The invention relates to a
chip testing device, which comprises a testing base, a
radio frequency microwave detection body is embedded in the testing base, the
radio frequency microwave detection bodycomprises a conductor, a
radio frequency elastic probe externally wrapped by an insulating sleeve is inserted into the upper portion in the conductor, and a plurality of auxiliary grounding elastic probes are arranged on the outer side of the radio frequency elastic probe in the circumferential direction in a surrounding mode. The upper end part of the radio frequency elastic probe is in contactwith a radio frequency
microwave signal port of a tested object, the lower end part of the radio frequency elastic probe is conductively connected with a radio frequency inner conductor arranged at the middle part in the conductor, a radio frequency cable is inserted into the lower part in the conductor, and a central conductor in the radio frequency cable is conductively connected with the lowerend part of the radio frequency inner conductor. According to the radio frequency elastic probe, a fuzz button structure is adopted as a main
transmission channel of a radio frequency microwave
signal, meanwhile, a
transmission channel of a coaxial structure is also formed in the portion, making contact with a tested object, of the radio frequency elastic probe, the
impedance matching effect is well achieved by arranging a compensation structure so that reflection of the radio frequency microwave
signal can be reduced, and high-frequency and large-current testing can be met.