The invention discloses an atomic force
microscope and a test method of a sample surface property. The atomic force
microscope comprises a
signal generator, a probe component, Z-direction piezoelectric ceramics, a
laser generator, a photoelectric
detector, a displacement coarse adjustment unit, a controller, and a sample stage. The probe component comprises a probe and an excitation module. The probe includes a
cantilever beam and a needle tip located at a first end of the
cantilever beam. The excitation module is connected to a
signal generator, is used for receiving an
excitation signal anddrives the probe to deflect at a first direction under the effect of the
excitation signal. The excitation module is a non-
laser photothermal excitation module. In the technical scheme of the invention, a vibration frequency of the probe is greatly increased so as to effectively speed up a speed when the surface property to be tested is tested by using a non-resonant tapping mode, and shorten testtime of the same surface to be tested.