34 results about "Atomic force acoustic microscopy" patented technology

A surface shape of a member to be measured is measured by reflecting measuring light at a reflection surface of a probe and utilizing an atomic force exerting between the probe and utilizing an atomic force exerting between the probe and the member to be measured. In addition to a first scanner for driving the probe, a second scanner for moving a focus position of an optical system is provided. Position conversion data representing a correlation between amounts of control of the first scanner and the second scanner are obtained in advance. By synchronously driving the first scanner and the second scanner, the focus position of the optical system is caused to follow the probe to improve measurement accuracy.

An electrical scanning probe microscope (SPM) apparatus. The SPM apparatus is equipped with an atomic force microscope with an infrared laser source, a position-sensitive photo-detector (PSPD) to provide a topographic image, a charge-coupled device (CCD) monitor for optical alignment, and an electrical scanning sensor operatively coupled to the atomic force microscope to acquire synchronous two-dimensional electrical images. The photoperturbation effects induced by stray light and perturbation of the contrast of SCM images can thus be ameliorated.

This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.

The present invention provides microcoaxial probes fabricated from semiconductor heterostructures that include strained semiconductor bilayers. The microcoaxial probes are well suited for use as scanning probes in scanning probe microscopy, including scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning microwave microscopy, or a combination thereof.

The invention relates to a fiber-based atomic force microscope probe and an atomic force microscope system. The fiber-based atomic force microscope probe comprises a probe pin and a micro cantilever beam; and the probe pin is arranged at one end of the micro cantilever beam arranged at one end of a fiber. A fiber F-P cavity is formed between the micro cantilever beam and one end surface of the fiber by a connecting arm. And the micro cantilever beam is used for sensing a change of a distance between the probe pin and a sample. When the length of the F-P cavity changes due to deformation of the micro cantilever beam, the reflected light intensity is modulated by the fiber F-P cavity.

The invention relates to the technical field of nanometer operation, particularly to an AFM probe rapid positioning method for cell mechanical property detection. The method includes recognizing cells through carrying out a Hough transform round detection mode in cell edge images, obtaining radiuses and central position information of each cell to be detected simultaneously, and calculating the actual distance between each cell to be detected and a probe cantilever beam in working space; determining the relative position relation between the probe tip and cells to be detected through rapid local scanning of cells to be detected; and sequentially achieving rapid positioning of the AFM probe to measuring points of cells to be detected to complete measurement of the mechanical property of each cell. According to the rapid positioning method, a visual image processing technology is used for calibrating the relative position relation between the cells to be detected and the probe cantilever beam in the working space, programming control from probe motion to cells to be detected can be achieved, and the operating efficiency of the probe is improved; and the rapid local scanning method is used, so that accurate calibration of the AFM tip and the cell relative positions is achieved, and the accuracy of cell mechanical property measurement is improved.

A probe (22) for an atomic force microscope is adapted such that, as a sample (14) is scanned, it experiences a biasing force Fdirect urging the probe towards the sample. This improves probe trackingof the sample surface and faster scans are possible. This is achieved by either including a biasing element (24, 50), which is responsive to an externally applied force, on the probe (22) and / or reducing the quality factor of a supporting beam. The biasing element may, for example, be a magnet (24) or an electrically-conducting element (50). The quality factor may be reduced by coating the beamwith a mechanical-energy dissipating material.