41 results about "Critical test" patented technology

A system and method for verification monitoring of a critical test result management (CTRM) system is provided. In one embodiment, the method includes receiving test result metadata pertaining to test result messages provided to a CTRM system by a diagnostic test facility, verifying compliance of the diagnostic test facility with prescribed usage of the CTRM system using the test result metadata, and sending a message to an interested party regarding whether or not compliance of the diagnostic test facility has been verified.

The invention discloses a test bed for testing comprehensive performance of LED modules in the technical field of LED measurement. A double-station mode is provided with two sets of independent automatic loading and unloading machines, a PCB (printed circuit board) detector, an LED module electrical parameter detector, an LED module light intensity detector, an LED module spectrum parameter and chromaticity detector, an LED module defect repairer and a qualified product and unqualified product sorter; and the LED modules of two different specifications can be tested at the same time. Multi-variety online quick test and sorting can be efficiently matched by adopting a rotary sorting mode, combining a computer and a motion control card and controlling independent operation of each tester. The test bed can be adaptive to performance test of the LED modules of multiple specifications, is simple and convenient to operate, has high automation degree, can effectively and comprehensively reflect the comprehensive performance indexes of the tested LED modules, and has actual significance for improving quality control of the LED modules and research on industrialized key test technology of the LED module industry.

A method for facilitating the management of a test process is proposed. For this purpose, the different test scenarios included in the process and their execution dependencies are represented by means of a customized UML activity diagram (300a). An execution weight is also associated with each test scenario (for example, defined by the man-hours required for its execution). In this way, it is possible to identify critical test scenarios (315g), which may impair the execution of the whole test process when they fail (because many other test scenarios depend on their successful completion). The order of execution of the test scenarios is then arranged into a test plan, so as to minimize the time required to reach the critical test scenarios. Preferably, the same process is repeated whenever any runtime condition changes (such when a test scenario fails).

A critical test results management system and method for capturing test data from a test results providing program and delivering messages to interested recipients. The system and method generating alerts, escalating the alerts to message receiving devices, and tracking the status of the alerts. The recipient of an alert can access the system to obtain the contents of the alert, acknowledge receipt of the alert, and record notes related to the alert. The invention tracks when alerts were sent and if they have been acknowledged. If the alerts are not acknowledge prior expiration of a predetermined time period, further alerts are escalated to the recipient, to different receiving devices, or to different recipients.

A bit-error-rate (BER) test is a crucial test for wireless devices to pass, since a device with a high BER does not perform at its best. BER tests are both costly and difficult to perform due to a delay incurred by the device under test (DUT) 215 and the testing hardware that is variable in nature. Because the delay is variable, a hardware BER test that can compensate for the delay is difficult to build and a software BER test that can easily compensate for the delay is very slow. The present invention provides a method and apparatus that can compensate for the variable delay. By doing so, a hardware BER test, which is considerably faster than a software BER test, is easily implemented.

The present invention discloses a method for discovering a key test function of a large object-oriented software system. By using the method, the key test function of the large object-oriented software system can be rapidly and reasonably discovered with relatively high accuracy. The method comprises: firstly, taking a class as a node and a function call between classes as an arc for drawing a class collaborative network diagram, and defining the importance degree of one arc as the quantity of arcs that are taken as initial arcs and can be traversed; then calculating the importance degree of each arc in the class collaborative network diagram, wherein the arc that takes a class node with a larger total amount of reachable arcs as an arc head is a key arc; and finally, positioning arc head and arc tail information of the key arc to two corresponding classes in the software system, wherein a function call relationship that forms a coupling relationship between the two classes is the key test function. The method overcomes two defects in an existing method, and the computing complexity is not increased along with the increase of the complexity of the software system, so that the key test function of the software system can be rapidly and effectively discovered.

The invention provides a method and a system for determining one-dimensional barcode bar width compensation amount, and a barcode printing method. The invention belongs to the technical field of one-dimensional barcode. With the method and the system, a problem of excessive width during current one-dimensional barcode printing, or misidentification of the barcode, can be solved. The method for determining the one-dimensional barcode bar width compensation amount comprises the steps that: a module width and the width of a k-fold module width bar are determined; a test target of the k-fold module width bar is printed; through determining whether adjacent bars in the test target contact, a critical test target of the k-fold module width bar is found; and barcode bar width compensation amount is obtained according to the bar width of the critical test target. The one-dimensional barcode printing method provided by the invention comprises a step for determining the one-dimensional barcode bar width compensation amount with the method, and a step for printing according to the barcode bar width compensation amount. The system used for determining the one-dimensional barcode bar width compensation amount comprises a functional unit corresponding to the method. The method and the system provided by the invention can be used for printing 128-bit barcode and the like.

The invention relates to the communication field, and discloses an automatic test method and device for radio-frequency performance comparison. According to the invention, the method comprises the following steps of: presetting a complete comparison file template, determining comparison test items of a product according to the comparison requirement, carrying out the critical test of each comparison test item automatically, and storing the test results in the data file. A background data processing software automatically inputs the comparison data result to the comparison file template, and creates a comparison test file for the testing personnel to get the comparison conclusion. The test efficiency of the radio-frequency performance comparison and the data processing efficiency are improved, the artificial complexity is reduced, and the effect of rapid comparison is achieved.

