Probe for an atomic force microscope

Abstract

A probe (22) for an atomic force microscope is adapted such that, as a sample (14) is scanned, it experiences a biasing force Fdirect urging the probe towards the sample. This improves probe trackingof the sample surface and faster scans are possible. This is achieved by either including a biasing element (24, 50), which is responsive to an externally applied force, on the probe (22) and / or reducing the quality factor of a supporting beam. The biasing element may, for example, be a magnet (24) or an electrically-conducting element (50). The quality factor may be reduced by coating the beamwith a mechanical-energy dissipating material.

Description

Technical field [0001] The present invention relates to the field of atomic force microscopes, probes used in such microscopes, and methods of operating such microscopes. In particular, it relates to an atomic force microscope that does not utilize conventional feedback control of the probe height. Background technique [0002] The atomic force microscope (AFM) or scanning force microscope (SFM) was invented in 1986 by Binnig, Quat, and Gerber. Like all other scanning probe microscopes, AFM is based on the principle of mechanically scanning nanoprobes over the sample surface in order to obtain an "interaction profile" of the sample. The interaction force in this case is only the molecular interaction between the sample and the tip of the sharp probe attached to the cantilever spring. When the probe tip begins to approach the sample in close proximity, the cantilever bends in response to the interaction force. Images are collected by scanning the sample relative to the probe an...

AI Technical Summary

Problems solved by technology

if τ res > f r , then obviously the interaction force cannot be accurately measured from one pixel to another

Images