated through the two-dimensional precision displacement workbench, and the signal detected by the scanning probe is transferred from the controller in the atomic force microscopy system to the control computerfor monitoring. The device is used for detecting the roundness of the arc of the tool tip of the diamond tool.