The embodiment of the invention discloses a test scene library generation method and device, equipment and a storage medium. The method comprises the steps: when a generation instruction of a test scene library is received, obtaining candidate test scenes, a criticality model and a preset operation domain which are constructed for a to-be-tested scene corresponding to the generation instruction in advance; taking the criticality model as a target and taking a parameter feasible set corresponding to a preset operation domain as a constraint, and obtaining a key test scene based on an initial test scene obtained by sampling in a test scene space, wherein the test scene space comprising the candidate test scenes; and searching in the test scene space by taking the key test scene as a search starting point and taking a preset search neighborhood of the key test scene in the test scene space as a search range, and generating a test scene library according to a search result. According to the technical scheme provided by the embodiment of the invention, the test scene library with relatively high accuracy can be efficiently generated.

The invention discloses a flyback power supply with the testability analysis and fault diagnosis functions and a test method thereof. The flyback power supply is composed of a flyback power supply module and an upper computer system. A plurality of key testing nodes are arranged in the flyback power supply module; and the upper computer system is connected with the flyback power supply module. According to the invention, on the basis of not changing the original topology of the flyback power supply, the power supply is divided into a plurality of modules based on functions and key testing nodes of all modules are taken and are led out; and the upper computer is used for real-time monitoring, extracting a fault feature parameter, and constructing a fault-testing correlation matrix, so thatthe testability analysis of the flyback power supply as well as the fault diagnosis of the flyback power supply is realized. The flyback power supply having high portability is suitable for state monitoring and testability analysis of most of switch power supplies and is capable of providing a platform for state monitoring and testability analysis of other power supplies.

The invention relates to a chemical process for passivation of a primary loop system during a pre-critical test of a nuclear power plant. The chemical process comprises the following steps that duringthe pre-critical test performed after initial loading of nuclear fuel in a core of a nuclear reactor, Zn2+ is added to a coolant so that the Zn2+ contacts the metal surface in the primary loop systemduring the pre-critical test to form an initial zinc-containing oxide film. According to the chemical process, the zinc is added to the coolant during the pre-critical test of a new nuclear power unit, so that the zinc contacts with the metal surface in the primary loop system during the pre-critical test, and the initial zinc-containing oxide film is formed on the metal surface; the reliabilityof the passive film is improved through implementation of zinc-injecting passivation of the new nuclear power unit, good protection is provided for a primary loop metal component during the running life time of nuclear power, long-term stable and reliable operation of the nuclear power unit is ensured, the total amount of corrosion products which can deposit on the fuel and become activated duringnormal power operation is also significantly reduced, and accordingly the fuel performance is improved and the plant dose rate is reduced as much as possible.

Disclosed are an automated data analysis system and method. They system provides a standardized data analysis request form that allows a user to select an experiment (e.g., a wafer-level based yield split lot (EWR) analysis, a lot-level based process change notification (PCN) analysis, and lot-level based tool/mask qualification analysis) and a data analysis for a specific process module of interest. For each specific data analysis request, the system identifies critical test parameters, which are grouped depending on in-line test levels and photolithography levels. The system links the analysis request to test data sources and automatically monitors the test data sources, searching for the critical test parameters. When the critical test parameters become available, the system automatically performs the requested analysis, generates a report of the analysis and publishes the report with optional drill downs to more detailed results. The system further provides automatic e-mail notification of the published report.

The invention discloses a critical characteristic test method of a superconducting tape in a multi-deformation mode. The method comprises the following steps: selecting a multi-deformation mode of a current superconducting tape to be tested; if the bending deformation mode is selected, the curvature specification is further selected, a part conforming to the current specification is fixed to the lower end of a third G10 pull rod, a whole strip with the proper length is selected to be subjected to a critical test of bending deformation, and online stress adjustment is conducted; if the stretching and twisting deformation modes are selected, the stretching and twisting angle specifications of the replaceable clamping part are selected, the replaceable clamping part conforming to the angle specifications is fixed to the lower end of a G10 pull rod III, and two strips with proper lengths are selected for a critical test of stretching and twisting deformation; according to the invention, an axisymmetric structure is arranged, the stress difference between the superconducting tape without loading current and the superconducting tape with loading current is compared and observed, and an error value caused by thermal stress disturbance is found, so that interference factors in superposed stress are eliminated, and the stress test precision is improved.

A test circuit that compares test results between two tests with different local supply voltages is provided. The output of each stage of the logic circuits is stored in a first register of each test circuit. Each test is performed with a critical test vector and a local supply voltage that decreases from test to test. The outputs of successive tests are compared in each test circuit. The tests are performed iteratively with successive reduction in the value of the local supply voltage until at least one stage of the logic circuits produces non-matching results between the first and second register. The voltage immediately before producing such non-matching results is the minimum operational voltage for the local voltage island.