Atomic force microscope (AFM) probe rapid positioning method for cell mechanical property detection
A technology of mechanical characteristics and positioning method, applied in the field of nanometer operation, can solve problems such as inability to meet measurement requirements, low efficiency, time-consuming, etc., and achieve the effect of improving probe operation efficiency, improving accuracy, and achieving accurate calibration
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[0028] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0029] Fast local scanning algorithm: the probe tip is located under the cantilever beam, and its real position cannot be observed. Optical images can only be used to identify the relative positional relationship between the probe cantilever beam and the cell. The relative positional relationship between the needle tip and the cell.
[0030] Such as figure 1 As shown, the specific process of performing partial scanning is: the actual cell center can be determined by two lines - a horizontal scanning line and a vertical scanning line. Using the actual distance between the cell and the probe cantilever, position the probe to the left of the cell, and then scan the cell along the horizontal direction, we can get two intersection points between the horizontal scanning line L and the edge of the cell P and Q, then the vertical scan line V can be ...
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