[Problems] To provide a reverse X-
ray photoelectron
holography device, in which
energy control and convergence are facilitated and a hologram of good contrast is obtained; and to provide its measuring method.[Means for Solving Problems] A Reverse X-
ray photoelectron
holography measuring method where a measurement sample is irradiated with an
electron beans, incident angle and rotation angle of the
electron beam are varied by varying the posture of the measurement sample to the
electron beam, and a variation in intensity of characteristic X-
ray emitted when the measurement sample is excited is recorded as the
atomic resolution hologram around the atom of a specific element, wherein, when the intensity is detected as the characteristic X-ray of the atom of the measurement sample, an
object wave is generated as an electron wave scattered by the
reference wave and the proximity atom in a
holography where electrons incident to the measurement sample reach an atom generating specific X-ray as an electron wave, and an interference pattern is formed by compounding the
reference wave with the
object wave, thus monitoring the intensity of an electron beam.