808 results about "Test target" patented technology

The present invention is an inexpensive, hand-held, and easy to operate millimeter-wave detection device that employs a non-imaging sensor which radiates a pulse of millimeter waves of a certain amplitude and frequency towards a target located at a distance from the detection device. The sensor receives pulses of millimeter waves that are reflected from the target and generates a voltage waveform that is characteristic mainly of the target material, while other parameters such as distance to the target are known. The processor of the detection device measures both the peak voltage and the rate of increase of the voltage until it reaches the maximum. Using an algorithm stored in a software module, the deviation between the rate of the voltage rise and the peak voltage is compared with values of similar parameters for a number of test targets made of different materials that were previously collected and stored in a calibration table in the memory of the device. A concealed object, e.g. a weapon, is positively identified when the measured voltage rise is found to be similar to one of the stored voltage rises. The circuitry of the detection device generates a visual and / or audio output to a display device which is indicative to the operator as to whether a concealed object is present and, if a match is found with the data in the calibration table, the nature of the concealed object is also displayed. In addition to the basic mode of operation described, various other operation modes can be employed with the detection device of the invention.

A method and system for testing a target object for compliance with existing geometric dimension and tolerance requirements includes: measuring a selected feature of the target and entering the existing geometric dimension and tolerance requirements into a user interface. Entering includes selecting an icon containing a graphic symbol representative of a geometric dimension and tolerance characteristic.

One embodiment provides a runtime programmable system which comprises methods and apparatuses for testing a multi-port memory device to detect a multi-port memory fault, in addition to typical single-port memory faults that can be activated when accessing a single port of a memory device. More specifically, the system comprises a number of mechanisms which can be configured to activate and detect any realistic fault which affects the memory device when two simultaneous memory access operations are performed. During operation, the system can receive an instruction sequence, which implements a new test procedure for testing the memory device, while the memory device is being tested. Furthermore, the system can implement a built-in self-test (BIST) solution for testing any multi-port memory device, and can generate tests targeted to a specific memory design based in part on information from the instruction sequence.

Aberrations in an optical system can be detected and measured using a method comprised of a test target in the object plane of a projection system and imaging a photoresist film with the system. The test target comprises at least one open figure which comprises a multiple component array of phase zones, where the multiple zones are arranged within the open figure so that their response to lens aberration is interrelated and the zones respond uniquely to specific aberrations depending on their location within the figure. This is a unique and new method of detecting a variety of aberration types including coma, spherical, astigmatism, and three-point through the exposure of a photoresist material placed in the image plane of the system and the evaluation of these images.

The present invention provides a mechanism for automatically setting the exposure time and gain of an electronic camera so that the acquired image has improved characteristics for the detection of a digital watermark. With the present invention the exposure time and gain of an electronic camera are set by first directing the camera at a test target with the camera's controls set to a default set of values. The system then calculates a histogram of the luminance values of the pixels in the image. Next characteristic values from the histogram such as the peak value, the centroid value, the RMS value, the median value, etc. are calculated. One or more of the characteristic values of the histogram are then applied as an index or pointer to values of pre-established settings that are stored in a table. Values from the table are used to set the exposure time and / or gain of the camera. In some embodiments, the variance of the luminance histogram is also measured and used to index data from the table.

A defect once around signal time period of a defect source inherent in a marking device is determined, the defect source having one or more banding frequencies. A reference scanline time delay, which is a time between a page sync signal and a writing of a reference scanline, is determined. A test target is written, sensed and analyzed. A reference scanline phase offset of each banding frequency relative to the reference scanline is determined. A banding phase of each banding frequency is determined based at least on the defect once around signal time period, reference scanline time delay and reference scanline phase offset.

A method for calibrating automatic white balance (AWB) in a digital system is provided that includes capturing an image of a test target under a natural lighting condition, generating a first color temperature reference from the captured image, and outputting AWB configuration data for the digital system, wherein the AWB configuration data comprises the first color temperature reference and a second color temperature reference generated using the test target under simulated lighting conditions. A method for calibrating automatic white balance (AWB) in a digital system comprising a first imaging sensor is provided that includes receiving a reference for AWB that was generated using an image captured using a second imaging sensor, and compensating a histogram reference into a histogram reference for AWB for the first imaging sensor in the digital system based on R, G, B adjustment values from the second imaging sensor to the first imaging sensor.

An ophthalmic apparatus includes: a fundus observation optical system for observing a fundus; a target presenting device including a scanning member for two-dimensionally scanning a visible laser beam emitted from a laser source, the device being configured to control emission of the laser source during two-dimensional scanning by the scanning member to project predetermined target on the fundus under observation through the fundus observation optical system; and control means to change an irradiation diameter of the laser beam by inserting / removing an optical member into / from an irradiation optical path of the laser beam or moving the optical member in an axial direction and to change resolution of the target by changing each scan range of the laser beam by the scanning member according to the changed irradiation diameter of the laser beam. Accordingly, in the ophthalmic apparatus used in close and face-to-face position to an examinee, the size and shape of a target to be presented can be easily set. A test target with high resolution unrealizable by a conventional LCD can be presented.