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4291 results about "Microscope objective" patented technology

Several objective lenses on a microscope. In optical engineering, the objective is the optical element that gathers light from the object being observed and focuses the light rays to produce a real image. Objectives can be a single lens or mirror, or combinations of several optical elements.

Auto-focusing method and device

An auto-focusing method and device are presented for determining an in-focus position of a sample supported on a substrate plate made of a material transparent with respect to incident electromagnetic radiation. The method utilizes an optical system capable of directing incident electromagnetic radiation towards the sample and collecting reflections of the incident electromagnetic radiation that are to be detected. A focal plane of an objective lens arrangement is located at a predetermined distance from a surface of the substrate, which is opposite to the sample-supporting surface of the substrate. A continuous displacement of the focal plane relative to the substrate along the optical axis of the objective lens arrangement is provided, while concurrently directing the incident radiation towards the sample through the objective lens arrangement to thereby focus the incident radiation to a location at the focal plane of the objective lens arrangement. Reflected components of the electromagnetic radiation to a location objective lens arrangement are continuously detected. The detected reflected components are characterized by a first intensity peak corresponding to an in-focus position of said opposite surface of the substrate, and a second intensity peak spaced in time from the first intensity peak and corresponding to an in-focus position of said sample-supporting surface of the substrate. This technique enables imaging of the sample when in the in-focus position of the sample-supporting surface of the substrate.
Owner:YEDA RES & DEV CO LTD

Method and apparatus for three-dimensional microscopy with enhanced resolution

A method and apparatus for three dimensional optical microscopy is disclosed which employs dual opposing objective lenses about a sample and extended incoherent illumination to provide enhanced depth or Z.Iadd.-.Iaddend.direction resolution. In a first embodiment, observed light from both objective lenses are brought into coincidence on an image detector and caused to interfere thereon by optical path length adjustment. In a second embodiment, illuminating light from an extended incoherent light source is detected to the sample through both objective lenses and caused to interfere with a section of the sample by adjusting optical path lengths. Observed light from one objective lens is then recorded. In a third embodiment, which combines the first two embodiments, illuminating light from an extended incoherent light source is directed to the sample through both objective lenses and caused to interfere within a section of the sample by adjusting optical path lengths. The observed light from both lenses is caused to interfere on the image detector by the same optical path length adjustment. .Iadd.In a fourth embodiment of the invention, further spatial structure is introduced into the illumination light. Computational processing is used to enhance lateral or XY resolution as well as depth or Z resolution..Iaddend.
Owner:RGT UNIV OF CALIFORNIA

Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging

ActiveUS20110134436A1Less sensitive to reflectionAll optics layout more compactInterferometersUsing optical meansWavefront sensorConfocal
Methods and devices are disclosed for acquiring depth resolved aberration information using principles of low coherence interferometry and perform coherence gated wavefront sensing (CG-WFS). The wavefront aberrations is collected using spectral domain low coherence interferometry (SD-LCI) or time domain low coherence interferometry (TD-LCI) principles. When using SD-LCI, chromatic aberrations can also be evaluated. Methods and devices are disclosed in using a wavefront corrector to compensate for the aberration information provided by CG-WFS, in a combined imaging system, that can use one or more channels from the class of (i) optical coherence tomography (OCT), (ii) scanning laser ophthalmoscopy, (iii) microscopy, such as confocal or phase microscopy, (iv) multiphoton microscopy, such as harmonic generation and multiphoton absorption. In particular, a swept source (SS) is used that drives both an OCT channel and a coherence gated wavefront sensor, where:a) both channels operate according to SS-OCT principles;b) OCT channel integrates over at least one tuning scan of the swept source to provide a TD-OCT image of the object;c) CG-WFS integrates over at least one tuning scan of the swept source to provide an en-face TD-OCT mapping of the wavefront.For some implementations, simultaneous and dynamic aberration measurements / correction with the imaging process is achieved. The methods and devices for depth resolved aberrations disclosed, will find applications in wavefront sensing and adaptive optics imaging systems that are more tolerant to stray reflections from optical interfaces, such as reflections from the microscope objectives and cover slip in microscopy and when imaging the eye, the reflection from the cornea.
Owner:PODOLEANU ADRIAN +1

