Atomic force microscope measuring device

Abstract

Atomic force microscope measuring device comprising a micro-cantilever and an intensity modulated laser exciting the cantilever, wherein the measuring device comprises an optical microscope, in particular a fluorescence microscope, a confocal microscope, a fluorescence energy transfer (FRET) microscope, a DIC and / or phase contrast microscope, all of those in particular construed as an inverted microscope.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application is a 371 National Stage application of International Application No. PCT / EP2015 / 000349 tiled on Feb. 17, 2015, which claims priority of European Patent (EP) application Serial Number 14000560.4 filed on Feb. 17, 2014 and European Patent (EP) application Serial Number 14004244.1 filed on Dec. 16, 2014, all of which are incorporated herein by reference in their entireties.BACKGROUND OF THE INVENTION[0002]Field of the Invention[0003]The invention relates to an atomic force microscope measuring device comprising a micro-cantilever and an intensity modulated light source exciting the cantilever.[0004]Description of the Prior Art[0005]The invention proposed herein is based on Atomic Force Microscopy technology. It allows to determine topography, physical, chemical and biological properties of biological systems such as single cells, tissues, single molecules, protein crystal structures, over time and in physiological relevant e...

AI Technical Summary

Benefits of technology

The invention described in the patent allows for the simultaneous tracking of the topography, physical, chemical, and biological properties of biological systems and their functional state using a combination of techniques such as photo thermal excitation, optical microscopy, and spectroscopy. The device can adjust the position, diameter, and focus of the exiting light spot on the cantilever for maximum excitation efficiency. The size of the light spot is important, as it needs to be small enough to excite the cantilever with high efficiency while also keeping the laser far from the biological system to avoid interactions with the sample. This invention enables the extraction and correlation of the most accurate information from biological systems.

Problems solved by technology

Although there are Atomic Force Microscopes (AFM) that oscillate the cantilever by photothermal excitation, those systems are not compatible with modem optical techniques such as DIC, fluorescence microscopy, etc.

In addition, the device described herein does not use a laser to induce effects of near field optics such as the excitation of plasmons but to deflect the cantilever over time.

However, this second laser is not compulsory and other systems can be applied such as piezoelectric cantilevers, piezoresistive cantilevers, Doppler interferometers, etc.

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