Auto-focusing method and device for use with optical microscopy

An auto-focusing method and device are presented for determining an in-focus position of a sample supported on a substrate plate made of a material transparent with respect to incident electromagnetic radiation. The method utilizes an optical system capable of directing incident electromagnetic radiation towards the sample and collecting reflections of the incident electromagnetic radiation that are to be detected. A focal plane of an objective lens arrangement is located at a predetermined distance from a surface of the substrate, which is opposite to the sample-supporting surface of the substrate. A continuous displacement of the focal plane relative to the substrate along the optical axis of the objective lens arrangement is provided, while concurrently directing the incident radiation towards the sample through the objective lens arrangement to thereby focus the incident radiation to a location at the focal plane of the objective lens arrangement. Reflected components of the electromagnetic radiation to a location objective lens arrangement are continuously detected. The detected reflected components are characterized by a first intensity peak corresponding to an in-focus position of said opposite surface of the substrate, and a second intensity peak spaced in time from the first intensity peak and corresponding to an in-focus position of said sample-supporting surface of the substrate. This technique enables imaging of the sample when in the in-focus position of the sample-supporting surface of the substrate.
Owner:YEDA RES & DEV CO LTD

Two channel-based multi-spectrum fluorescent imaging microscopic system and method

The invention is applicable to the field of optics, biomedicine, life science and the like, and provides a two channel-based multi-spectrum fluorescent imaging microscopic system and method, wherein the two channel-based multi-spectrum fluorescent imaging microscopic system comprises a picosecond pulse laser device, a fluorescent excitation and collection light path, a microscopic objective lens, a light beam lens, a double-ICCD detector, and a control and processing module. The invention further discloses a method for performing multi-spectrum imaging by utilizing the two channel-based multi-spectrum fluorescent imaging microscopic system. According to the two channel-based multi-spectrum fluorescent imaging microscopic system and method, the limitation of the existing fluorescent microscope and a fluorescent life imaging microscopic system only can acquire single wavelength fluorescent signal with one-time detection can be effectively solved, the simultaneous acquisition of the multi-spectrum fluorescent strength and fluorescent light image aiming at the dynamic process of fluorescent intensity-related detection limited in biomedicine and life science can be performed, so that the research and application ranges of biophotonics can be extended.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Near-infrared laser scanning confocal imaging system

The invention discloses a near-infrared laser scanning confocal imaging system, which comprises a light path scanning unit and a control unit which adopt a confocal structure, wherein the light path scanning unit comprises a near-infrared laser source, a collimation and extension module, a laser optical filter, a dichroic reflector, a scanning galvanometer, an f-theta lens, a tube lens, an imaging objective lens, a fluorescent optical filter, a convergent lens, a pinhole, a detector and the like, the control unit comprises a motion control module used for controlling the scanning galvanometer, a data acquisition module used for acquiring an output signal of the detector, a data processing module connected with the motion control module and the data acquisition module, and the like. The method matched with the system is characterized in that a sample is marked with near-infrared quantum dots with the fluorescence emission spectrums between 932nm and 1250nm, and then the sample is detected by the near-infrared laser scanning confocal imaging system. According to the system disclosed by the invention, deep-level imaging of samples such as biological tissues can be accurately and efficiently realized, and the system has a simple structure and is easy to operate.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI

Dark field optical coherence microscopy

InactiveUS20130010283A1Improve detectionHigh frequencyInterferometersMicroscopesOptical coherence microscopySample microscopy
The invention relates to an optical coherence microscopy system for fast, phase resolved imaging by means of optical coherence microscopy with decoupled illumination and detection apertures, producing a dark-field effect with an enhanced optical contrast. The setup uses a light source with an appropriate temporal coherence, an interferometer and an array detector combined with a spectrometer. The dark-field effect is produced by optical filter means in the illumination and detection paths, positioned in conjugated planes of the sample microscope objective. These optical means comprise for example refractive or diffractive elements, amplitude or phase masks, or programmable spatial light modulators. The object is scanned via a scanning unit allowing a point scan of the object.
Owner:ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)

Device and method for wavefront measurement of an optical imaging system by means of phase-shifting interferometry

Device and method for wavefront measurement of an optical imaging system by means of phase-shifting interferometry, having a mask structure (6a) to be arranged on the object side, and / or a grating structure (7a) to be arranged on the image side. The object-side mask structure includes one or more one-dimensional mask structure patterns, and the image-side grating structure includes one or more two-dimensional grating structure patterns. Alternatively, conversely, the mask structure includes one or more two-dimensional patterns, and the grating structure includes one or more one-dimensional patterns. Additionally or alternatively, a pupil position offset caused by a lateral relative movement of the mask structure and detector element can be taken into account by back calculating the interferogram, respectively recorded by the detector element, using an associated phase-shift characteristic, or by a computational correction of wavefront derivatives, obtained from the recorded interferograms, in the direction of lateral movement. The method and / or the device can by used, for example, for determining aberration in the case of high-resolution projection objectives of microlithography exposure machines using shearing or point interferometry.
Owner:CARL ZEISS SMT GMBH
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